Abstract: A method apparatus for assisting in the calibration of a pick and place machine including a parts pick up jig having a first feeder shoe for placement over the end of one of the feeder stations and second feeder shoe for placement over the end of an adjacent feeder station allowing for the safe and accurate pick-up of glass chips by the part placement nozzle. The feeder shoes are placed over the ends of the feeder stations with the end of feeder stations extending inside the feeder shoes against feeder shoe nose panels to assure accurate placement of the parts pick up jig on the "Y" axis. The parts pick up jig may also index against an inner or outer edge of the feeder station to assure accurate placement of parts pick up jig on the "X" axis. A bridge section extends between the feeder shoes and connects the two feeder shoes together. Formed on the upper surface of the bridge section are a series of recesses for receiving and aligning chips to be picked and placed during a calibration procedure.

Abstract: A method for calibrating a pick and place machine including picking a calibrated chip having a first calibration mark from a parts pick up jig with a placing head of the pick and place machine, placing the calibrated chip on a calibrated plate having a second calibration mark with the pick and place machine placing head, the calibrated plate being located on a pick and place machine assembly table and comparing the relative alignment of the first calibration mark and the second calibration mark.