Patents by Inventor Trevor J. Tarsi

Trevor J. Tarsi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for continuity testing using a functional pattern
    Patent number: 7518392
    Abstract: Various systems and methods for device configuration are disclosed herein. For example, some embodiments of the present invention provide high speed pin continuity and pin-to-pin short tester circuits. Such circuits include a threshold driver, a test driver, and a comparator. An input of the threshold driver is electrically coupled to a voltage threshold, and an output of the threshold driver is electrically coupled to a test pin node via a current limiting resistor. An input of the test driver is electrically coupled to a drive data input, and an output of the test driver is electrically coupled to the test pin node. One input of the comparator is electrically coupled to the test pin node, and the other input of the comparator is electrically coupled to a threshold comparator input.
    Type: Grant
    Filed: August 2, 2006
    Date of Patent: April 14, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Gunvant T. Patel, Trevor J. Tarsi, Yun-Fu Wang, Anthony J. Lendino
  • Systems and Methods for Continuity Testing Using a Functional Pattern
    Publication number: 20080030217
    Abstract: Various systems and methods for device configuration are disclosed herein. For example, some embodiments of the present invention provide high speed pin continuity and pin-to-pin short tester circuits. Such circuits include a threshold driver, a test driver, and a comparator. An input of the threshold driver is electrically coupled to a voltage threshold, and an output of the threshold driver is electrically coupled to a test pin node via a current limiting resistor. An input of the test driver is electrically coupled to a drive data input, and an output of the test driver is electrically coupled to the test pin node. One input of the comparator is electrically coupled to the test pin node, and the other input of the comparator is electrically coupled to a threshold comparator input.
    Type: Application
    Filed: August 2, 2006
    Publication date: February 7, 2008
    Applicant: Texas Instruments Incorporated
    Inventors: Gunvant T. Patel, Trevor J. Tarsi, Yung-Fu Wang, Anthony J. Lendino