Abstract: A test system for testing a device under test (DUT) is provided. The test system may include multiple test stations that are coupled to a network server. A master test station configuration file associated with each of the test stations may be stored on the network server. Each of the test stations may intermittently obtain updated test station configuration information from the network server to synchronize testing. A test station may be configured to check whether the DUT has successfully passed testing at preceding test stations. The test station may be given permission to write its test results into storage circuitry in the DUT. If test results are satisfactory, the DUT may be tested using a subsequent test station. If test results do not satisfy design criteria, the DUT may be sent to a corresponding repair station for rework.