Abstract: The present invention predicts a timing when there may occur a change in the physical condition of a user. A body condition predicting device (10) includes: a collating section (112) configured to collate biological data acquired by a biosensor (30) with a biological data pattern representing drifting over time of the biological data, the biological data pattern being associated with either or both attribute data and environmental data; and a biological data drifting predicting section (113) configured to predict, based on a result of collation performed by the collating section, the drifting over time of the biological data that occurs after the biosensor (30) acquires the biological data.

Abstract: The present invention predicts a timing when there may occur a change in the physical condition of a user. A body condition predicting device (10) includes: a collating section (112) configured to collate biological data acquired by a biosensor (30) with a biological data pattern representing drifting over time of the biological data, the biological data pattern being associated with either or both attribute data and environmental data; and a biological data drifting predicting section (113) configured to predict, based on a result of collation performed by the collating section, the drifting over time of the biological data that occurs after the biosensor (30) acquires the biological data.

Abstract: A defect detecting device includes a pixel value correcting section, a block-division processing section, and a defective/non-defective determining section. The pixel value correcting section corrects a pixel value of an inspection-target image, on which detection of a defective area is to be carried out, in such a manner that the defective area of the inspection-target image is emphasized with respect to the other areas of the inspection-target image. The block-division processing section divides, into plural blocks, the inspection-target image with pixel values having been corrected, and obtains a block addition value or a block mean value. The defective/non-defective determining section determines whether or not the defective area is present by carrying out statistical processing to determine whether an outlier of the block addition value or an outlier of the block mean value is present or not.

Abstract: Provided are an evaluation method and device of a test pattern which enable an appropriate evaluation in a reliability test with a simulation time reduced and high accuracy. It is assumed that each possible internal state of a cell determined at least by a logic value or a voltage value of an input terminal is a cell state, and each possible state of a transistor determined by a voltage between terminals of the transistor is a transistor state. The method comprises steps of: verifying operation of a semiconductor integrated circuit at a gate level or higher; acquiring an appearance cell state continuously appearing for a predetermined time or more in the operation verification; acquiring an appearance transistor state using the corresponding appearance cell state in the operation verification for each transistor; and calculating a test activity ratio of the transistor using the corresponding appearance transistor state for each transistor.

Abstract: A defect detecting device includes: a block generating section dividing an inspection image in which a defective region will be detected into a plurality of blocks; an intra-block sum calculating section calculating an intra-block sum for each of the blocks generated by the block generating section, the intra-block sum being a sum of pixel data for pixels in that block; and a statistical processing section and a defect determining section determining whether there exists a defective region by determining through statistical processing whether the intra-block sums have an outlier. Accordingly, the device determines whether there is a defective region in a digital image quickly and using small circuitry.

Abstract: An image inspecting apparatus invention includes an original image storing memory 21 for storing an image data output from an image sensor 11, a filtering processing section 22 for obtaining a shading component-removed data in which the shading component is removed from the output image data, a preliminary processing memory 23 for storing the shading component-removed data, a block dividing/adding section 24 for dividing the shading component-removed data into blocks with a size of n×m and adding the shading component-removed data within the divided blocks to obtain a block divided/added data, a secondary processing memory 25 for storing the block divided/added data, a statistics processing section 26 for calculating an average value, a maximum value and a minimum value for the block divided/added data, a quality determining section 27 for determining a quality with the calculated average value, maximum value and minimum value and a determination result storing memory 28 for storing information for the block

Abstract: Provided are an evaluation method and device of a test pattern which enable an appropriate evaluation in a reliability test with a simulation time reduced and high accuracy. It is assumed that each possible internal state of a cell determined at least by a logic value or a voltage value of an input terminal is a cell state, and each possible state of a transistor determined by a voltage between terminals of the transistor is a transistor state. The method comprises steps of: verifying operation of a semiconductor integrated circuit at a gate level or higher; acquiring an appearance cell state continuously appearing for a predetermined time or more in the operation verification; acquiring an appearance transistor state using the corresponding appearance cell state in the operation verification for each transistor; and calculating a test activity ratio of the transistor using the corresponding appearance transistor state for each transistor.

Abstract: A defect detecting device 1 includes a pixel value correcting section 16, a block-division processing section 17, and a defective/non-defective determining section 19. The pixel value correcting section 16 corrects a pixel value of an inspection-target image, on which detection of a defective area is to be carried out, in such a manner that the defective area of the inspection-target image is emphasized with respect to the other areas of the inspection-target image. The block-division processing section 17 divides, into plural blocks, the inspection-target image with pixel values having been corrected, and obtains a block addition value, which is a value obtained by adding pixel values of pixels present in a block, or a block mean value, which is a value obtained by dividing the block addition value by the number of pixels present in the block.

Abstract: A defect detecting device includes: a block generating section dividing an inspection image in which a defective region will be detected into a plurality of blocks; an intra-block sum calculating section calculating an intra-block sum for each of the blocks generated by the block generating section, the intra-block sum being a sum of pixel data for pixels in that block; and a statistical processing section and a defect determining section determining whether there exists a defective region by determining through statistical processing whether the intra-block sums have an outlier. Accordingly, the device determines whether there is a defective region in a digital image quickly and using small circuitry.

Abstract: An image inspecting apparatus invention includes an original image storing memory 21 for storing an image data output from an image sensor 11, a filtering processing section 22 for obtaining a shading component-removed data in which the shading component is removed from the output image data, a preliminary processing memory 23 for storing the shading component-removed data, a block dividing/adding section 24 for dividing the shading component-removed data into blocks with a size of n×m and adding the shading component-removed data within the divided blocks to obtain a block divided/added data, a secondary processing memory 25 for storing the block divided/added data, a statistics processing section 26 for calculating an average value, a maximum value and a minimum value for the block divided/added data, a quality determining section 27 for determining a quality with the calculated average value, maximum value and minimum value and a determination result storing memory 28 for storing information for the block