Patents by Inventor Toyoo Iida
Toyoo Iida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11745352Abstract: On the basis of a measured shape, which is a three-dimensional shape of a subject measured by means of a measuring unit using an image captured when an image capturing unit is disposed in a first position and a first attitude, a movement control unit determines a second position and a second attitude for capturing an image of the subject again, and sends an instruction to a movement mechanism. The three-dimensional shape is represented by means of height information from a reference surface. The movement control unit extracts, from the measured shape, a deficient region having deficient height information, and determines the second position and the second attitude on the basis of the height information around the deficient region of the measured shape. The position and attitude of the image capturing unit can be determined in such a way as to make it easy to eliminate the effects of shadows.Type: GrantFiled: May 9, 2019Date of Patent: September 5, 2023Assignee: OMRON CorporationInventor: Toyoo Iida
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Patent number: 11093730Abstract: A configuration capable of realizing object authentication with higher accuracy is desired. A measurement system includes a shape measurement unit that performs measurement, a storage unit that stores an entire model for each work piece type, and a recognition processing unit that executes object authentication based on whether or not a three-dimensional shape measured by the shape measurement unit is consistent with any one entire model stored in the storage unit. The entire model for each work piece type is specified by a combination of a plurality of partial models and each of the plurality of partial models is correspondently given a degree of importance. The recognition processing unit determines whether or not the three-dimensional shape is consistent with any one entire model based on degrees of importance corresponding to one or more partial models included in the entire model.Type: GrantFiled: May 16, 2019Date of Patent: August 17, 2021Assignee: OMRON CorporationInventors: Tomonori Ariyoshi, Toyoo Iida
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Patent number: 11023706Abstract: A measurement system includes a first distance calculation unit that searches for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculates a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region, and a second distance calculation unit that attempts to estimate a distance for the defective portion for which the first distance calculation unit is not able to calculate the distance by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.Type: GrantFiled: May 16, 2019Date of Patent: June 1, 2021Assignee: OMRON CorporationInventors: Hitoshi Nakatsuka, Toyoo Iida
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Publication number: 20210016448Abstract: On the basis of a measured shape, which is a three-dimensional shape of a subject measured by means of a measuring unit using an image captured when an image capturing unit is disposed in a first position and a first attitude, a movement control unit determines a second position and a second attitude for capturing an image of the subject again, and sends an instruction to a movement mechanism. The three-dimensional shape is represented by means of height information from a reference surface. The movement control unit extracts, from the measured shape, a deficient region having deficient height information, and determines the second position and the second attitude on the basis of the height information around the deficient region of the measured shape. The position and attitude of the image capturing unit can be determined in such a way as to make it easy to eliminate the effects of shadows.Type: ApplicationFiled: May 9, 2019Publication date: January 21, 2021Applicant: OMRON CorporationInventor: Toyoo IIDA
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Patent number: 10867225Abstract: A measurement system includes a first search part and a second search part. The first search part searches a set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in a projection pattern. The second search part searches the set of codes for a code that matches each code included in a model code string that fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determines recognition of the model code string when the number of the codes that fail to be searched in this search is equal to or smaller than a predetermined number.Type: GrantFiled: August 2, 2019Date of Patent: December 15, 2020Assignee: OMRON CorporationInventors: Yutaka Kato, Toyoo Iida, Hitoshi Nakatsuka
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Patent number: 10805546Abstract: An image processing system (SYS) specifies an arrangement situation of a workpiece (W) provided by a line (L). The image processing system (SYS) specifies a normal (V) with respect to a set measurement point (Wp) of the workpiece (W) according to the specified arrangement situation of the workpiece (W), and changes a position and posture of the two-dimensional camera (310) so that the specified normal (V) matches an optical axis of the two-dimensional camera (310) (S1). The image processing system (SYS) changes a distance between the two-dimensional camera (310) and the measurement point (Wp) so that the specified normal (V) matches the optical axis of the two-dimensional camera (310), to focus the two-dimensional camera (310) on the measurement point (Wp).Type: GrantFiled: April 26, 2018Date of Patent: October 13, 2020Assignee: OMRON CorporationInventors: Toyoo Iida, Yuki Taniyasu
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Publication number: 20200042847Abstract: A measurement system includes a first search part and a second search part. The first search part searches a set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in a projection pattern. The second search part searches the set of codes for a code that matches each code included in a model code string that fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determines recognition of the model code string when the number of the codes that fail to be searched in this search is equal to or smaller than a predetermined number.Type: ApplicationFiled: August 2, 2019Publication date: February 6, 2020Applicant: OMRON CorporationInventors: Yutaka KATO, Toyoo IIDA, Hitoshi NAKATSUKA
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Publication number: 20190392193Abstract: A measurement system includes a first distance calculation unit that searches for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculates a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region, and a second distance calculation unit that attempts to estimate a distance for the defective portion for which the first distance calculation unit is not able to calculate the distance by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.Type: ApplicationFiled: May 16, 2019Publication date: December 26, 2019Applicant: OMRON CorporationInventors: Hitoshi NAKATSUKA, Toyoo IIDA
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Publication number: 20190377931Abstract: A configuration capable of realizing object authentication with higher accuracy is desired. A measurement system includes a shape measurement unit that performs measurement, a storage unit that stores an entire model for each work piece type, and a recognition processing unit that executes object authentication based on whether or not a three-dimensional shape measured by the shape measurement unit is consistent with any one entire model stored in the storage unit. The entire model for each work piece type is specified by a combination of a plurality of partial models and each of the plurality of partial models is correspondently given a degree of importance. The recognition processing unit determines whether or not the three-dimensional shape is consistent with any one entire model based on degrees of importance corresponding to one or more partial models included in the entire model.Type: ApplicationFiled: May 16, 2019Publication date: December 12, 2019Applicant: OMRON CorporationInventors: Tomonori ARIYOSHI, Toyoo IIDA
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Patent number: 10407250Abstract: An imaging unit has its imaging field of view containing the conveyor, and images a subject in the imaging field. The imaging unit generates a luminance image representing the subject and a range image including height information indicating a height of at least one point on the subject from the conveyor by imaging the subject. A measurement unit measures a position of each workpiece in the luminance image. An obtaining unit obtains an overlap order of the workpieces based on the height information in the range image corresponding to the position of each workpiece in the luminance image. A determination unit determines the workpiece pickup order to allow a workpiece having a highest place in the overlap order to be picked up with a higher priority than other workpieces.Type: GrantFiled: October 19, 2017Date of Patent: September 10, 2019Assignee: OMRON CorporationInventors: Yosuke Iwai, Toyoo Iida, Junji Shimamura
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Publication number: 20180338090Abstract: An image processing system (SYS) specifies an arrangement situation of a workpiece (W) provided by a line (L). The image processing system (SYS) specifies a normal (V) with respect to a set measurement point (Wp) of the workpiece (W) according to the specified arrangement situation of the workpiece (W), and changes a position and posture of the two-dimensional camera (310) so that the specified normal (V) matches an optical axis of the two-dimensional camera (310) (S1). The image processing system (SYS) changes a distance between the two-dimensional camera (310) and the measurement point (Wp) so that the specified normal (V) matches the optical axis of the two-dimensional camera (310), to focus the two-dimensional camera (310) on the measurement point (Wp).Type: ApplicationFiled: April 26, 2018Publication date: November 22, 2018Applicant: OMRON CorporationInventors: Toyoo IIDA, Yuki TANIYASU
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Publication number: 20180194573Abstract: An imaging unit has its imaging field of view containing the conveyor, and images a subject in the imaging field. The imaging unit generates a luminance image representing the subject and a range image including height information indicating a height of at least one point on the subject from the conveyor by imaging the subject. A measurement unit measures a position of each workpiece in the luminance image. An obtaining unit obtains an overlap order of the workpieces based on the height information in the range image corresponding to the position of each workpiece in the luminance image. A determination unit determines the workpiece pickup order to allow a workpiece having a highest place in the overlap order to be picked up with a higher priority than other workpieces.Type: ApplicationFiled: October 19, 2017Publication date: July 12, 2018Applicant: OMRON CorporationInventors: Yosuke IWAI, Toyoo IIDA, Junji SHIMAMURA
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Publication number: 20170116738Abstract: The 3D shape of a measurement object is measured accurately without using an encoder or other devices. A three-dimensional shape measurement device includes a mark search unit that calculates, using a search mark, a coordinate of a part of a surface of a measurement object including an optical cutting line formed with line laser light.Type: ApplicationFiled: September 29, 2016Publication date: April 27, 2017Applicant: OMRON CorporationInventor: Toyoo IIDA
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Patent number: 8825452Abstract: A three-dimensional model data producing processing apparatus produces three-dimensional model data using design data (CAD data) of an object to be recognized. The three-dimensional model data producing processing includes processing conversion processing, edit processing, and teaching processing. The conversion processing and the edit processing are performed to the design data on a computer. The teaching processing is performed in a practical environment. It is not necessary to image a workpiece model in the three-dimensional model data producing processing.Type: GrantFiled: February 18, 2011Date of Patent: September 2, 2014Assignee: OMRON CorporationInventors: Kazuhiro Shono, Toyoo Iida, Kengo Ichimura, Reiji Takahashi, Akira Ishida, Yasuyuki Ikeda
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Publication number: 20110218776Abstract: A three-dimensional model data producing processing apparatus produces three-dimensional model data using design data (CAD data) of an object to be recognized. The three-dimensional model data producing processing includes processing conversion processing, edit processing, and teaching processing. The conversion processing and the edit processing are performed to the design data on a computer. The teaching processing is performed in a practical environment. It is not necessary to image a workpiece model in the three-dimensional model data producing processing.Type: ApplicationFiled: February 18, 2011Publication date: September 8, 2011Applicant: OMRON CORPORATIONInventors: Kazuhiro Shono, Toyoo Iida, Kengo Ichimura, Reiji Takahashi, Akira Ishida, Yasuyuki Ikeda
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Publication number: 20100156896Abstract: This invention aims to ensure accuracy of a three-dimensional model to be registered. With information a of three-dimensional information a, b, c restored by measuring an actual model of a work, which is a target of three-dimensional recognition, from different directions as a reference, other three-dimensional information b, c are coordinate transformed so as to be aligned with the reference three-dimensional information, and three-dimensional information d including all of three-dimensional information b?, c? after the transformation and the reference three-dimensional information a is created. The three-dimensional information d is temporarily registered as the three-dimensional model. A difference amount among the integrated three-dimensional information a, b?, c? is calculated, and an evaluation index based on the difference value is displayed with an image view of a contour pattern represented by the three-dimensional model.Type: ApplicationFiled: November 17, 2009Publication date: June 24, 2010Inventors: Kengo ICHIMURA, Akira Ishida, Toyoo Iida, Junichiro ueki, Kazuhiro Shono, Yoshizo Togawa
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Publication number: 20100111364Abstract: This invention aims to create a three-dimensional model of satisfactory accuracy even when adopting a method of performing three-dimensional measurement by arbitrarily changing a positional relationship between an actual model and a camera, and aligning and integrating three-dimensional information restored by each measurement. A polygonal mark M having a shape in which a direction can be uniquely specified is attached to a predetermined area of an actual model WM of a work to be three-dimensionally recognized. A process of changing the orientation of the actual model WM such that a state in which the mark M is contained in the view of each camera is maintained, and then performing the three-dimensional measurement is executed over a plurality of times.Type: ApplicationFiled: November 3, 2009Publication date: May 6, 2010Inventors: Toyoo IIDA, Kengo Ichimura, Junichiro Ueki, Kazuhiro Shono, Yoshizo Togawa, Akira Ishida
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Patent number: 7263217Abstract: To provide a three-dimensional monitoring apparatus capable of detecting with high accuracy an incoming of an object into a predetermined three-dimensional space by using pattern light as a detecting carrier. A three-dimensional monitoring apparatus comprising (1) an irradiating device for irradiating predetermined pattern light to three-dimensional space S to be monitored, (2) an imaging device for imaging a projection pattern projected by irradiating of the pattern light on an incoming object M and on a screen 5 in the space S to capture image data and (3) a measuring device to measure a position of the object M based on the comparison between a monitoring image captured by the imaging device when there is the object M in the space S and a reference image captured by the imaging device when there is no object M in the space S.Type: GrantFiled: March 11, 2003Date of Patent: August 28, 2007Assignee: Omron CorporationInventors: Noboru Kawaike, Ryuichiro Takaichi, Yorihisa Ikenaga, Toyoo Iida
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Publication number: 20070189546Abstract: Abnormal sound desired for inspection is extracted by inputting NG signal containing the abnormal sound and OK signal not containing this abnormal sound but containing noise that is contained in the NG signal, separating the NG signal and the OK signal each into a steady component having steady property, white noise and a non-steady component having non-steady property, and extracting abnormal sound or removing noise individually from the steady component, the white noise and the non-steady component having non-steady property.Type: ApplicationFiled: January 29, 2007Publication date: August 16, 2007Inventors: Yoshizo Togawa, Toyoo Iida
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Publication number: 20070093987Abstract: A system is disclosed which can easily search and determine the effective feature amount suitable for determining the normality/abnormality of an object to be inspected in an inspection/diagnosis apparatus and the various parameters for calculating the effective feature amount. A parameter search unit searches for the various parameters used for calculating the feature amount. A feature amount calculation unit calculates a plurality of feature amounts based on the various parameters searched by the parameter search unit from a given sample data including the normal and abnormal data. An assessment unit outputs the excellence of the various parameters as an assessment value from the result of calculation of the feature amount determined by the feature amount calculation unit.Type: ApplicationFiled: October 7, 2005Publication date: April 26, 2007Applicant: OMRON CorporationInventor: Toyoo Iida