Patents by Inventor Toshikazu Yurugi

Toshikazu Yurugi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10782225
    Abstract: The present invention is one that makes it possible to facilitate the assembly of an optical measurement cell, as well as shorten optical path length without taking account of handling of a spacer, and an optical measurement cell 2 including a pair of light transmitting plates 21 and 22 respectively having opposite surfaces 21a and 22a facing each other and containing test liquid X between the pair of opposite surfaces 21a and 22a of the pair of light transmitting plates 21 and 22. In addition, one 21a of the opposite surfaces 21a and 22a is formed with a spacer film 25 that contacts with the other opposite surface 22a to define the distance between the pair of opposite surfaces 21a and 22a.
    Type: Grant
    Filed: June 20, 2018
    Date of Patent: September 22, 2020
    Assignee: HORIBA, LTD.
    Inventors: Tetsuji Yamaguchi, Toshikazu Yurugi, Makoto Nagura, Takashi Kimba, Tetsuya Mori
  • Publication number: 20180372614
    Abstract: The present invention is one that makes it possible to facilitate the assembly of an optical measurement cell, as well as shorten optical path length without taking account of handling of a spacer, and an optical measurement cell 2 including a pair of light transmitting plates 21 and 22 respectively having opposite surfaces 21a and 22a facing each other and containing test liquid X between the pair of opposite surfaces 21a and 22a of the pair of light transmitting plates 21 and 22. In addition, one 21a of the opposite surfaces 21a and 22a is formed with a spacer film 25 that contacts with the other opposite surface 22a to define the distance between the pair of opposite surfaces 21a and 22a.
    Type: Application
    Filed: June 20, 2018
    Publication date: December 27, 2018
    Inventors: Tetsuji YAMAGUCHI, Toshikazu Yurugi, Makoto Nagura, Takashi Kimba, Tetsuya Mori
  • Patent number: 5596195
    Abstract: An apparatus and method of identifying substances contained in a sample to both identify the elements in the sample and to measure a distribution of the elements are provided. The sample is scanned with electron beams to form X-ray images of two or elements. These X-ray images can be used to form a scattering diagram, and the composition of known materials can be plotted on the scattering diagram. The substances contained in the samples can be identified, and the distribution of the substances can be obtained by comparing the data on the scattering diagram with the plot.
    Type: Grant
    Filed: September 15, 1995
    Date of Patent: January 21, 1997
    Assignee: Horiba, Ltd.
    Inventors: Kenichi Obori, Atsushi Bando, Toshikazu Yurugi