Abstract: A method and system for collecting and analyzing photoemission data wherein illumination and photoemission images are acquired for a plurality of die, such as for each die on a wafer. Then, the images are overlaid, aligned, and assembled in a mosaic, thereby allowing analysis of the photoemission occurring across a plurality of die, such as across the entire wafer. Preferably, gathering this data allows statistical analysis of the photoemission such as analysis of commonly emitting locations to identify structures/cells that are sensitive to the manufacturing process.

Abstract: A method and sample for radiation microscopy include a sample source that includes an area of interest, an outer side of a sample formed in the sample source adjacent to the area of interest, an inner side of the sample formed inside the sample source wherein at least a portion of the area of interest is included between the inner side of the sample and the outer side, and a particle beam channel formed inside the sample source for conducting a particle beam to or from the inner side of the sample.

Abstract: A method of generating a simulated voltage contrast image includes steps for receiving as input design information for an integrated circuit die, selecting a net of the integrated circuit from the design information, generating a trace outline of the selected net from the image, analyzing the design information to calculate an interaction between a charged particle beam and the selected net, selecting a shading representative of the calculated interaction, and filling the trace outline of the selected net with the shading to generate the simulated voltage contrast image.

Abstract: A method and system for collecting and analyzing photoemission data wherein illumination and photoemission images are acquired for a plurality of die, such as for each die on a wafer. Then, the images are overlaid, aligned, and assembled in a mosaic, thereby allowing analysis of the photoemission occurring across a plurality of die, such as across the entire wafer. Preferably, gathering this data allows statistical analysis of the photoemission such as analysis of commonly emitting locations to identify structures/cells that are sensitive to the manufacturing process.

Abstract: A method of generating a simulated voltage contrast image includes steps for receiving as input design information for an integrated circuit die, selecting a net of the integrated circuit from the design information, generating a trace outline of the selected net from the image, analyzing the design information to calculate an interaction between a charged particle beam and the selected net, selecting a shading representative of the calculated interaction, and filling the trace outline of the selected net with the shading to generate the simulated voltage contrast image.

Abstract: In a method for a well logging data presentation, data sets are identified from well logging data. Each data set is assigned a unique identifier. A presentation template, which defines a presentation for the well logging data, is configured. The presentation for the logging data may be in the form of a display and/or a hard copy. The presentation template includes definitions of a number of component presentations. Each component presentation includes a corresponding component template. Each component template includes a pointer pointing to a source for one of the data sets and defines a structure for the component's presentation. A graphical presentation program generates the presentation, responsive to reading the presentation template, component templates and data sets. The presentation can be viewed and changed while data is still being acquired.

Abstract: A contactor for providing electrical connections between a device under test and a tester input board. The device under test has first electrical contacts with a first pitch and a first diameter that contact a first side of the contactor, and the tester input board has second electrical contacts with a second pitch and a second diameter that contact a second side of the contactor. The contactor has a sheet of an electrically insulating material with a first surface at the first side of the contactor and a second surface at the second side of the contactor. The first surface and the second surface of the electrically insulating material are substantially parallel one to another. Electrical connectors extend along a length from the first side of the contactor to the second side of the contactor. The electrical connectors are substantially parallel one to another along their lengths.