Patents by Inventor Toshiya Hachisuka

Toshiya Hachisuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Image processing apparatus and method using photon mapping and ray tracing and increasing a rate of photon mapping
    Patent number: 9684991
    Abstract: Provided is an image processing apparatus for performing photon mapping, and the image processing apparatus may perform ray tracing for photon mapping, sample a ray space based on a result of the ray tracing, and perform pseudo photon mapping using the sampled ray space.
    Type: Grant
    Filed: May 5, 2014
    Date of Patent: June 20, 2017
    Assignees: Samsung Electronics Co., Ltd., Aarhus Universitet
    Inventors: In Woo Ha, Yong Beom Lee, Jacob Toft Pedersen, Toshiya Hachisuka, Do Kyoon Kim, Min Su Ahn, Hyong Euk Lee
  • Methods and systems of joint path importance sampling
    Patent number: 9665974
    Abstract: Methods and systems of joint path importance sampling are provided to construct light paths in participating media. The product of anisotropic phase functions and geometric terms across a sequence of path vertices are considered. A connection subpath is determined to join a light source subpath with a light receiver subpath with multiple intermediate vertices while considering the product of phase functions and geometry terms. A joint probability density function (“PDF”) may be factorized unidirectional or bidirectional. The joint PDF may be factorized into a product of multiple conditional PDFs, each of which corresponds to a sampling routine. Analytic importance sampling may be performed for isotropic scattering, whereas tabulated importance sampling may be performed for anisotropic scattering.
    Type: Grant
    Filed: May 20, 2014
    Date of Patent: May 30, 2017
    Assignee: DISNEY ENTERPRISES, INC.
    Inventors: Wojciech Jarosz, Iliyan Georgiev, Jaroslav Krivanek, Toshiya Hachisuka, Derek Nowrouzezahrai
  • METHODS AND SYSTEMS OF JOINT PATH IMPORTANCE SAMPLING
    Publication number: 20150035831
    Abstract: Methods and systems of joint path importance sampling are provided to construct light paths in participating media. The product of anisotropic phase functions and geometric terms across a sequence of path vertices are considered. A connection subpath is determined to join a light source subpath with a light receiver subpath with multiple intermediate vertices while considering the product of phase functions and geometry terms. A joint probability density function (“PDF”) may be factorized unidirectional or bidirectional. The joint PDF may be factorized into a product of multiple conditional PDFs, each of which corresponds to a sampling routine. Analytic importance sampling may be performed for isotropic scattering, whereas tabulated importance sampling may be performed for anisotropic scattering.
    Type: Application
    Filed: May 20, 2014
    Publication date: February 5, 2015
    Applicant: DISNEY ENTERPRISES, INC.
    Inventors: WOJCIECH JAROSZ, ILIYAN GEORGIEV, JAROSLAV KRIVANEK, TOSHIYA HACHISUKA, DEREK NOWROUZEZAHRAI
  • IMAGE PROCESSING APPARATUS AND METHOD
    Publication number: 20140333624
    Abstract: Provided is an image processing apparatus for performing photon mapping, and the image processing apparatus may perform ray tracing for photon mapping, sample a ray space based on a result of the ray tracing, and perform pseudo photon mapping using the sampled ray space.
    Type: Application
    Filed: May 5, 2014
    Publication date: November 13, 2014
    Applicants: SAMSUNG ELECTRONICS CO., LTD., Aarhus Universitet
    Inventors: In Woo HA, Yong Beom LEE, Jacob Toft Pedersen, Toshiya Hachisuka, Do Kyoon KIM, Min Su AHN, Hyong Euk LEE