Abstract: A semiconductor storage device includes first and second chips. The first chip includes a first semiconductor substrate, first conductive layers arranged in a first direction and extending in a second direction, a semiconductor column extending in the first direction and facing the first conductive layers, a first charge storage film formed between the first conductive layers and the semiconductor column, a plurality of first transistors on the first semiconductor substrate, and first bonding electrodes electrically connected to a portion of the plurality of first transistors. The second chip includes a second semiconductor substrate, a plurality of second transistors on the second semiconductor substrate, and second bonding electrodes electrically connected to a portion of the plurality of second transistors, and bonded to the first bonding electrodes.

Abstract: An information processing apparatus configured to determine a tour schedule around a facility, the information processing apparatus includes a controller configured to determine a tour time at a tour spot in the tour schedule, based on biological information on a user who is observing a process performed by equipment at the tour spot in the facility.

Abstract: A method for measuring the presence or absence of an object to be measured in a specimen or the quantity thereof. The method includes filtrating the object to be measured from the specimen using as a physical filter, a void-arranged structural body having a plurality of void portions penetrating in a direction perpendicular to a primary surface thereof so as to hold the object to be measured by the void-arranged structural body; irradiating an electromagnetic wave on the void-arranged structural body holding the object to be measured; and detecting characteristics of an electromagnetic wave scattered by the void-arranged structural body.

Abstract: A measurement method is disclosed for measuring the presence or absence of an object to be measured or the quantity thereof, and the measurement method includes irradiating an electromagnetic wave on a void-arranged structural body holding the object to be measured, and detecting characteristics of an electromagnetic wave scattered by the void-arranged structural body. The void-arranged structural body has a plurality of void portions penetrating in a direction perpendicular to a primary surface thereof, and at least a part of the object to be measured is held by the void-arranged structural body with carrier particles provided therebetween.