Patents by Inventor Travis E. Swanson
Travis E. Swanson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9542985Abstract: The present disclosure includes methods and systems for channel skewing. One or more methods for channel skewing includes providing a number of groups of data signals to a memory component, each of the number of groups corresponding to a respective channel, and adjusting a phase of a group of data signals corresponding to at least one of the number of channels such that the group of data signals are skewed with respect to a group of data signals corresponding to at least one of the other respective channels.Type: GrantFiled: July 22, 2015Date of Patent: January 10, 2017Assignee: Micron Technology, Inc.Inventors: Travis E. Swanson, Paul J. Voit, Ryan M. Przybilla
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Publication number: 20150325277Abstract: Methods and systems for channel skewing are described. One or more methods for channel skewing includes providing a number of groups of data signals to a memory component, each of the number of groups corresponding to a respective channel, and adjusting a phase of a group of data signals corresponding to at least one of the number of channels such that the group of data signals are skewed with respect to a group of data signals corresponding to at least one of the other respective channels.Type: ApplicationFiled: July 22, 2015Publication date: November 12, 2015Inventors: Travis E. Swanson, Paul J. Voit, Ryan M. Przybilla
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Patent number: 9105324Abstract: Methods and systems for channel skewing are described. One or more methods for channel skewing includes providing a number of groups of data signals to a memory component, each of the number of groups corresponding to a respective channel, and adjusting a phase of a group of data signals corresponding to at least one of the number of channels such that the group of data signals are skewed with respect to a group of data signals corresponding to at least one of the other respective channels.Type: GrantFiled: June 25, 2013Date of Patent: August 11, 2015Assignee: Micron Technology, Inc.Inventors: Travis E. Swanson, Paul J. Voit, Ryan M. Przybilla
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Publication number: 20130286765Abstract: Methods and systems for channel skewing are described. One or more methods for channel skewing includes providing a number of groups of data signals to a memory component, each of the number of groups corresponding to a respective channel, and adjusting a phase of a group of data signals corresponding to at least one of the number of channels such that the group of data signals are skewed with respect to a group of data signals corresponding to at least one of the other respective channels.Type: ApplicationFiled: June 25, 2013Publication date: October 31, 2013Inventors: Travis E. Swanson, Paul J. Voit, Ryan M. Przybilla
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Patent number: 8472279Abstract: Methods and systems for channel skewing are described. One or more methods for channel skewing includes providing a number of groups of data signals to a memory component, each of the number of groups corresponding to a respective channel, and adjusting a phase of a group of data signals corresponding to at least one of the number of channels such that the group of data signals are skewed with respect to a group of data signals corresponding to at least one of the other respective channels.Type: GrantFiled: August 31, 2010Date of Patent: June 25, 2013Assignee: Micron Technology, Inc.Inventors: Travis E. Swanson, Paul J. Voit, Ryan M. Przybilla
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Publication number: 20120051171Abstract: Methods and systems for channel skewing are described. One or more methods for channel skewing includes providing a number of groups of data signals to a memory component, each of the number of groups corresponding to a respective channel, and adjusting a phase of a group of data signals corresponding to at least one of the number of channels such that the group of data signals are skewed with respect to a group of data signals corresponding to at least one of the other respective channels.Type: ApplicationFiled: August 31, 2010Publication date: March 1, 2012Applicant: MICRON TECHNOLOGY, INC.Inventors: Travis E. Swanson, Paul J. Voit, Ryan M. Przybilla
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Patent number: 7694202Abstract: A system and method to provide memory test patterns for the calibration of a delay locked loop (DLL) using a pseudo random bit sequence (PRBS) stored in a serial presence detect (SPD) circuit memory. The test bits stored in the SPD memory are transferred to a memory controller register (MCR) and implemented on the system data bus as test patterns that closely simulate run-time switching conditions on the system bus, so as to allow more accurate calibration of the DLL. Test data write/read operations may be performed while signals for the test patterns are present on various bit lines in the data bus so as to allow for accurate determination or adjustment of the value for the delay to be provided by the DLL to the strobe signals during memory data reading operations at run time. Memory chips may also be tested over an operating range of values using the generated test patterns.Type: GrantFiled: January 28, 2004Date of Patent: April 6, 2010Assignee: Micron Technology, Inc.Inventors: Travis E. Swanson, Jeffrey J. Rooney
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Patent number: 7444559Abstract: A system and method to generate memory test patterns for the calibration of a delay locked loop (DLL) using pseudo random bit sequences (PRBS) generated through a pair of liner feedback shift registers (LFSR). The generated patterns are implemented on the system data bus as test patterns that closely simulate run-time switching conditions on the system bus, so as to allow more accurate calibration of the DLL. Test data write/read operations may be performed while signals for the test patterns are present on various bit lines in the data bus so as to allow for accurate determination or adjustment of the value for the delay to be provided by the DLL to the strobe signals during memory data reading operations at run time. Memory chips may also be tested over an operating range of values using the generated test patterns.Type: GrantFiled: January 28, 2004Date of Patent: October 28, 2008Assignee: Micron Technology, Inc.Inventors: Travis E. Swanson, Roy E. Greeff
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Patent number: 6798264Abstract: A method and apparatus for signal processing may include an electronic circuit comprising a receiver configured to receive a signal and a dynamic threshold circuit configured to process the signal. The dynamic threshold circuit is configured to compare the signal to a threshold and generate an output signal according to the comparison. The dynamic threshold circuit is also configured to change the threshold to a selected level at a selected time. In various embodiments, the selected level is selected to be a level between the level of the input signal and a midpoint of the input signal. In another embodiment, the selected time is selected to correspond to a stabilization time of the input signal.Type: GrantFiled: August 8, 2002Date of Patent: September 28, 2004Assignee: Micron Technology, Inc.Inventors: Travis E. Swanson, Steven R. Van Kirk
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Publication number: 20040027170Abstract: A method and apparatus for signal processing may include an electronic circuit comprising a receiver configured to receive a signal and a dynamic threshold circuit configured to process the signal. The dynamic threshold circuit is configured to compare the signal to a threshold and generate an output signal according to the comparison. The dynamic threshold circuit is also configured to change the threshold to a selected level at a selected time. In various embodiments, the selected level is selected to be a level between the level of the input signal and a midpoint of the input signal. In another embodiment, the selected time is selected to correspond to a stabilization time of the input signal.Type: ApplicationFiled: August 8, 2002Publication date: February 12, 2004Inventors: Travis E. Swanson, Steven R. Van Kirk