Patents by Inventor Toyokazu Maeda

Toyokazu Maeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8156794
    Abstract: An indenter is pressed onto a test piece; a displacement of the indenter is detected; and a testing force applied to the test piece through the indenter is detected. FFT analysis is performed on a displacement detection signal detected in a non-load state to detect a frequency band of noise. Filter characteristics are calculated based on the detected frequency band, and filtering is performed on the displacement detection signal based on the filter characteristics. Physical properties of the test piece are evaluated based upon the displacement detection signal after the filtering and the testing force.
    Type: Grant
    Filed: June 20, 2006
    Date of Patent: April 17, 2012
    Assignee: Shimadzu Corporation
    Inventors: Yasunori Konaka, Toyokazu Maeda
  • Publication number: 20100229637
    Abstract: An indenter is pressed onto a test piece; a displacement of the indenter is detected; and a testing force applied to the test piece through the indenter is detected. FFT analysis is performed on a displacement detection signal detected in a non-load state to detect a frequency band of noise. Filter characteristics are calculated based on the detected frequency band, and filtering is performed on the displacement detection signal based on the filter characteristics. Physical properties of the test piece are evaluated based upon the displacement detection signal after the filtering and the testing force.
    Type: Application
    Filed: June 20, 2006
    Publication date: September 16, 2010
    Applicant: SHIMIDZU CORPORATION
    Inventors: Yasunori Konaka, Toyokazu Maeda
  • Patent number: 6301956
    Abstract: A hardness tester for a large test material is downsized by shortening a stroke length of the x-y stage. A hardness tester in accordance with the invention transfers the laser irradiating unit 70 two-dimensionally along the X or Y axis and irradiate a laser beam on the material W under test placed on the stage 10. The tester also monitors the laser beam visually and determine a target position to be measured and transfers the monitoring unit 45 to the determined target position along the X or Y axis and monitor the position by means of the monitoring unit 45. If the position does not fall on a boundary between crystals, the loading unit 55 is two-dimensionally transferred and forms a dent on the position by means of the penetrator 55a. An image of the dent is captured by the monitoring unit 45 and the hardness is determined by calculating a diagonal length of the dent by image processing.
    Type: Grant
    Filed: December 10, 1999
    Date of Patent: October 16, 2001
    Assignees: Edison Hard Co., Ltd., Shimadzu Corporation
    Inventors: Hideto Fujita, Osamu Kudo, Yoshiyuki Fujita, Toyokazu Maeda