Abstract: The invention discloses a method for inspecting an electronic device to reduce the consumption of testers' labor and time and testers' erroneous or careless judgment, and increase the test efficiency and reliability. Furthermore, the method of the invention can help to maintain or modify the test standard immediately and feedback the condition of the electronic device to the production line. The method of the invention includes the steps of: (A) storing a plurality of standard parameters related to the electronic device; (B) measuring a plurality of inspecting parameters, wherein each inspecting parameter corresponds to one of the standard parameters; (C) comparing each of the inspecting parameters with the corresponded standard parameter and setting a processing status of the electronic device according to a first criterion; and (D) receiving the comparison results of step (C) and generating an adjusting information according to the comparison results.