Patents by Inventor Toshiyuki Sadakane

Toshiyuki Sadakane has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8108809
    Abstract: The present invention relates to a routing analysis method for performing a routing analysis on an integrated circuit from a netlist which is information on a plurality of cells constituting the integrated circuit and routes connecting the cells, and the routing analysis method comprises a step (Step 1) of obtaining the sum of areas of a plurality of cells, the number of cells or the number of routes connecting the cells from the netlist, to be defined as a constant C, and calculating a layout area S which is an area of a square layout region, by dividing the constant C by a predetermined constant U, a step (Step 2) of calculating a total route length L by multiplying a half perimeter length H of the layout region having the layout area S obtained in Step 1 by a predetermined coefficient ?, and a step (Step 3) of calculating a routing difficulty index by dividing the total route length L by the layout area S.
    Type: Grant
    Filed: July 21, 2008
    Date of Patent: January 31, 2012
    Assignee: Renesas Electronics Corporation
    Inventors: Toshiyuki Sadakane, Ken Saito, Yoshio Inoue
  • Publication number: 20090019404
    Abstract: The invention provides a method capable of calculating a difficulty level of routing at a high processing speed with good calculating accuracy.
    Type: Application
    Filed: July 8, 2008
    Publication date: January 15, 2009
    Inventor: Toshiyuki SADAKANE
  • Publication number: 20080295055
    Abstract: The present invention relates to a routing analysis method for performing a routing analysis on an integrated circuit from a netlist which is information on a plurality of cells constituting the integrated circuit and routes connecting the cells, and the routing analysis method comprises a step (Step 1) of obtaining the sum of areas of a plurality of cells, the number of cells or the number of routes connecting the cells from the netlist, to be defined as a constant C, and calculating a layout area S which is an area of a square layout region, by dividing the constant C by a predetermined constant U, a step (Step 2) of calculating a total route length L by multiplying a half perimeter length H of the layout region having the layout area S obtained in Step 1 by a predetermined coefficient ?, and a step (Step 3) of calculating a routing difficulty index by dividing the total route length L by the layout area S.
    Type: Application
    Filed: July 21, 2008
    Publication date: November 27, 2008
    Applicant: RENESAS TECHNOLOGY CORP.
    Inventors: Toshiyuki Sadakane, Ken Saito, Yoshio Inoue
  • Patent number: 7418688
    Abstract: The present invention relates to a routing analysis method for performing a routing analysis on an integrated circuit from a netlist which is information on a plurality of cells constituting the integrated circuit and routes connecting the cells, and the routing analysis method comprises a step (Step 1) of obtaining the sum of areas of a plurality of cells, the number of cells or the number of routes connecting the cells from the netlist, to be defined as a constant C, and calculating a layout area S which is an area of a square layout region, by dividing the constant C by a predetermined constant U, a step (Step 2) of calculating a total route length L by multiplying a half perimeter length H of the layout region having the layout area S obtained in Step 1 by a predetermined coefficient ?, and a step (Step 3) of calculating a routing difficulty index by dividing the total route length L by the layout area S.
    Type: Grant
    Filed: April 22, 2005
    Date of Patent: August 26, 2008
    Assignee: Renesas Technology Corp.
    Inventors: Toshiyuki Sadakane, Ken Saito, Yoshio Inoue
  • Publication number: 20050246676
    Abstract: The present invention relates to a routing analysis method for performing a routing analysis on an integrated circuit from a netlist which is information on a plurality of cells constituting the integrated circuit and routes connecting the cells, and the routing analysis method comprises a step (Step 1) of obtaining the sum of areas of a plurality of cells, the number of cells or the number of routes connecting the cells from the netlist, to be defined as a constant C, and calculating a layout area S which is an area of a square layout region, by dividing the constant C by a predetermined constant U, a step (Step 2) of calculating a total route length L by multiplying a half perimeter length H of the layout region having the layout area S obtained in Step 1 by a predetermined coefficient ?, and a step (Step 3) of calculating a routing difficulty index by dividing the total route length L by the layout area S.
    Type: Application
    Filed: April 22, 2005
    Publication date: November 3, 2005
    Applicant: Renesas Technology Corp.
    Inventors: Toshiyuki Sadakane, Ken Saito, Yoshio Inoue