Abstract: Systems and methods are provided for generating accurate current ratios from a current mirror including an array of output transistor and a corresponding array of switches. Each switch couples in series with its corresponding output transistor. A control logic circuit controls the switches to cancel mismatches for the output transistors.

Abstract: In one embodiment, a collector current driver is provided that controls the collector current for a bipolar transistor temperature transducer. The collector current driver is configured to use negative feedback to generate an emitter current for the bipolar transistor responsive to target current.

Abstract: Systems and methods are provided for generating accurate current ratios from a current mirror including an array of output transistor and a corresponding array of switches. Each switch couples in series with its corresponding output transistor. A control logic circuit controls the switches to cancel mismatches for the output transistors.

Abstract: In one embodiment, a collector current driver is provided that controls the collector current for a bipolar transistor temperature transducer. The collector current driver is configured to use negative feedback to generate an emitter current for the bipolar transistor responsive to target current.

Abstract: In one example, a method of tuning an oscillator of a phase-locked loop (PLL) circuit includes adjusting a coarse control signal to select one of a plurality of frequency tuning curves of the oscillator. The method includes adjusting a fine control signal to select a position on the selected frequency tuning curve. A frequency of the oscillator is determined by the coarse control signal and the fine control signal. The method includes attempting to detect a lock between a feedback signal and a reference signal. A frequency of the feedback signal is determined by the frequency of the oscillator. The method includes comparing the fine control signal to a reference value if the lock is detected. The method includes adjusting the coarse control signal to select a different one of the frequency tuning curves if the selected position on the selected frequency tuning curve is outside a desired tuning range.

Abstract: In one embodiment of the invention, a programmable logic device includes a plurality of programmable resources; non-volatile configuration memory adapted to store configuration data for configuring the plurality of programmable resources; a register adapted to load configuration data into the non-volatile configuration memory; and test circuitry coupled to the register. The test circuitry is adapted to configure a programmable resource with test data stored in the register rather than with configuration data stored in the non-volatile configuration memory. In another embodiment of the invention, the programmable logic device includes a buffer coupled between the configuration memory and a programmable resource, and the test circuitry includes a logic circuit coupled between the register, the configuration memory, and the buffer. The logic circuit is responsive to a test mode signal to route test data from the register to the buffer.

Abstract: A programmable logic device may comprise a plurality of programmable resources and non-volatile configuration memory to store configuration data by which to configure the programmable resources. Test override circuitry may determine a test mode and selectively override the configuration data stored in the non-volatile configuration memory during the test mode for configuring the programmable resources based at least in part on test configuration data other than the configuration data stored in the non-volatile memory. A buffer may be operable to drive a configuration select node for at least one of the programmable resources for designating a configuration therefore based on the configuration data of the non-volatile memory. The test override circuitry may comprise a pull-down circuit operable, when enabled dependent on the test configuration data, to drive the buffer with a high/low level capable of overriding a state of the non-volatile configuration memory.

Abstract: A CMOS Schmitt Trigger circuit design provides a relatively high speed device having a tight, substantially monotonic hysteresis characteristic which is substantially independent of fabrication process parameters and can be used with relatively wide power supply designs, including operating a relatively low Vcc. Tight trip point variation is maintained in conjunction with process, voltage, and temperature changes. The circuit is adaptable for forming an integrated circuit buffer element.