Abstract: The present invention discloses an inspection system comprising a plurality of detectors (10) for inspecting an object, the plurality of detectors (10) sharing one or more imaging chains for inspecting a plurality of regions of interest on the object being inspected, wherein the detectors (10) capture images of the object using a combination of different imaging modes, and each region of interest is inspected by one or more detectors (10).

Abstract: Provided herein are methods and apparatuses for facilitating clinical acceptance of patient monitoring features. These methods may be used in conjunction with a computer that includes software for viewing the type of display associated with the monitoring feature. The clinical acceptance systems as provided herein may display a new or experimental monitoring feature along with a benchmark feature that a clinician is familiar with. In certain embodiments, the viewing tool may be isolated from the calculation tools so that the computer may include stored files that are in a format ready for display.

Abstract: Provided herein are methods and apparatuses for facilitating clinical acceptance of patient monitoring features. These methods may be used in conjunction with a computer that includes software for viewing the type of display associated with the monitoring feature. The clinical acceptance systems as provided herein may display a new or experimental monitoring feature along with a benchmark feature that a clinician is familiar with. In certain embodiments, the viewing tool may be isolated from the calculation tools so that the computer may include stored files that are in a format ready for display.

Abstract: An x-ray inspection system. The x-ray inspection system includes an x-ray source, an on-axis x-ray sensor, at least one off-axis x-ray sensor, a fixture, and an accumulation circuit. The on-axis x-ray sensor is configured to capture on-axis images of radiation from the x-ray source. The x-ray source is displaced from the on-axis x-ray sensor, and the x-ray source and the on-axis x-ray sensor are positioned on an axis conceptually drawn between the x-ray source and the on-axis x-ray sensor. At least one off-axis x-ray sensor is configured to capture off-axis images of radiation from the x-ray source, wherein each off-axis x-ray sensor is positioned off the axis. The fixture is configured to maintain an article between the x-ray source and the on-axis and off-axis x-ray sensors, and the accumulation circuit is configured to receive and accumulate images captured by the on-axis and off-axis x-ray sensors.

Abstract: An x-ray inspection system. The x-ray inspection system includes an x-ray source, an on-axis x-ray sensor, at least one off-axis x-ray sensor, a fixture, and an accumulation circuit. The on-axis x-ray sensor is configured to capture on-axis images of radiation from the x-ray source. The x-ray source is displaced from the on-axis x-ray sensor, and the x-ray source and the on-axis x-ray sensor are positioned on an axis conceptually drawn between the x-ray source and the on-axis x-ray sensor. At least one off-axis x-ray sensor is configured to capture off-axis images of radiation from the x-ray source, wherein each off-axis x-ray sensor is positioned off the axis. The fixture is configured to maintain an article between the x-ray source and the on-axis and off-axis x-ray sensors, and the accumulation circuit is configured to receive and accumulate images captured by the on-axis and off-axis x-ray sensors.