Patents by Inventor Troy E. Mackie

Troy E. Mackie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Authenticated debug access for field returns
    Patent number: 8332641
    Abstract: Under the direction of a first party, an integrated circuit (IC) device is configured to temporarily enable access to a debug interface of the IC device via authentication of the first party by a challenge/response process using a key of the IC device and a challenge value generated at the IC device. The first party then may conduct a software evaluation of the IC device via the debug interface. In response to failing to identify an issue with the IC device from the software evaluation, the first party can permanently enable open access to the debug interface while authenticated and provide the IC device to a second party. Under the direction of the second party, a hardware evaluation of the IC device is conducted via the debug interface that was permanently opened by the first party.
    Type: Grant
    Filed: January 30, 2009
    Date of Patent: December 11, 2012
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Lawrence L. Case, Asaf Ashkenazi, Ruchir Chhabra, Carlin R. Covey, David H. Hartley, Troy E. Mackie, Alistair N. Muir, Mark D. Redman, Thomas E. Tkacik, John J. Vaglica, Rodney D. Ziolkowski
  • AUTHENTICATED DEBUG ACCESS FOR FIELD RETURNS
    Publication number: 20100199077
    Abstract: Under the direction of a first party, an integrated circuit (IC) device is configured to temporarily enable access to a debug interface of the IC device via authentication of the first party by a challenge/response process using a key of the IC device and a challenge value generated at the IC device. The first party then may conduct a software evaluation of the IC device via the debug interface. In response to failing to identify an issue with the IC device from the software evaluation, the first party can permanently enable open access to the debug interface while authenticated and provide the IC device to a second party. Under the direction of the second party, a hardware evaluation of the IC device is conducted via the debug interface that was permanently opened by the first party.
    Type: Application
    Filed: January 30, 2009
    Publication date: August 5, 2010
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Lawrence L. Case, Asaf Ashkenazi, Ruchir Chhabra, Carlin R. Covey, David H. Hartley, Troy E. Mackie, Alistair N. Muir, Mark D. Redman, Thomas E. Tkacik, John J. Vaglica, Rodney D. Ziolkowski
  • Semiconductor device and method of making
    Patent number: 5734194
    Abstract: A semiconductor device (10) is formed in a semiconductor substrate (11) that acts as a collector region. A base region (12) is formed in the semiconductor substrate (11) and an emitter region (52) is formed such that it contacts at least a portion of the base region (12). A conductive layer (28) is used to provide electrical connection to the emitter region (52). The portion of the conductive layer (28) above the emitter region (52) is counter-doped to address the problems of an interfacial oxide layer (27) that exists between the emitter region (52) and the conductive layer (28).
    Type: Grant
    Filed: January 31, 1997
    Date of Patent: March 31, 1998
    Assignee: Motorola, Inc.
    Inventors: Paul W. Sanders, Troy E. Mackie, Julio C. Costa, John L. Freeman, Jr., Alan D. Wood