Patents by Inventor Toshinori Fujiwara

Toshinori Fujiwara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8460616
    Abstract: The present invention relates to an analyzer (1) including a photometry mechanism (6) for photometrically analyzing a reagent pad of an analytical tool to which a sample is applied, and a table (4) including a placing portion (41) at which the analytical tool is to be placed. The light emitting surface (68) or the light incident surface (68) of the light from the light emitting elements (66) of the photometry mechanism (6) is cleaned, with a cleaning tool (22) placed at the table (4). The present invention further provides a cleaning tool (22) for cleaning the photometry mechanism (6) of the analyzer (1).
    Type: Grant
    Filed: April 19, 2006
    Date of Patent: June 11, 2013
    Assignee: Arkray, Inc.
    Inventors: Toshinori Fujiwara, Hideki Tanji, Naoyuki Usagawa
  • Publication number: 20090052033
    Abstract: The present invention relates to an analyzer (1) including a photometry mechanism (6) for photometrically analyzing a reagent pad of an analytical tool to which a sample is applied, and a table (4) including a placing portion (41) at which the analytical tool is to be placed. The light emitting surface (68) or the light incident surface (68) of the light from the light emitting elements (66) of the photometry mechanism (6) is cleaned, with a cleaning tool (22) placed at the table (4). The present invention further provides a cleaning tool (22) for cleaning the photometry mechanism (6) of the analyzer (1).
    Type: Application
    Filed: April 19, 2006
    Publication date: February 26, 2009
    Inventors: Toshinori Fujiwara, Hideki Tanji, Naoyuki Usagawa