Patents by Inventor Tsuneo Muraki

Tsuneo Muraki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8481148
    Abstract: An antireflection film is formed by alternately laminating a low refractive index layer and a high refractive index layer. The antireflection film has a reflectance of 10% or less and an excitation purity range of 10 or less for visible light in a wavelength range from 380 nm to 780 nm incident at an incident angle ranging from 0° to 45° when regarding the direction perpendicular to the surface as 0°. The antireflection film inhibits a specific color tone from occurring in interference color of incident light coming from an oblique direction.
    Type: Grant
    Filed: April 27, 2009
    Date of Patent: July 9, 2013
    Assignee: Hoya Corporation
    Inventors: Makoto Adachi, Tsuneo Muraki, Kazuo Kawamata
  • Publication number: 20110033681
    Abstract: An antireflection film is formed by alternately laminating a low refractive index layer and a high refractive index layer. The antireflection film has a reflectance of 10% or less and an excitation purity range of 10% or less for visible light in a wavelength range from 380 nm to 780 nm incident at an incident angle ranging from 0° to 45° when regarding the direction perpendicular to the surface as 0°. The antireflection film inhibits a specific color tone from occurring in interference color of incident light coming from an oblique direction.
    Type: Application
    Filed: April 27, 2009
    Publication date: February 10, 2011
    Applicant: Hoya Corporation
    Inventors: Makoto Adachi, Tsuneo Muraki, Kazuo Kawamata