Patents by Inventor Tsukasa Shishika
Tsukasa Shishika has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11776800Abstract: A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.Type: GrantFiled: June 20, 2019Date of Patent: October 3, 2023Assignee: Hitachi High-Tech CorporationInventors: Yasuaki Takada, Shun Kumano, Masuyuki Sugiyama, Tsukasa Shishika, Shinji Yoshioka, Akimasa Osaka
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Publication number: 20220412848Abstract: Provided is a sample-analyzing apparatus that can reduce a difference in the flow rate of a vaporized sample generated by heating a piece of paper to which the sample has adhered. The sample-analyzing apparatus includes a sample introduction unit that generates and suctions a vaporized sample obtained by vaporizing a sample adhered to a piece of paper by heating the piece of paper, and an analysis unit that analyzes the suctioned vaporized sample. The sample introduction unit has a heating surface that comes into contact with the piece of paper and heats the piece of paper, a plurality of flow paths through which the vaporized sample flows are provided in the heating surface, and a suction opening through which the vaporized sample is suctioned is provided in each of the flow paths.Type: ApplicationFiled: November 5, 2019Publication date: December 29, 2022Inventors: Akimasa Osaka, Tsukasa Shishika, Shinji Yoshioka
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Publication number: 20220359182Abstract: A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.Type: ApplicationFiled: June 20, 2019Publication date: November 10, 2022Applicant: Hitachi High-Tech CorporationInventors: Yasuaki TAKADA, Shun KUMANO, Masuyuki SUGIYAMA, Tsukasa SHISHIKA, Shinji YOSHIOKA, Akimasa OSAKA
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Publication number: 20190317061Abstract: The present invention provides a column exchange device for simpler column exchange and a column suitable for this column exchange device. A column exchange mechanism according to the present invention is provided with a column having inward-facing threads at both ends thereof and a first joining part and second joining part for fixing the ends of the column. The column exchange mechanism is characterized in that the first joining part and second joining part have screw parts that are joined to the ends of the column and the direction in which the screw of the screw part of the first joining part is to be turned to tighten the same and the direction in which the screw of the screw part of the second joining part is to be turned to tighten the same are opposite directions.Type: ApplicationFiled: December 22, 2016Publication date: October 17, 2019Inventors: Hiroaki NAKAGAWA, Taku SAKAZUME, Shinya ITO, Tsukasa SHISHIKA
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Publication number: 20180174811Abstract: The mass spectrometry device includes: a sample container for containing a sample; a heater for heating the sample container; an ion source for ionizing the sample vaporized in the sample container by being heated by the heater; an introduction unit that includes a valve, and that introduces the vaporized sample in the sample container into the ion source; a mass spectrometry unit that includes a vacuum chamber, and to which ions generated in the ion source are introduced; a vacuometer for measuring a degree of vacuum of the vacuum chamber; and a controller that controls the valve to intermittently introduce the vaporized sample in the sample container into the ion source. The controller controls an open time of the valve according to the degree of vacuum of the vacuum chamber that varies as a result of the ions being intermittently introduced into the mass spectrometry unit.Type: ApplicationFiled: December 13, 2017Publication date: June 21, 2018Inventors: Tsukasa SHISHIKA, Akihito KANEKO
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Patent number: 9105453Abstract: A portable mass spectrometer that is carried to a sampling site to conduct analysis incorporates measures against erroneous operation. To prevent erroneous operation, when a measurement sample cannot be accurately analyzed because of contamination in the measurement sample, a criterion for aborting the sample measurement is provided and mass spectrometer control maintenance is performed. When urine is measured, the mass spectrometer detects the substances contained in the urine and automatically determines whether the sample is urine. The mass spectrometer then automatically selects an analysis condition specific to urine samples to make a measurement. Also with respect to sweat and saliva, the mass spectrometer similarly selects a specific analysis condition.Type: GrantFiled: April 22, 2013Date of Patent: August 11, 2015Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Tsukasa Shishika, Hidetoshi Morokuma, Masuyoshi Yamada, Hiroyuki Inoue
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Publication number: 20150108341Abstract: A portable mass spectrometer that is carried to a sampling site to conduct analysis incorporates measures against erroneous operation. To prevent erroneous operation, when a measurement sample cannot be accurately analyzed because of contamination in the measurement sample, a criterion for aborting the sample measurement is provided and mass spectrometer control maintenance is performed. When urine is measured, the mass spectrometer detects the substances contained in the urine and automatically determines whether the sample is urine. The mass spectrometer then automatically selects an analysis condition specific to urine samples to make a measurement. Also with respect to sweat and saliva, the mass spectrometer similarly selects a specific analysis condition.Type: ApplicationFiled: April 22, 2013Publication date: April 23, 2015Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Tsukasa Shishika, Hidetoshi Morokuma, Masuyoshi Yamada, Hiroyuki Inoue
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Patent number: 8633841Abstract: A signal processing device includes amplifiers that are capable of amplifying detected signals using amplification factors that are different from each other; A/D converters that sample plural signals amplified by the amplifiers using the different amplification factors and output from the amplifiers; calculators that perform, on the basis of the amplification factors of the plural amplifiers, calculation on plural data pieces converted by the A/D converters; and a selector that selects one or more of output data pieces from among plural data pieces output from the calculators.Type: GrantFiled: August 30, 2010Date of Patent: January 21, 2014Assignee: Hitachi High-Technologies CorporationInventors: Fujio Oonishi, Yasushi Terui, Tsukasa Shishika
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Patent number: 8274044Abstract: Provided is a mass spectroscope employing electron capture dissociation wherein the peak number of detectable fragment ions is increased. The mass spectroscope comprises an ion source (2) for generating ions from a sample, an ion trap (3) for storing and selecting ions, an ion dissociation section (4) performing electron capture dissociation on ions, and a time-of-flight mass spectrometry section (7) performing mass spectrometry on ions, wherein the reaction time of electron capture dissociation is variable depending on the valence of ions subjected to mass spectrometry.Type: GrantFiled: June 18, 2009Date of Patent: September 25, 2012Assignee: Hitachi High-Technologies CorporationInventors: Shinji Yoshioka, Akihiro Takeda, Tsukasa Shishika
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Publication number: 20120154190Abstract: A signal processing device includes amplifiers that are capable of amplifying detected signals using amplification factors that are different from each other; A/D converters that sample plural signals amplified by the amplifiers using the different amplification factors and output from the amplifiers; calculators that perform, on the basis of the amplification factors of the plural amplifiers, calculation on plural data pieces converted by the A/D converters; and a selector that selects one or more of output data pieces from among plural data pieces output from the calculators.Type: ApplicationFiled: August 30, 2010Publication date: June 21, 2012Inventors: Fujio Oonishi, Yasushi Terui, Tsukasa Shishika
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Patent number: 8030611Abstract: An object of the present invention is to provide a mass spectrometer, a method of mass spectrometry, and a program for mass spectrometry for narrowing the range in which the mass-to-charge ratio is scanned without the ion peak of the fragment ion becoming out of the range. In order to achieve the above object, a mass spectrometer including a control unit, a display unit provided with an user interface, an ionization chamber, a dissociation chamber, a mass separator, and a detector is provided.Type: GrantFiled: February 26, 2009Date of Patent: October 4, 2011Assignee: Hitachi High-Technologies CorporationInventors: Yoshinori Kishi, Tsukasa Shishika, Takuya Saeki
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Patent number: 7999222Abstract: A time-of-flight mass spectrometer includes a detector and is adapted to measure the time it takes for an accelerated ion to reach the detector and thereby measure the mass of the ion. The time-of-flight mass spectrometer scans a voltage applied to an ion incident side surface of the detector in accordance with a mass to be measured. An electrode is provided between the detector and a space in which an ion flies. The time-of-flight mass spectrometer is capable of measuring ions of a wide range of masses with high detection efficiency by scanning a voltage applied to the electrode.Type: GrantFiled: May 29, 2009Date of Patent: August 16, 2011Assignee: Hitachi High-Technologies CorporationInventors: Tsukasa Shishika, Yasushi Terui
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Publication number: 20110192970Abstract: For the achievement of data transfer time reduction, removal of noise data, and analytical efficiency improvement in an ADC data processing function of a time-of-flight mass spectrometer, the mass spectrometer comprises a data acquisition circuit including: an ND converter; a signal intensity addition memory that stores data of ion signals such as a time range and the number of measurements and performs an addition process; a voltage value frequency addition memory that performs an addition process of frequencies of voltage values of the predetermined time range and the number of measurements and stores addition results; a threshold level computation circuit that computes a predetermined threshold level from the results in the memory; a compression memory that extracts only data exceeding the threshold level from the data in the signal intensity addition memory; and a counter that controls a measurement time for data acquisition and the operation of each circuit.Type: ApplicationFiled: April 19, 2011Publication date: August 11, 2011Inventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Publication number: 20110121174Abstract: Provided is a mass spectroscope employing electron capture dissociation wherein the peak number of detectable fragment ions is increased. The mass spectroscope comprises an ion source (2) for generating ions from a sample, an ion trap (3) for storing and selecting ions, an ion dissociation section (4) performing electron capture dissociation on ions, and a time-of-flight mass spectrometry section (7) performing mass spectrometry on ions, wherein the reaction time of electron capture dissociation is variable depending on the valence of ions subjected to mass spectrometry.Type: ApplicationFiled: June 18, 2009Publication date: May 26, 2011Inventors: Shinji Yoshioka, Akihiro Takeda, Tsukasa Shishika
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Patent number: 7928365Abstract: For the achievement of data transfer time reduction, removal of noise data, and analytical efficiency improvement in an ADC data processing function of a time-of-flight mass spectrometer, the mass spectrometer comprises a data acquisition circuit including: an A/D converter; a signal intensity addition memory that stores data of ion signals such as a time range and the number of measurements and performs an addition process; a voltage value frequency addition memory that performs an addition process of frequencies of voltage values of the predetermined time range and the number of measurements and stores addition results; a threshold level computation circuit that computes a predetermined threshold level from the results in the memory; a compression memory that extracts only data exceeding the threshold level from the data in the signal intensity addition memory; and a counter that controls a measurement time for data acquisition and the operation of each circuit.Type: GrantFiled: December 29, 2005Date of Patent: April 19, 2011Assignee: Hitachi High-Technologies CorporationInventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Patent number: 7890074Abstract: In a data acquisition system of ADC system, a log amplifier is provided at the pre-stage of an A/D converter, a signal amplified by the log amplifier having a nonlinear input-output characteristic is A/D-converted, and an adding operation of data is performed while reconverting a voltage value data which is converted to a nonlinear characteristic to data with a linear scale according to a table memory for reverse-log conversion. A known voltage value is inputted into the log amplifier to perform measurement, and calibration of the table memory is performed by storing the voltage value and the voltage value data after A/D-converted.Type: GrantFiled: February 15, 2007Date of Patent: February 15, 2011Assignee: Hitachi High-Technologies CorporationInventors: Kenichi Shinbo, Fujio Oonishi, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Patent number: 7755035Abstract: An ion trap time-of-flight mass spectrometer capable of obtaining highly-sensitive mass spectra even on the lower mass number side is realized. The ion trap time-of-flight mass spectrometer includes an ion source that operates at atmospheric pressure, an ion optical system for introducing the ions generated by the ion source into a vacuum chamber and converging the ions introduced into the vacuum chamber, an ion trap part for trapping ions in the vacuum chamber, a multipole part for converging the kinetic energy of the ions discharged from the ion trap, and a time-of-flight mass spectrometry part for measuring the ions discharged from the multipole part. The period of high-voltage pulses generated by an electrode provided in the time-of-flight mass spectrometry part can be changed depending on an ion content introduced into the multipole part.Type: GrantFiled: August 10, 2007Date of Patent: July 13, 2010Assignee: Hitachi High-Technologies CorporationInventors: Hiroshi Nakamura, Tsukasa Shishika, Yasushi Terui, Takuya Saeki
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Publication number: 20090294659Abstract: A time-of-flight mass spectrometer includes a detector and is adapted to measure the time it takes for an accelerated ion to reach the detector and thereby measure the mass of the ion. The time-of-flight mass spectrometer scans a voltage applied to an ion incident side surface of the detector in accordance with a mass to be measured. An electrode is provided between the detector and a space in which an ion flies. The time-of-flight mass spectrometer is capable of measuring ions of a wide range of masses with high detection efficiency by scanning a voltage applied to the electrode.Type: ApplicationFiled: May 29, 2009Publication date: December 3, 2009Inventors: Tsukasa SHISHIKA, Yasushi Terui
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Publication number: 20090236516Abstract: An object of the present invention is to provide a mass spectrometer, a method of mass spectrometry, and a program for mass spectrometry for narrowing the range in which the mass-to-charge ratio is scanned without the ion peak of the fragment ion becoming out of the range. In order to achieve the above object, a mass spectrometer including a control unit, a display unit provided with an user interface, an ionization chamber, a dissociation chamber, a mass separator, and a detector is provided.Type: ApplicationFiled: February 26, 2009Publication date: September 24, 2009Inventors: Yoshinori Kishi, Tsukasa Shishika, Takuya Saeki
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Patent number: 7476850Abstract: The present invention relates to a data processing device for mass spectrometry, in which measurements are performed in a high dynamic range without causing an overrange in an A/D converter in any TOF scan. A data acquisition circuit of a mass spectrometer includes an amplitude value computing circuit which measures and stores a maximum amplitude value of an ion detection signal, a gain control circuit for determining and setting a gain amount for the next measurement, and others. From the immediately preceding TOF scan data or TOF scan data plural times before, the maximum amplitude value of the ion detection signal is extracted. Then, before the next TOF scan, an optimum gain amount is determined based on the extracted maximum amplitude value to adjust the gain of the input signal, and the ion signal is sampled in the A/D converter.Type: GrantFiled: May 11, 2006Date of Patent: January 13, 2009Assignee: Hitachi High-Technologies CorporationInventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika