Abstract: A lifting device is provided. The lifting device includes a stationary member, a lifting member, positioning bases, reels, and springs. The lifting member is slidably coupled to the stationary member. The lifting member is fixed to a back portion of the display. The positioning bases are disposed on the stationary member and the lifting member. The reels are pivoted on the positioning bases. The springs are wound around the reels and connected to the other of the stationary member and the lifting member relative to the positioning bases. When the display or the lifting member is subjected to an applied force toward a sliding direction, the lifting member slides toward the sliding direction relative to the stationary member. The springs stretched by the lifting member generate an elastic force, so that the lifting member and the display no longer subjected to a force stay at a height position after sliding.

Abstract: A circuit board detection device includes a base, a stage assembly, a first gantry support, and a first probe assembly. The stage assembly is arranged on the base and includes a linear drive module, a rotary motor, and a platform. The platform is configured to carry a circuit board and can be driven by the linear drive module to move along a first axial direction. The platform can also be driven by the rotary motor to rotate relative to a first rotation axis. The first gantry support is fixed on the base and includes a first beam. The first beam extends along a second axial direction perpendicular to the first axial direction to span over the linear drive module, and includes a first probe guide rail. The first probe assembly is arranged on the first probe guide rail to be movable along the second axial direction.

Abstract: A lifting device of a display, is provided. The lifting device includes a stationary member, a lifting member, and an elastic module. The stationary member is suitable for being fixed to a vertical plane. The lifting member is slidably connected to the stationary member. The lifting member is suitable for being fixed to a back portion of the display. The lifting member is suitable for sliding relative to the stationary member between a first position and a second position lower than the first position. The elastic module is coupled between the stationary member and the lifting member. The elastic module is suitable for exerting a pulling force opposite to a gravity direction on the lifting member.

Abstract: A lifting device is provided. The lifting device includes a stationary member, a lifting member, positioning bases, reels, and springs. The lifting member is slidably coupled to the stationary member. The lifting member is fixed to a back portion of the display. The positioning bases are disposed on the stationary member and the lifting member. The reels are pivoted on the positioning bases. The springs are wound around the reels and connected to the other of the stationary member and the lifting member relative to the positioning bases. When the display or the lifting member is subjected to an applied force toward a sliding direction, the lifting member slides toward the sliding direction relative to the stationary member. The springs stretched by the lifting member generate an elastic force, so that the lifting member and the display no longer subjected to a force stay at a height position after sliding.

Abstract: A method of reversing aquifer parameter with skin effect is used for reversing an aquifer parameter of a monitoring well and a surrounding area thereof. The method includes steps of: performing a slug test on the monitoring well, and measuring a first water level change of the monitoring well by a water level meter; setting a parameter assembly having a plurality of hypothetical aquifer parameters; converting the hypothetical aquifer parameters through a programming language, and then respectively calculating a plurality of second water level changes; respectively calculating a plurality of function values through an objective function according to the first water level change and the second water level changes, and selecting one hypothetical aquifer parameter corresponding to one function value that meets a convergence condition from the function values; taking the hypothetical aquifer parameter that meets the convergence condition as the aquifer parameter.

Abstract: A method for automatic inline detection and wafer disposition includes the following steps. An exposure process is performed to wafers in an exposure apparatus. A virtual inspection is performed based on log files of the exposure process. A wafer automatic disposition is performed according to a result of the virtual inspection. An automatic inline detection and wafer disposition system includes a first computer system coupled to an exposure apparatus and a second computer system coupled to the first computer system. The exposure apparatus is configured to perform an exposure process to wafers, and the first computer system is configured to perform a virtual inspection based on log files of the exposure process. The second computer system is configured to receive a result of the virtual inspection and perform a wafer automatic disposition according to the result of the virtual inspection.

Abstract: A method for automatic inline detection and wafer disposition includes the following steps. An exposure process is performed to wafers in an exposure apparatus. A virtual inspection is performed based on log files of the exposure process. A wafer automatic disposition is performed according to a result of the virtual inspection. An automatic inline detection and wafer disposition system includes a first computer system coupled to an exposure apparatus and a second computer system coupled to the first computer system. The exposure apparatus is configured to perform an exposure process to wafers, and the first computer system is configured to perform a virtual inspection based on log files of the exposure process. The second computer system is configured to receive a result of the virtual inspection and perform a wafer automatic disposition according to the result of the virtual inspection.

Abstract: In a computing resource environment including at least two different resource name spaces, a method for generating a fully-qualified name for a resource based on a context-based name of that resource and a usage context is disclosed. Method steps include receiving the resource's name schema, its context-based name, and usage context; comparing an entry in the schema and an entry in the context-based name and identifying schema monikers missing from the context-based name. For a missing moniker, determining whether it is an attribute space (aspace) moniker. If it is an aspace moniker, adding it to a full name that includes the context-based name. If it is not an aspace moniker, determining the aspace associated with the missing moniker; searching the usage context for an association between the missing moniker, its aspace, and a value assigned to the missing moniker; and appending the searched-for items to the full name.

Abstract: An ion source apparatus has a body, a heat dissipating base, at least two supporting shafts, a guiding block, and a shunt. The body has a holding chamber formed inside the body. The heat dissipating base is located in the holding chamber of the body. The at least two supporting shafts are mounted through the heat dissipating base. The guiding block is mounted on the at least two supporting shafts, and is a hollow circular block. The shunt is located at a center of a top surface of the heat dissipating base, and is located below the mounting hole of the guiding block.

Abstract: In a computing resource environment including at least two different resource name spaces, a method for generating a fully-qualified name for a resource based on a context-based name of that resource and a usage context is disclosed. Method steps include receiving the resource's name schema, its context-based name, and usage context; comparing an entry in the schema and an entry in the context-based name and identifying schema monikers missing from the context-based name. For a missing moniker, determining whether it is an attribute space (aspace) moniker. If it is an aspace moniker, adding it to a full name that includes the context-based name. If it is not an aspace moniker, determining the aspace associated with the missing moniker; searching the usage context for an association between the missing moniker, its aspace, and a value assigned to the missing moniker; and appending the searched-for items to the full name.

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

Abstract: Multiple scheduler verticals can allocate tasks to resources that are shared by the scheduler verticals. Information regarding a state of each resource may be stored in memory accessible by the multiple scheduler verticals, and a processor updates the information. The scheduler verticals schedule events to be performed by any of the resources, and submit updates to reflect the scheduled events in the information. In the event of conflicting events, an update corresponding to only one of the conflicting events is committed. Moreover, disruptions may be preplanned and scheduled so as to minimize impact on scheduled tasks.

Abstract: A system and method with the following features is disclosed: receiving a partial name of a resource having an attribute moniker and attribute value; receiving a context associated with an attribute space moniker, an attribute moniker and an attribute value; receiving a schema associated with a set that includes an attribute space moniker and an attribute moniker; identifying a missing moniker that is present in the set but not the partial name; adding a missing moniker that is an attribute space moniker to the partial name; when a missing moniker is not an attribute space moniker, identifying a context where the attribute moniker is associated with the missing moniker and an attribute space moniker is present in the partial name or set; adding the context's attribute moniker and attribute value to the partial name; and returning the partial name with the added monikers and attribute values as the full name.

Abstract: A testing system includes a test machine, a plurality of probe sets, a data input device, a controller, a memory, and a data output device. The test machine has a platform for a DUT to be placed thereon, and a test arm which is movable relative to the platform. The probe sets are provided on the test machine with at least one probe set provided on the test arm to contact the DUT. The data input device is used to input information about the DUT. The controller is electrically connected to the test arm, the probe set on the test arm, and the data input device to move the test arm to a predetermined position according to the inputted information, and to make the probe set contact the DUT for electrical test. The memory saves electrical test result, which is outputted by the data output device.

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

Abstract: A system is provided that includes a memory and one or more processors in communication with the memory. The one or more processors are configured to identify a set of targets and select a first value corresponding to a number of targets from the set of targets that can be concurrently disrupted. A second value is determined that is related to a number of disruptions actually occurring. A disruption request is received for a target of the set of targets. Thereafter, the first value is compared to the second value. Based on the comparison of the first and second values, it is determined whether to resist a requested disruption. If it is determined that the disruption is to be resisted, the requested disruption is resisted. If it is determined that the disruption is not to be resisted, at least one of the first value and the second value are adjusted.