Abstract: A polyhedron device for sensing light rays and detecting incident directions of the light rays includes a polyhedron mounting seat. The polyhedron mounting seat includes a bottom surface, a top surface, and side surfaces, wherein the bottom surface is opposite to the top surface. The side surfaces, located between the top surface and the bottom surface and inclined to the bottom surface, face toward different directions. The side surfaces are respectively provided with first light sensors. The top surface is provided with at least one second light sensor. The specific design of the polyhedron mounting seat is provided to the sensor for detecting a light ray at a larger angle, thereby measuring the finer data.

Abstract: A polyhedron device for sensing light rays and detecting incident directions of the light rays includes a polyhedron mounting seat. The polyhedron mounting seat includes a bottom surface, a top surface, and side surfaces, wherein the bottom surface is opposite to the top surface. The side surfaces, located between the top surface and the bottom surface and inclined to the bottom surface, face toward different directions. The side surfaces are respectively provided with first light sensors. The top surface is provided with at least one second light sensor. The specific design of the polyhedron mounting seat is provided to the sensor for detecting a light ray at a larger angle, thereby measuring the finer data.

Abstract: A method includes providing a test structure above a tester, wherein the test structure includes a load board including a first and second connectors, a first socket electrically connected to the first and second connectors of the load board, and a second socket electrically isolated from the first connector of the load board and electrically connected to the second connector of the load board. A first and second semiconductor dies are disposed respectively on the first and second sockets. A test signal to the first semiconductor die and the second semiconductor die through the second connector of the load board are simultaneously applied by using the tester. A first signal of the first semiconductor die through the first connector is read by using the tester. Whether the first semiconductor die is disturbed by the second semiconductor die is determined according to the first signal.

Abstract: A device and a method for detecting a light irradiating angle are disclosed. The device, used to detect the incident direction of a light ray, includes a solar sensor and a processor. The sensing unit of the solar sensor has sensing areas. The sensing areas correspondingly generate sensing signals based on the intensity of the light ray. A mask covers the sensing unit and has an X-shaped light transmitting portion. The light ray transmits the X-shaped light transmitting portion to form an X-axis light ray and a Y-axis light ray. The X-axis light ray intersects the Y-axis light ray. The X-axis light ray and the Y-axis light ray fall on the sensing area. The processor, coupled to the sensing unit, receives the sensing signals and determines information of the incident direction according to the sensing signals.

Abstract: A method includes providing a test structure above a tester, wherein the test structure includes a load board including a first and second connectors, a first socket electrically connected to the first and second connectors of the load board, and a second socket electrically isolated from the first connector of the load board and electrically connected to the second connector of the load board. A first and second semiconductor dies are disposed respectively on the first and second sockets. A test signal to the first semiconductor die and the second semiconductor die through the second connector of the load board are simultaneously applied by using the tester. A first signal of the first semiconductor die through the first connector is read by using the tester. Whether the first semiconductor die is disturbed by the second semiconductor die is determined according to the first signal.