Patents by Inventor TSE-HUNG CHEN

TSE-HUNG CHEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240120910
    Abstract: An all-digital duty cycle corrector and a method for correcting a duty cycle of an output clock are provided. The all-digital duty cycle corrector includes a duty cycle adjustment circuit, an asynchronous sampler, a counter and a correction control circuit. The duty cycle adjustment circuit performs duty cycle adjustment on an input clock to generate the output clock according to a digital control code. The asynchronous sampler performs asynchronous sampling on the output clock to generate N sampling results at N time points, respectively. The counter counts a number of first logic values among the N sampling results to generate a counting result. The correction control circuit compares the counting result with a reference value to generate a comparison result, and selectively adjusts the digital control code according to the comparison result, in order to correct the duty cycle of the output clock.
    Type: Application
    Filed: August 22, 2023
    Publication date: April 11, 2024
    Applicant: Realtek Semiconductor Corp.
    Inventor: Tse-Hung Chen
  • Patent number: 10698018
    Abstract: A noise detection circuit includes an analog-to-digital conversion (ADC) circuit and a noise event recognition circuit. The ADC circuit is configured to convert an analog signal outputted from a device under test (DUT) into a sequence of digital codes. The noise event recognition circuit, coupled to the ADC circuit, is configured to determine a noise count of the sequence of digital codes, and refer to the noise count to determine if a noise event occurs in the DUT. The noise count indicates a number of times a change in code values between two successive digital codes exceeds a predetermined value.
    Type: Grant
    Filed: July 13, 2018
    Date of Patent: June 30, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Chung-Chieh Yang, Tse-Hung Chen
  • Publication number: 20200018784
    Abstract: A noise detection circuit includes an analog-to-digital conversion (ADC) circuit and a noise event recognition circuit. The ADC circuit is configured to convert an analog signal outputted from a device under test (DUT) into a sequence of digital codes. The noise event recognition circuit, coupled to the ADC circuit, is configured to determine a noise count of the sequence of digital codes, and refer to the noise count to determine if a noise event occurs in the DUT. The noise count indicates a number of times a change in code values between two successive digital codes exceeds a predetermined value.
    Type: Application
    Filed: July 13, 2018
    Publication date: January 16, 2020
    Inventors: CHUNG-CHIEH YANG, TSE-HUNG CHEN