Abstract: An apparatus for manufacturing a device comprises a processing unit configured to perform a process for manufacturing the device, a conveying unit configured to convey an article to the processing unit, and a controller configured to control the conveying unit based on a job queue. Information for controlling conveyance of an article for a job next to a job for which the processing unit is performing the process is registered in the job queue. The controller is configured to control the conveying unit so as to convey the article for the next job in advance, based on the information.

Abstract: An apparatus for manufacturing a device comprises a processing unit configured to perform a process for manufacturing the device, a conveying unit configured to convey an article to the processing unit, and a controller configured to control the conveying unit based on a job queue. Information for controlling conveyance of an article for a job next to a job for which the processing unit is performing the process is registered in the job queue. The controller is configured to control the conveying unit so as to convey the article for the next job in advance, based on the information.

Abstract: Proteins expressed in NK and some T cells and being transmembrane molecules with Type II membrane protein structure, the extracellular part of the receptor being characterized by a C-type animal lectin domain, DNA sequences encoding such proteins and antibodies against the extracellular part of the transmembrane protein which can activate NK and T cells.

Abstract: A semiconductor device testing apparatus in which ICs to be tested are transferred to a test tray TST in a loader section, the test tray is transported into a test section to test the ICs, after the completion of the test, the tested ICs on the test tray are transferred from the test tray onto a general-purpose tray in an unloader section, and the test tray which has been emptied of the tested ICs is transported to the loader section, and the above operation is repeated, and which can detect whether there is an IC on the test tray or not is provided. An IC detecting sensor for monitoring whether an IC exists on the test tray or not is provided at at least one of the positions between the unloader section and the loader section, the loader section and the test section, and the test section and the unloader section.