Patents by Inventor TRIPTI REGMI

TRIPTI REGMI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Controlled pulse generation methods and apparatuses for evaluating stiction in microelectromechanical systems devices
    Patent number: 10393618
    Abstract: Methods and apparatuses are provided for evaluating or testing stiction in Microelectromechanical Systems (MEMS) devices utilizing a mechanized shock pulse generation approach. In one embodiment, the method includes the step or process of loading a MEMS device, such as a multi-axis MEMS accelerometer, into a socket provided on a Device-Under-Test (DUT) board. After loading the MEMS device into the socket, a series of controlled shock pulses is generated and transmitted through the MEMS device utilizing a mechanized test apparatus. The mechanized test apparatus may, for example, repeatedly move the DUT board over a predefined motion path to generate the controlled shock pulses. In certain cases, transverse vibrations may also be directed through the tested MEMS device in conjunction with the shock pulses. An output of the MEMS device is then monitored to determine whether stiction of the MEMS device occurs during each of the series of controlled shock pulses.
    Type: Grant
    Filed: June 22, 2016
    Date of Patent: August 27, 2019
    Assignee: NXP USA, Inc.
    Inventors: Peter T. Jones, Arvind Salian, William D. McWhorter, Chad Krueger, John Shipman, Michael Naumann, Larry D. Metzler, Tripti Regmi
  • CONTROLLED PULSE GENERATION METHODS AND APPARATUSES FOR EVALUATING STICTION IN MICROELECTROMECHANICAL SYSTEMS DEVICES
    Publication number: 20170370799
    Abstract: Methods and apparatuses are provided for evaluating or testing stiction in Microelectromechanical Systems (MEMS) devices utilizing a mechanized shock pulse generation approach. In one embodiment, the method includes the step or process of loading a MEMS device, such as a multi-axis MEMS accelerometer, into a socket provided on a Device-Under-Test (DUT) board. After loading the MEMS device into the socket, a series of controlled shock pulses is generated and transmitted through the MEMS device utilizing a mechanized test apparatus. The mechanized test apparatus may, for example, repeatedly move the DUT board over a predefined motion path to generate the controlled shock pulses. In certain cases, transverse vibrations may also be directed through the tested MEMS device in conjunction with the shock pulses. An output of the MEMS device is then monitored to determine whether stiction of the MEMS device occurs during each of the series of controlled shock pulses.
    Type: Application
    Filed: June 22, 2016
    Publication date: December 28, 2017
    Applicant: FREESCALE SEMICONDUCTOR INC.
    Inventors: PETER T. JONES, ARVIND SALIAN, WILLIAM D. MCWHORTER, CHAD KRUEGER, JOHN SHIPMAN, MICHAEL NAUMANN, LARRY D. METZLER, TRIPTI REGMI