Patents by Inventor Trygve Ristroph
Trygve Ristroph has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9972480Abstract: An ion guide generates a radio frequency (RF) field to radially confine ions to an ion beam along a guide axis as the ions are transmitted through the ion guide. The effective potential of the RF field includes an alternating series of barriers and wells. Ions may be trapped in individual wells in mass-dependent order, with larger masses trapped closer to a guide exit than smaller masses. The RF field may be scanned so as to release the ions from the ion guide in mass-dependent order, with larger masses released before smaller masses. The operating conditions may be set such that ions over the entire mass range arrive at a desired downstream focal point simultaneously, for example at an accelerator of a time-of-flight analyzer.Type: GrantFiled: November 25, 2015Date of Patent: May 15, 2018Assignee: Agilent Technologies, Inc.Inventor: Trygve Ristroph
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Patent number: 9905410Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes a multi-channel ion detector to detect ions traveling in separate flight paths, spatially dispersed along a drift axis and/or a transverse axis, in a flight tube of a TOF analyzer. The ion beams may be dispersed by drift energy, deflection along the drift and/or transverse axis, ion mass, or a combination of two or more of the foregoing. The dispersion may be carried out before, at, or after an ion accelerator of the TOF analyzer. Ion packets may be accelerated into the flight tube at a multi-pulse firing rate. Tandem MS may be implemented on parallel ion beams simultaneously.Type: GrantFiled: December 4, 2015Date of Patent: February 27, 2018Assignee: Agilent Technologies, Inc.Inventors: Trygve Ristroph, Julia Zaks
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Patent number: 9627190Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes an ion dispersion device and a position-sensitive ion detector or an energy-sensitive ion detector to enable measurement of time of flight and kinetic energy of ions arriving at the detector. The measurements may be utilized to improve accuracy in calculating ion masses.Type: GrantFiled: March 27, 2015Date of Patent: April 18, 2017Assignee: Agilent Technologies, Inc.Inventors: Julia Zaks, Trygve Ristroph
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Publication number: 20160284531Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes an ion dispersion device and a position-sensitive ion detector or an energy-sensitive ion detector to enable measurement of time of flight and kinetic energy of ions arriving at the detector. The measurements may be utilized to improve accuracy in calculating ion masses.Type: ApplicationFiled: March 27, 2015Publication date: September 29, 2016Inventors: Julia Zaks, Trygve Ristroph
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Publication number: 20160225598Abstract: An ion guide generates a radio frequency (RF) field to radially confine ions to an ion beam along a guide axis as the ions are transmitted through the ion guide. The effective potential of the RF field includes an alternating series of barriers and wells. Ions may be trapped in individual wells in mass-dependent order, with larger masses trapped closer to a guide exit than smaller masses. The RF field may be scanned so as to release the ions from the ion guide in mass-dependent order, with larger masses released before smaller masses. The operating conditions may be set such that ions over the entire mass range arrive at a desired downstream focal point simultaneously, for example at an accelerator of a time-of-flight analyzer.Type: ApplicationFiled: November 25, 2015Publication date: August 4, 2016Inventor: Trygve Ristroph
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Publication number: 20160225602Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes a multi-channel ion detector to detect ions traveling in separate flight paths, spatially dispersed along a drift axis and/or a transverse axis, in a flight tube of a TOF analyzer. The ion beams may be dispersed by drift energy, deflection along the drift and/or transverse axis, ion mass, or a combination of two or more of the foregoing. The dispersion may be carried out before, at, or after an ion accelerator of the TOF analyzer. Ion packets may be accelerated into the flight tube at a multi-pulse firing rate. Tandem MS may be implemented on parallel ion beams simultaneously.Type: ApplicationFiled: December 4, 2015Publication date: August 4, 2016Inventors: Trygve Ristroph, Julia Zaks
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Patent number: 9105454Abstract: An electron capture dissociation (ECD) apparatus includes a plasma source for generating plasma. Analyte ions are exposed to the plasma in an ECD interaction region, either inside or outside the plasma source. The apparatus may include one or more devices for refining the plasma in preparation for interaction with the analyte ions. Refining may entail removing unwanted species from the plasma, such as photons, metastable particles, neutral particles, and/or high-energy electrons unsuitable for ECD, and/or controlling a density of low-energy electrons in the plasma.Type: GrantFiled: September 11, 2014Date of Patent: August 11, 2015Assignee: Agilent Technologies, Inc.Inventors: Trygve Ristroph, Mark Denning, Kenneth R. Newton, Guthrie Partridge
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Patent number: 9053915Abstract: Ion guides for use in mass spectrometry (MS) systems are described. The ion guides are configured to provide a reflective electrodynamic field and a direct current (DC or static) electric field to provide ion beams that are more spatially confined with a comparatively large mass range. Some ion guides are provided between the ion source and the first stage vacuum chamber of the MS system.Type: GrantFiled: September 25, 2012Date of Patent: June 9, 2015Assignee: Agilent Technologies, Inc.Inventors: Trygve Ristroph, Gershon Perelman
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Publication number: 20150122985Abstract: An electron capture dissociation (ECD) apparatus includes a plasma source for generating plasma. Analyte ions are exposed to the plasma in an ECD interaction region, either inside or outside the plasma source. The apparatus may include one or more devices for refining the plasma in preparation for interaction with the analyte ions. Refining may entail removing unwanted species from the plasma, such as photons, metastable particles, neutral particles, and/or high-energy electrons unsuitable for ECD, and/or controlling a density of low-energy electrons in the plasma.Type: ApplicationFiled: September 11, 2014Publication date: May 7, 2015Inventors: Trygve Ristroph, Mark Denning, Kenneth R. Newton, Guthrie Partridge
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Patent number: 8859961Abstract: Ion guides for use in mass spectrometry (MS) systems are described. The ion guides are configured to provide a reflective electrodynamic field and a direct current (DC or static) electric field to provide ion beams that are more spatially confined with a comparatively large mass range.Type: GrantFiled: January 6, 2012Date of Patent: October 14, 2014Assignee: Agilent Technologies, Inc.Inventors: Gershon Perelman, Trygve Ristroph
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Publication number: 20140084156Abstract: Ion guides for use in mass spectrometry (MS) systems are described. The ion guides are configured to provide a reflective electrodynamic field and a direct current (DC or static) electric field to provide ion beams that are more spatially confined with a comparatively large mass range. Some ion guides are provided between the ion source and the first stage vacuum chamber of the MS system.Type: ApplicationFiled: September 25, 2012Publication date: March 27, 2014Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Trygve RISTROPH, Gershon PERELMAN
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Publication number: 20130175440Abstract: Ion guides for use in mass spectrometry (MS) systems are described. The ion guides are configured to provide a reflective electrodynamic field and a direct current (DC or static) electric field to provide ion beams that are more spatially confined with a comparatively large mass range.Type: ApplicationFiled: January 6, 2012Publication date: July 11, 2013Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Gershon PERELMAN, Trygve RISTROPH
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Patent number: 8431887Abstract: A mass analyzer comprises a pair of planar electrode structures. The electrode structures are disposed opposite to each other, parallel to each other, and axially offset from each other. The electrode structures are configured to generate, in response to an applied voltage, a cylindrically-symmetric, annular electric field comprising an annular radially focusing central lens region surrounding an axis of symmetry, and an annular mirror region surrounding the annular radially focusing central lens region.Type: GrantFiled: January 31, 2011Date of Patent: April 30, 2013Assignee: Agilent Technologies, Inc.Inventors: Curt A. Flory, Trygve Ristroph
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Patent number: 8330099Abstract: A mass analyzer comprises a pair of planar electrode structures. The electrode structures are disposed opposite one another, parallel to one another, and axially offset from one another. One of the pair of planar electrodes comprises an opening. The mass analyzer comprises an ion mirror disposed between the pair of planar electrodes. A mass spectrometer and a mass spectrometry method are also described.Type: GrantFiled: March 30, 2011Date of Patent: December 11, 2012Assignee: Agilent Technologies, Inc.Inventors: Curt A. Flory, Trygve Ristroph
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Publication number: 20120193524Abstract: A mass analyzer comprises a pair of planar electrode structures. The electrode structures are disposed opposite one another, parallel to one another, and axially offset from one another. One of the pair of planar electrodes comprises an opening. The mass analyzer comprises an ion mirror disposed between the pair of planar electrodes. A mass spectrometer and a mass spectrometry method are also described.Type: ApplicationFiled: March 30, 2011Publication date: August 2, 2012Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Curt A. FLORY, Trygve RISTROPH
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Publication number: 20110180702Abstract: A mass analyzer comprises a pair of planar electrode structures. The electrode structures are disposed opposite to each other, parallel to each other, and axially offset from each other. The electrode structures are configured to generate, in response to an applied voltage, a cylindrically-symmetric, annular electric field comprising an annular radially focusing central lens region surrounding an axis of symmetry, and an annular mirror region surrounding the annular radially focusing central lens region.Type: ApplicationFiled: January 31, 2011Publication date: July 28, 2011Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Curt A. FLORY, Trygve RISTROPH
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Publication number: 20110168880Abstract: A mass spectrometer includes: an accelerator for receiving ions travelling in a drift direction and accelerating the ions in an acceleration direction orthogonal to the drift direction; a detector downstream of the accelerator with respect to the drift direction; and an ion mirror assembly intermediate the accelerator and the detector. The ion mirror assembly includes at least a first ion mirror and a second ion mirror spaced apart from each other in the acceleration direction. The accelerator, detector, and ion mirror assembly provide a folded ion path between the accelerator and the detector for separating the ions according to their mass-to-charge ratio so that a flight time of the ions is substantially independent of ion energy. The first and second ion mirrors each apply an electrostatic potential to the ions that is curved in both the drift direction and a lateral direction orthogonal to both the drift and acceleration directions.Type: ApplicationFiled: January 13, 2010Publication date: July 14, 2011Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Trygve RISTROPH, Curt Alan FLORY
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Patent number: 7919748Abstract: The mass spectrometer includes a mass analyzer having a pair of planar electrode structures. The electrode structures are disposed opposite one another, parallel to one another, and axially offset from one another, and are structured to generate, in response to a common pattern of voltages applied to them, a cylindrically-symmetric, annular electric field surrounding a cylindrical central region. The electric field includes an annular axially focusing lens region surrounding the central region, and an annular mirror region surrounding the lens region. Ions injected tangentially in the central region towards the electric field reach an ion detector after executing a number of ellipse-like orbits, which enables a long flight path to be accommodated within a small evacuated space.Type: GrantFiled: March 31, 2009Date of Patent: April 5, 2011Assignee: Agilent Technologies, Inc.Inventors: Curt A Flory, Trygve Ristroph
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Publication number: 20100243886Abstract: The mass spectrometer includes a mass analyzer having a pair of planar electrode structures. The electrode structures are disposed opposite one another, parallel to one another, and axially offset from one another, and are structured to generate, in response to a common pattern of voltages applied to them, a cylindrically-symmetric, annular electric field surrounding a cylindrical central region. The electric field includes an annular axially focusing lens region surrounding the central region, and an annular mirror region surrounding the lens region. Ions injected tangentially in the central region towards the electric field reach an ion detector after executing a number of ellipse-like orbits, which enables a long flight path to be accommodated within a small evacuated space.Type: ApplicationFiled: March 31, 2009Publication date: September 30, 2010Inventors: Curt A. Flory, Trygve Ristroph