Patents by Inventor Tsun-kit Chin

Tsun-kit Chin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6765298
    Abstract: To significantly reduce parasitic capacitance of component's landing pad, the present invention forms patterned holes in reference potential layers below the pad, thus effectively increasing the dielectric distance between the pad and the reference potential planes below the pad, raising the characteristic impedance of the pad above that of the trace connected to the pad. A controlled amount of parasitic capacitance is re-introduced to the pad by forming at least one grounded metal plate adjacent to the pad, bringing the characteristic impedance of the pad to substantially match that of the trace. The distance of the metal plates from the pad, and the configuration of the patterned holes are predetermined to substantially match the pad's impedance with that of the trace.
    Type: Grant
    Filed: December 8, 2001
    Date of Patent: July 20, 2004
    Assignee: National Semiconductor Corporation
    Inventors: Tsun-kit Chin, William Landucci
  • Publication number: 20030107056
    Abstract: To significantly reduce parasitic capacitance of component's landing pad, the present invention forms patterned holes in reference potential layers below the pad, thus effectively increasing the dielectric distance between the pad and the reference potential planes below the pad, raising the characteristic impedance of the pad above that of the trace connected to the pad. A controlled amount of parasitic capacitance is re-introduced to the pad by forming at least one grounded metal plate adjacent to the pad, bringing the characteristic impedance of the pad to substantially match that of the trace. The distance of the metal plates from the pad, and the configuration of the patterned holes are predetermined to substantially match the pad's impedance with that of the trace.
    Type: Application
    Filed: December 8, 2001
    Publication date: June 12, 2003
    Applicant: NATIONAL SEMICONDUCTOR CORPORATION
    Inventors: Tsun-Kit Chin, William Landucci
  • Patent number: 5351275
    Abstract: A digital programmable loop filter for high frequency control systems applications utilizing a serial processing technique on pulse densities. The loop filter contains a proportional signal path and an integral signal path. A 4-time-slot sequencer time-multiplexes the serial proportional and integral signals to emulate a 1-pole/1-zero filter. An acquisition speed control circuit controls the acquisition time as well as step sizes of the scaler (proportional path) and the integrator (integral path) to provide loop variable programmability.
    Type: Grant
    Filed: July 15, 1991
    Date of Patent: September 27, 1994
    Assignee: National Semiconductor Corporation
    Inventors: Hee Wong, Tsun-Kit Chin
  • Patent number: 5329559
    Abstract: A phase detector circuit, used in a very high frequency phase-locked loop, receives an incoming NRZI data stream and a phase-locked loop clock signal. For each data transition in the received data stream, the phase detector produces proportional phase error information in the form of two pulse signals PD1 and PD2. Pulse signal PD1 has a pulse width TW1 which corresponds to the amount and direction of any phase error between the data signal transition and the PLL clock signal. Pulse signal PD2 has a fixed width TW2 equal to half the period of the PLL clock signal. The phase detector also generates a recovered data signal and a recovered clock signal using identical parallel circuits so that the recovered signals are time synchronized. Furthermore, the recovered data signal is derived from signals in the phase error detection path, eliminating the need for two distinct circuits for data recovery and clock recovery.
    Type: Grant
    Filed: March 4, 1993
    Date of Patent: July 12, 1994
    Assignee: National Semiconductor
    Inventors: Hee Wong, Tsun-Kit Chin
  • Patent number: 5295079
    Abstract: A digital testing system providing for cost efficient comprehensive testing of very high frequency phase-locked loop performance parameters. The system tests PLL performance parameters both at integrated circuit level and communication board level. Cost efficiency of the testing system allows for volume testing by manufacturers.
    Type: Grant
    Filed: July 18, 1991
    Date of Patent: March 15, 1994
    Assignee: National Semiconductor Corporation
    Inventors: Hee Wong, Tsun-Kit Chin
  • Patent number: 5239561
    Abstract: A phase error processor interfaces a proportionate phase detector to a digital loop filter in a high frequency phase-locked loop (PLL). The PLL receives a high frequency stream of NRZI encoded data, which contains a variable density of data signal transitions. A phase detector in the PLL generates proportionate phase error information in the form of a phase error pulse signal PD1 and a reference pulse signal PD2 for each data transition in the incoming data s The phase error processor, using a "decimation" technique, integrates the proportionate phase error information from just one pair of adjacent positive and negative data transitions during each period of N clock cycles if the number of input data transitions which occur during that time period exceeds the expected minimum, otherwise the phase error processor passes no phase error information. The selection of window width is based on the coding scheme of the incoming data stream.
    Type: Grant
    Filed: July 15, 1991
    Date of Patent: August 24, 1993
    Assignee: National Semiconductor Corporation
    Inventors: Hee Wong, Tsun-Kit Chin
  • Patent number: 5224125
    Abstract: A signed phase-to-frequency (`P-to-F`) converter for use in a very high frequency Phase Locked Loop is disclosed. The P-to-F converter receives an input signal indicating plus/minus phase errors and an enable signal. The input signal is converted into a count by a counting circuit. An upper part of the count signal is used to generate a 3-phase sawtooth digital pattern. A lower part of the count is converted by a lower-bit pulse density modulation (`PDM`) circuit to generate a signal indicating the binary weight of the lower part of the count. The output of the lower-bit PDM circuit is applied, along with the 3-phase digital pattern, to three higher-bit PDM circuits. The carry output of the higher-bit PDM circuits is the digital output of the P-to-F converter and is converted from a digital to an analog signal by RC filters. The positive and negative phase error is indicated by the leading/lagging phase among the 3-phase output waveforms.
    Type: Grant
    Filed: April 5, 1991
    Date of Patent: June 29, 1993
    Assignee: National Semiconductor Corporation
    Inventors: Hee Wong, Tsun-Kit Chin
  • Patent number: 5132633
    Abstract: A phase-locked loop generates a periodic clock signal which matches the frequency of an input signal, such as digital data signals transmitted over an optical fiber. A ring oscillator or other clock generator generates a 2N-phase reference clock signal with a reference frequency f.sub.0, where N is a positive, odd integer having a value of at least three. The 2N reference clock phasor signals have evenly distributed phases. A waveform generator generates a 2N-phase control signal having a frequency .vertline.f.sub.M .vertline. which corresponds to the difference between the input signal's frequency and the reference frequency f.sub.0. The value of f.sub.M is greater than zero when the input signal's frequency is higher than f.sub.0, and it is less than zero when the input signal's frequency is less than f.sub.O. A frequency correction circuit (FCC) generates an output clock signal havng an output frequency which is equal to f.sub.0 +f.sub.M.
    Type: Grant
    Filed: May 21, 1991
    Date of Patent: July 21, 1992
    Assignee: National Semiconductor Corporation
    Inventors: Hee Wong, Tsun-Kit Chin