Abstract: An ultrasonic inspection apparatus obtains information on the interface of a sample as digital waveform data for any “unit measurement range” and is provided with at least two data memories and controlled by a scan state monitoring signal showing the scan state of a unit measurement range belonging to a first group or a unit measurement range belonging to a second group. A comparator-register/memory-control-circuit outputs the scan state monitoring signal to the two data memories. The operating states of the two data memories being controlled by the scan state monitoring signal to alternate between writing of digital waveform data and readout of digital waveform data.

Abstract: An ultrasonic inspection apparatus obtaining information on the interface of a sample as digital waveform data for any “unit measurement range” provided with at least two data memories and controlled by a scan state monitoring signal showing the scan state of a unit measurement range belonging to a first group or a unit measurement range belonging to a second group and a comparator-register/memory-control-circuit outputting the scan state monitoring signal to the at least two data memories, the operating states of the two data memories being controlled by the scan state monitoring signal to alternate between writing of digital waveform data and readout of digital waveform data, whereby digital type ultrasonic inspection and a high speed data transfer not having an effect on the data sampling at the time of scanning in a specific direction in any scan are realized, the dead time at the time of scanner scanning by transfer of a large volume of data is reduced to zero, and high speed planar scanning