Patents by Inventor Tsingfa Li

Tsingfa Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12725674
    Abstract: Programming techniques disclosed herein may be used to recover from potential plane and/or die level failures. The memory system may detect evidence of a plane or die level failure that impacts memory operations performed in a target region of the blocks if a first programming technique is used in the target region. For example, the memory system may note that a significant number of blocks have memory operation failures in the target region. The storage system switches to a second programming technique for programming the target region responsive to detecting evidence of a plane or die level failure. The blocks may be tested for a reliability criterion after programming using the second programming technique in the target region of the block. The second programming technique may overcome the plane or die level failure such that blocks may continue to be used with the second programming technique.
    Type: Grant
    Filed: September 16, 2024
    Date of Patent: September 1, 2026
    Assignee: Sandisk Technologies, Inc.
    Inventors: Xuan Tian, Liang Li, Tsingfa Li, Jiahui Yuan
  • Publication number: 20260080964
    Abstract: Programming techniques disclosed herein may be used to recover from potential plane and/or die level failures. The memory system may detect evidence of a plane or die level failure that impacts memory operations performed in a target region of the blocks if a first programming technique is used in the target region. For example, the memory system may note that a significant number of blocks have memory operation failures in the target region. The storage system switches to a second programming technique for programming the target region responsive to detecting evidence of a plane or die level failure. The blocks may be tested for a reliability criterion after programming using the second programming technique in the target region of the block. The second programming technique may overcome the plane or die level failure such that blocks may continue to be used with the second programming technique.
    Type: Application
    Filed: September 16, 2024
    Publication date: March 19, 2026
    Applicant: Sandisk Technologies, Inc.
    Inventors: Xuan Tian, Liang Li, Tsingfa Li, Jiahui Yuan