Patents by Inventor Tse-Tsun CHIU

Tse-Tsun CHIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Single wavelength reflection for leadframe brightness measurement
    Patent number: 11421981
    Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.
    Type: Grant
    Filed: September 10, 2019
    Date of Patent: August 23, 2022
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Hung-Yu Chou, Chien-Hao Wang, Tse-Tsun Chiu, Fu-Kang Lee, Liang-Kang Su
  • SINGLE WAVELENGTH REFLECTION FOR LEADFRAME BRIGHTNESS MEASUREMENT
    Publication number: 20200003548
    Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.
    Type: Application
    Filed: September 10, 2019
    Publication date: January 2, 2020
    Inventors: Hung-Yu Chou, Chien-Hao Wang, Tse-Tsun Chiu, Fu-Kang Lee, Liang-Kang Su
  • Single wavelength reflection for leadframe brightness measurement
    Patent number: 10429174
    Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: October 1, 2019
    Assignee: Texas Instruments Incorporated
    Inventors: Hung-Yu Chou, Chien-Hao Wang, Tse-Tsun Chiu, Fu-Kang Lee, Liang-Kang Su
  • SINGLE WAVELENGTH REFLECTION FOR LEADFRAME BRIGHTNESS MEASUREMENT
    Publication number: 20190186897
    Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.
    Type: Application
    Filed: December 20, 2017
    Publication date: June 20, 2019
    Inventors: Hung-Yu CHOU, Chien-Hao WANG, Tse-Tsun CHIU, Fu-Kang LEE, Liang-Kang SU