Abstract: An electronic component handling apparatus, for handling a DUT having a temperature detection circuit and pressing the DUT against a socket electrically connected to a tester testing the DUT, includes: a temperature adjuster adjusting a temperature of the DUT; a first calculator calculating the temperature of the DUT based on a detection result of the temperature detection circuit; a temperature controller controlling the temperature adjuster; and a first receiver receiving a first signal output from the tester, a temperature control including a first temperature control based on the temperature of the DUT calculated by the first calculator and a second temperature control, and the temperature controller switching the temperature control of the DUT from the first temperature control to the second temperature control when the first receiver receives the first signal after the temperature controller starts the first temperature control.

Abstract: [Object] Provided is an electronic component handling apparatus capable of controlling a DUT temperature within an appropriate range even in a DUT in which a sudden temperature change occurs under test.

Abstract: Automated test equipment can generate feed-forward temperature profile information for a device under test (DUT), where the temperature data is determined from measurements performed during execution of a test pattern on the DUT, and can synchronize the temperature data and the cycles of the test pattern.