Patent number: 10198333
Abstract: An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware hooks (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and debug of a part/platform under test.
Type:
Grant
Filed:
December 23, 2010
Date of Patent:
February 5, 2019
Assignee:
INTEL CORPORATION
Inventors:
Mark B. Trobough, Keshavan K. Tiruvallur, Chinna B. Prudvi, Christian E. Iovin, David W. Grawrock, Jay J. Nejedlo, Ashok N. Kabadi, Travis K. Goff, Evan J. Halprin, Kapila B. Udawatta, Jiun Long Foo, Wee Hoo Cheah, Vui Yong Liew, Selvakumar Raja Gopal, Yuen Tat Lee, Samie B. Samaan, Kip C. Killpack, Neil Dobler, Nagib Z. Hakim, Brian Meyer, William H. Penner, John L. Baudrexl, Russell J. Wunderlich, James J. Grealish, Kyle Markley, Timothy S. Storey, Loren J. McConnell, Lyle E. Cool, Mukesh Kataria, Rahima K. Mohammed, Tieyu Zheng, Yi Amy Xia, Ridvan A. Sahan, Arun R. Ramadorai, Priyadarsan Patra, Edwin E. Parks, Abhijit Davare, Padmakumar Gopal, Bruce Querbach, Hermann W. Gartler, Keith Drescher, Sanjay S. Salem, David C. Florey
Publication number: 20150127983
Abstract: An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and de-bug of a part/platform under test.
Type:
Application
Filed:
December 23, 2010
Publication date:
May 7, 2015
Applicant:
INTEL CORPORATION
Inventors:
Mark B. Trobough, Keshavan K. Tiruvallur, Chinna B. Prudvi, Christian E. Iovin, David W. Grawrock, Jay J. Nejedlo, Ashok N. Kabadi, Travis K. Goff, Evan J. Halprin, Kapila B. Udawatta, Jiun Long Foo, Wee Hoo Cheah, Vui Yong Liew, Selvakumar Raja Gopal, Yuen Tat Lee, Samie B. Samaan, Kip C. Killpack, Neil Dobler, Nagib Z. Hakim, Briar Meyer, William H. Penner, John L. Baudrexl, Russell J. Wunderlich, James J. Grealish, Kyle Markley, Timothy S. Storey, Loren J. McConnell, Lyle E. Cool, Mukesh Kataria, Rahima K. Mohammed, Tieyu Zheng, Yi Amy Xia, Ridvan A. Sahan, Arun R. Ramadorai, Priyadarsan Patra, Edwin E. Parks, Abhijit Davare, Padmakumar Gopal, Bruce Querbach, Hermann W. Gartler, Keith Drescher, Sanjay S. Salem, David C. Florey
