Abstract: A defect detection and imaging system is presented for performing microscopy and/or spectroscopy on a device under test. The defect detection system comprises a controller for toggling the state of a light source, which may allow for fast simultaneous high-speed inspection and high-resolution review imaging of the device under test by the same system and simultaneously deliver inspection, computer generated reconstructions or tomography, and defect review on sub second time-scales. The defect detection system further comprises a converter for converting X-ray images of the device under test into photoelectron contrast images to achieve nanometer scale measurement resolution in non-destructive and real-time fashion, to complement or replace destructive TEM. These photoelectron contrast images may be received by a detector to output an electronic format map or 3D/4D image that indicates one or more features of the device under test.

Abstract: A defect detection system comprising of an incoherent light source and a collimating light source attachment to produce spatially coherent light waves (e.g., X-rays) that are capable of deeply penetrating a device under test (e.g., a semiconductor). Changes in the spatial coherence of the light waves incident upon the device under test may be utilized to generate one or more electronic maps that indicate one or more physical gauges for length, area, or volume, one or more concentration of elements or distributions in space, and one or more defects within the device under test, such as, cracks, breaks, gaps, and/or air pockets within the device under test.

Abstract: A defect detection system comprising of an incoherent light source and a collimating light source attachment to produce spatially coherent light waves (e.g., X-rays) that are capable of deeply penetrating a device under test (e.g., a semiconductor). Changes in the spatial coherency of the light waves incident upon the device under test may be utilized to generate one or more electronic maps that indicate one or more defects within the device under test, such as, cracks, gaps, and/or air pockets within the device under test.

Abstract: A ground engagement tool, such as a universal coulter, with an integrated offset to facilitate multiple mounting configurations. In some embodiments, the ground engagement tool includes a polygonal shank, defining, for example, an octagonal or hexagonal cross-section. The polygonal shank enables rotational offset to be secured in discrete rotational orientations. A lower bracket is mounted to a spindle, providing an angular displacement range for angular deflection of the ground engagement tool. The spindle includes a key structure that complements the angular orientations of the polygonal shank so that the lower bracket can be compensated for the rotational offset. A rotational indexing plate enables selection of one of a plurality of angular displacement ranges. Retention rods may be implemented for setting a depth of the tool. A dirt deflector may also be provided, dimensioned to prevent spewing dirt from landing on adjacent plant rows and to prevent fouling in muddy conditions.

Abstract: A ground engagement tool, such as a universal coulter, with an integrated offset to facilitate multiple mounting configurations. In some embodiments, the ground engagement tool includes a polygonal shank, defining, for example, an octagonal or hexagonal cross-section. The polygonal shank enables rotational offset to be secured in discrete rotational orientations. A lower bracket is mounted to a spindle, providing an angular displacement range for angular deflection of the ground engagement tool. The spindle includes a key structure that complements the angular orientations of the polygonal shank so that the lower bracket can be compensated for the rotational offset. A rotational indexing plate enables selection of one of a plurality of angular displacement ranges. Retention rods may be implemented for setting a depth of the tool. A dirt deflector may also be provided, dimensioned to prevent spewing dirt from landing on adjacent plant rows and to prevent fouling in muddy conditions.

Abstract: The present invention is directed to rack-mounted punchdown panels providing enhanced access for establishing connections. The present invention is also directed to punchdown bases providing increased capacity for wire management.

Abstract: A double ring seal of unitary construction is made from a resilient deformable material. The ring seal comprises two coplanar sealing rings for use in sealing between two substantially planar surfaces, and means interconnecting the rings, such that an interspace volume is formed between the rings when the seal is in use.

Abstract: A heel attaching machine is provided with a shoe support particularly well suited for attaching stilletto-type heels by means of a plurality of nails and a staple driven into the rear portion of a heel seat and inclined toward the center of the heel.

Abstract: A pad box for cement attaching soles to differently shaped shoe bottoms comprises a forepart pad tiltably and vertically adjustable, a datum pad for supporting a shoe adjacent to its heel breast line, independent movable waist pads adjustable heightwise of the datum pad, a heel presser member mounted for movement heightwise and lengthwise of the shoe, and fluid pressure means for respectively operating the heel presser member and each of the waist pads. The arrangement and construction are such that the waist pads are fluid pressure actuated automatically to support the shoe bottom during pressing in accommodation of its lengthwise and widthwise configuration. Method aspects of the invention are also disclosed.