Patents by Inventor Toyoo Iida

Toyoo Iida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11745352
    Abstract: On the basis of a measured shape, which is a three-dimensional shape of a subject measured by means of a measuring unit using an image captured when an image capturing unit is disposed in a first position and a first attitude, a movement control unit determines a second position and a second attitude for capturing an image of the subject again, and sends an instruction to a movement mechanism. The three-dimensional shape is represented by means of height information from a reference surface. The movement control unit extracts, from the measured shape, a deficient region having deficient height information, and determines the second position and the second attitude on the basis of the height information around the deficient region of the measured shape. The position and attitude of the image capturing unit can be determined in such a way as to make it easy to eliminate the effects of shadows.
    Type: Grant
    Filed: May 9, 2019
    Date of Patent: September 5, 2023
    Assignee: OMRON Corporation
    Inventor: Toyoo Iida
  • Patent number: 11093730
    Abstract: A configuration capable of realizing object authentication with higher accuracy is desired. A measurement system includes a shape measurement unit that performs measurement, a storage unit that stores an entire model for each work piece type, and a recognition processing unit that executes object authentication based on whether or not a three-dimensional shape measured by the shape measurement unit is consistent with any one entire model stored in the storage unit. The entire model for each work piece type is specified by a combination of a plurality of partial models and each of the plurality of partial models is correspondently given a degree of importance. The recognition processing unit determines whether or not the three-dimensional shape is consistent with any one entire model based on degrees of importance corresponding to one or more partial models included in the entire model.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: August 17, 2021
    Assignee: OMRON Corporation
    Inventors: Tomonori Ariyoshi, Toyoo Iida
  • Patent number: 11023706
    Abstract: A measurement system includes a first distance calculation unit that searches for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculates a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region, and a second distance calculation unit that attempts to estimate a distance for the defective portion for which the first distance calculation unit is not able to calculate the distance by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: June 1, 2021
    Assignee: OMRON Corporation
    Inventors: Hitoshi Nakatsuka, Toyoo Iida
  • Publication number: 20210016448
    Abstract: On the basis of a measured shape, which is a three-dimensional shape of a subject measured by means of a measuring unit using an image captured when an image capturing unit is disposed in a first position and a first attitude, a movement control unit determines a second position and a second attitude for capturing an image of the subject again, and sends an instruction to a movement mechanism. The three-dimensional shape is represented by means of height information from a reference surface. The movement control unit extracts, from the measured shape, a deficient region having deficient height information, and determines the second position and the second attitude on the basis of the height information around the deficient region of the measured shape. The position and attitude of the image capturing unit can be determined in such a way as to make it easy to eliminate the effects of shadows.
    Type: Application
    Filed: May 9, 2019
    Publication date: January 21, 2021
    Applicant: OMRON Corporation
    Inventor: Toyoo IIDA
  • Patent number: 10867225
    Abstract: A measurement system includes a first search part and a second search part. The first search part searches a set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in a projection pattern. The second search part searches the set of codes for a code that matches each code included in a model code string that fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determines recognition of the model code string when the number of the codes that fail to be searched in this search is equal to or smaller than a predetermined number.
    Type: Grant
    Filed: August 2, 2019
    Date of Patent: December 15, 2020
    Assignee: OMRON Corporation
    Inventors: Yutaka Kato, Toyoo Iida, Hitoshi Nakatsuka
  • Patent number: 10805546
    Abstract: An image processing system (SYS) specifies an arrangement situation of a workpiece (W) provided by a line (L). The image processing system (SYS) specifies a normal (V) with respect to a set measurement point (Wp) of the workpiece (W) according to the specified arrangement situation of the workpiece (W), and changes a position and posture of the two-dimensional camera (310) so that the specified normal (V) matches an optical axis of the two-dimensional camera (310) (S1). The image processing system (SYS) changes a distance between the two-dimensional camera (310) and the measurement point (Wp) so that the specified normal (V) matches the optical axis of the two-dimensional camera (310), to focus the two-dimensional camera (310) on the measurement point (Wp).
    Type: Grant
    Filed: April 26, 2018
    Date of Patent: October 13, 2020
    Assignee: OMRON Corporation
    Inventors: Toyoo Iida, Yuki Taniyasu
  • Publication number: 20200042847
    Abstract: A measurement system includes a first search part and a second search part. The first search part searches a set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in a projection pattern. The second search part searches the set of codes for a code that matches each code included in a model code string that fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determines recognition of the model code string when the number of the codes that fail to be searched in this search is equal to or smaller than a predetermined number.
    Type: Application
    Filed: August 2, 2019
    Publication date: February 6, 2020
    Applicant: OMRON Corporation
    Inventors: Yutaka KATO, Toyoo IIDA, Hitoshi NAKATSUKA
  • Publication number: 20190392193
    Abstract: A measurement system includes a first distance calculation unit that searches for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculates a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region, and a second distance calculation unit that attempts to estimate a distance for the defective portion for which the first distance calculation unit is not able to calculate the distance by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.
    Type: Application
    Filed: May 16, 2019
    Publication date: December 26, 2019
    Applicant: OMRON Corporation
    Inventors: Hitoshi NAKATSUKA, Toyoo IIDA
  • Publication number: 20190377931
    Abstract: A configuration capable of realizing object authentication with higher accuracy is desired. A measurement system includes a shape measurement unit that performs measurement, a storage unit that stores an entire model for each work piece type, and a recognition processing unit that executes object authentication based on whether or not a three-dimensional shape measured by the shape measurement unit is consistent with any one entire model stored in the storage unit. The entire model for each work piece type is specified by a combination of a plurality of partial models and each of the plurality of partial models is correspondently given a degree of importance. The recognition processing unit determines whether or not the three-dimensional shape is consistent with any one entire model based on degrees of importance corresponding to one or more partial models included in the entire model.
    Type: Application
    Filed: May 16, 2019
    Publication date: December 12, 2019
    Applicant: OMRON Corporation
    Inventors: Tomonori ARIYOSHI, Toyoo IIDA
  • Patent number: 10407250
    Abstract: An imaging unit has its imaging field of view containing the conveyor, and images a subject in the imaging field. The imaging unit generates a luminance image representing the subject and a range image including height information indicating a height of at least one point on the subject from the conveyor by imaging the subject. A measurement unit measures a position of each workpiece in the luminance image. An obtaining unit obtains an overlap order of the workpieces based on the height information in the range image corresponding to the position of each workpiece in the luminance image. A determination unit determines the workpiece pickup order to allow a workpiece having a highest place in the overlap order to be picked up with a higher priority than other workpieces.
    Type: Grant
    Filed: October 19, 2017
    Date of Patent: September 10, 2019
    Assignee: OMRON Corporation
    Inventors: Yosuke Iwai, Toyoo Iida, Junji Shimamura
  • Publication number: 20180338090
    Abstract: An image processing system (SYS) specifies an arrangement situation of a workpiece (W) provided by a line (L). The image processing system (SYS) specifies a normal (V) with respect to a set measurement point (Wp) of the workpiece (W) according to the specified arrangement situation of the workpiece (W), and changes a position and posture of the two-dimensional camera (310) so that the specified normal (V) matches an optical axis of the two-dimensional camera (310) (S1). The image processing system (SYS) changes a distance between the two-dimensional camera (310) and the measurement point (Wp) so that the specified normal (V) matches the optical axis of the two-dimensional camera (310), to focus the two-dimensional camera (310) on the measurement point (Wp).
    Type: Application
    Filed: April 26, 2018
    Publication date: November 22, 2018
    Applicant: OMRON Corporation
    Inventors: Toyoo IIDA, Yuki TANIYASU
  • Publication number: 20180194573
    Abstract: An imaging unit has its imaging field of view containing the conveyor, and images a subject in the imaging field. The imaging unit generates a luminance image representing the subject and a range image including height information indicating a height of at least one point on the subject from the conveyor by imaging the subject. A measurement unit measures a position of each workpiece in the luminance image. An obtaining unit obtains an overlap order of the workpieces based on the height information in the range image corresponding to the position of each workpiece in the luminance image. A determination unit determines the workpiece pickup order to allow a workpiece having a highest place in the overlap order to be picked up with a higher priority than other workpieces.
    Type: Application
    Filed: October 19, 2017
    Publication date: July 12, 2018
    Applicant: OMRON Corporation
    Inventors: Yosuke IWAI, Toyoo IIDA, Junji SHIMAMURA
  • Publication number: 20170116738
    Abstract: The 3D shape of a measurement object is measured accurately without using an encoder or other devices. A three-dimensional shape measurement device includes a mark search unit that calculates, using a search mark, a coordinate of a part of a surface of a measurement object including an optical cutting line formed with line laser light.
    Type: Application
    Filed: September 29, 2016
    Publication date: April 27, 2017
    Applicant: OMRON Corporation
    Inventor: Toyoo IIDA
  • Patent number: 8825452
    Abstract: A three-dimensional model data producing processing apparatus produces three-dimensional model data using design data (CAD data) of an object to be recognized. The three-dimensional model data producing processing includes processing conversion processing, edit processing, and teaching processing. The conversion processing and the edit processing are performed to the design data on a computer. The teaching processing is performed in a practical environment. It is not necessary to image a workpiece model in the three-dimensional model data producing processing.
    Type: Grant
    Filed: February 18, 2011
    Date of Patent: September 2, 2014
    Assignee: OMRON Corporation
    Inventors: Kazuhiro Shono, Toyoo Iida, Kengo Ichimura, Reiji Takahashi, Akira Ishida, Yasuyuki Ikeda
  • Publication number: 20110218776
    Abstract: A three-dimensional model data producing processing apparatus produces three-dimensional model data using design data (CAD data) of an object to be recognized. The three-dimensional model data producing processing includes processing conversion processing, edit processing, and teaching processing. The conversion processing and the edit processing are performed to the design data on a computer. The teaching processing is performed in a practical environment. It is not necessary to image a workpiece model in the three-dimensional model data producing processing.
    Type: Application
    Filed: February 18, 2011
    Publication date: September 8, 2011
    Applicant: OMRON CORPORATION
    Inventors: Kazuhiro Shono, Toyoo Iida, Kengo Ichimura, Reiji Takahashi, Akira Ishida, Yasuyuki Ikeda
  • Publication number: 20100156896
    Abstract: This invention aims to ensure accuracy of a three-dimensional model to be registered. With information a of three-dimensional information a, b, c restored by measuring an actual model of a work, which is a target of three-dimensional recognition, from different directions as a reference, other three-dimensional information b, c are coordinate transformed so as to be aligned with the reference three-dimensional information, and three-dimensional information d including all of three-dimensional information b?, c? after the transformation and the reference three-dimensional information a is created. The three-dimensional information d is temporarily registered as the three-dimensional model. A difference amount among the integrated three-dimensional information a, b?, c? is calculated, and an evaluation index based on the difference value is displayed with an image view of a contour pattern represented by the three-dimensional model.
    Type: Application
    Filed: November 17, 2009
    Publication date: June 24, 2010
    Inventors: Kengo ICHIMURA, Akira Ishida, Toyoo Iida, Junichiro ueki, Kazuhiro Shono, Yoshizo Togawa
  • Publication number: 20100111364
    Abstract: This invention aims to create a three-dimensional model of satisfactory accuracy even when adopting a method of performing three-dimensional measurement by arbitrarily changing a positional relationship between an actual model and a camera, and aligning and integrating three-dimensional information restored by each measurement. A polygonal mark M having a shape in which a direction can be uniquely specified is attached to a predetermined area of an actual model WM of a work to be three-dimensionally recognized. A process of changing the orientation of the actual model WM such that a state in which the mark M is contained in the view of each camera is maintained, and then performing the three-dimensional measurement is executed over a plurality of times.
    Type: Application
    Filed: November 3, 2009
    Publication date: May 6, 2010
    Inventors: Toyoo IIDA, Kengo Ichimura, Junichiro Ueki, Kazuhiro Shono, Yoshizo Togawa, Akira Ishida
  • Patent number: 7263217
    Abstract: To provide a three-dimensional monitoring apparatus capable of detecting with high accuracy an incoming of an object into a predetermined three-dimensional space by using pattern light as a detecting carrier. A three-dimensional monitoring apparatus comprising (1) an irradiating device for irradiating predetermined pattern light to three-dimensional space S to be monitored, (2) an imaging device for imaging a projection pattern projected by irradiating of the pattern light on an incoming object M and on a screen 5 in the space S to capture image data and (3) a measuring device to measure a position of the object M based on the comparison between a monitoring image captured by the imaging device when there is the object M in the space S and a reference image captured by the imaging device when there is no object M in the space S.
    Type: Grant
    Filed: March 11, 2003
    Date of Patent: August 28, 2007
    Assignee: Omron Corporation
    Inventors: Noboru Kawaike, Ryuichiro Takaichi, Yorihisa Ikenaga, Toyoo Iida
  • Publication number: 20070189546
    Abstract: Abnormal sound desired for inspection is extracted by inputting NG signal containing the abnormal sound and OK signal not containing this abnormal sound but containing noise that is contained in the NG signal, separating the NG signal and the OK signal each into a steady component having steady property, white noise and a non-steady component having non-steady property, and extracting abnormal sound or removing noise individually from the steady component, the white noise and the non-steady component having non-steady property.
    Type: Application
    Filed: January 29, 2007
    Publication date: August 16, 2007
    Inventors: Yoshizo Togawa, Toyoo Iida
  • Publication number: 20070093987
    Abstract: A system is disclosed which can easily search and determine the effective feature amount suitable for determining the normality/abnormality of an object to be inspected in an inspection/diagnosis apparatus and the various parameters for calculating the effective feature amount. A parameter search unit searches for the various parameters used for calculating the feature amount. A feature amount calculation unit calculates a plurality of feature amounts based on the various parameters searched by the parameter search unit from a given sample data including the normal and abnormal data. An assessment unit outputs the excellence of the various parameters as an assessment value from the result of calculation of the feature amount determined by the feature amount calculation unit.
    Type: Application
    Filed: October 7, 2005
    Publication date: April 26, 2007
    Applicant: OMRON Corporation
    Inventor: Toyoo Iida