Patents by Inventor Tsuneo Tsukagoshi
Tsuneo Tsukagoshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9182427Abstract: In an electric/magnetic field probe using an optical fiber, when a stress is applied to the fiber, the polarization state of the light propagating in the fiber changes, and the signal level of the electric or magnetic field detection becomes unstable. For coping with this problem, for suppressing the curve or waggle of the optical fiber caused by a stress applied to the fiber, an electric/magnetic field sensor unit composed of the fiber and EO/MO material is fixed on a quartz substrate, for example, and the part of the fiber other than the sensor unit is stored in an acrylic tube and fixed. Further, polarization adjustment parts like a polarization controller, an optical analyzer or the like is installed in the housing, so that a stress caused by wind pressure or contact is not applied to the fiber connected to the parts.Type: GrantFiled: June 23, 2010Date of Patent: November 10, 2015Assignee: NEC CorporationInventors: Mizuki Iwanami, Tsuneo Tsukagoshi
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Patent number: 9153866Abstract: A communication medium includes: a first sheet conductor portion; a second sheet conductor portion that is arranged facing the first sheet conductor portion; and a conductor portion that surrounds an end part of the first sheet conductor portion and an end part of the second sheet conductor portion. The second sheet conductor portion includes: a shield part that has no opening part; a communication power feed part that has opening parts; and a matched line part that is provided between the shield part and the communication power feed part, and impedance of which matches with the shield part and the communication power feed part. The conductor portion surrounds the end part of the shield part.Type: GrantFiled: November 7, 2011Date of Patent: October 6, 2015Assignee: NEC CorporationInventors: Hiroshi Fukuda, Naoki Kobayashi, Tsuneo Tsukagoshi
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Patent number: 8983370Abstract: A technique is proposed for reducing leakage electromagnetic field that reduces the electromagnetic leakage from a connection point between a communication coupler and a signal transmission apparatus and that can conduct both communication and transmission of electric power. The signal transmission apparatus includes: a first sheet conductive body portion constituting a lower portion electrode; and a second sheet conductive body portion in a mesh shape which is laminated on the first sheet conductive body portion while a gap area is sandwiched therebetween and which includes an uneven mesh size area on which a sheet impedance is continuously changed.Type: GrantFiled: September 1, 2010Date of Patent: March 17, 2015Assignee: NEC CorporationInventors: Tsuneo Tsukagoshi, Naoki Kobayashi, Hiroshi Fukuda, Koichiro Nakase
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Publication number: 20150015083Abstract: An object is to provide a compact interface apparatus capable of receiving electric power, supplying electric power, or/and performing communication on a communication sheet while reducing the influence of a standing wave. A power receiving apparatus (100) that receives electric power from a electromagnetic-wave propagation sheet (10) includes a first conductor section (110) and a second conductor section (120) that couple with an electromagnetic wave propagating through the electromagnetic-wave propagation sheet (10) and thereby receive electric power. The first and second conductor sections (110 and 120) are arranged so that the interval in a first direction between one end of the first conductor section (110) and one end of the second conductor section (120) in the first direction is no less than 2?/14 and no greater than 5?/14, where ? is the effective wavelength of the electromagnetic wave propagating through the electromagnetic-wave propagation sheet (10).Type: ApplicationFiled: November 26, 2012Publication date: January 15, 2015Applicant: NEC CORPORATIONInventors: Koichiro Nakase, Tsuneo Tsukagoshi, Naoki Kobayashi, Hiroshi Fukuda
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Publication number: 20150008994Abstract: An object of the present invention is to provide an interface apparatus which can suppress leakage of electromagnetic waves and supply electromagnetic waves efficiently without limiting applications or mounting positions. An interface apparatus (200) is provided that supplies electromagnetic waves to a sheet-shaped electromagnetic wave transmission medium for propagating electromagnetic waves and includes a first conductor surface, a second conductor surface disposed in an opposed state to and substantially parallel with the first conductor surface, electromagnetic wave supplying means (230) configured to supply electromagnetic waves to a gap between the first and second conductor surfaces, a first structure (240), and a second structure (250).Type: ApplicationFiled: November 26, 2012Publication date: January 8, 2015Applicant: NEC CORPORATIONInventors: Naoki Kobayashi, Tsuneo Tsukagoshi, Koichiro Nakase, Hiroshi Fukuda
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Publication number: 20140191828Abstract: Provided is an electromagnetic wave propagation sheet constituted by a mesh-shaped conductor layer, a planar conductor layer, and an inductor layer sandwiched therebetween, wherein the mesh-shaped conductor layer and the planar conductor layer are electrically connected to each other in an end section of the electromagnetic wave propagation sheet by a short conductor, and a mesh-shaped conductor that constitutes the mesh-shaped conductor layer has a meander shape in the vicinity of the electromagnetic wave propagation sheet end section.Type: ApplicationFiled: June 22, 2012Publication date: July 10, 2014Applicant: NEC CorporationInventors: Koichiro Nakase, Tsuneo Tsukagoshi
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Patent number: 8654331Abstract: There is provided an electromagnetic field measurement apparatus capable of achieving correct and timely circuit operation detection in an area where electronic devices are mounted at high density. An electromagnetic field measurement apparatus includes: a laser light source; a polarized wave controller that linearly polarizes laser light; an optical fiber probe that has an electrooptic material or a magnetooptic material at its leading end and in which the laser light reflected at the leading end is subjected to polarization modulation in accordance with an electric field intensity or a magnetic field intensity; and an analyzer that converts the laser light reflected by the optical fiber probe into intensity modulated light. The laser light source emits time-multiplexed laser light of a plurality of wavelengths different from one another.Type: GrantFiled: February 4, 2009Date of Patent: February 18, 2014Assignee: NEC CorporationInventors: Mizuki Iwanami, Tsuneo Tsukagoshi, Risato Ohhira, Masafumi Nakada, Tomonori Yamada
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Publication number: 20130222203Abstract: A communication medium includes: a first sheet conductor portion; a second sheet conductor portion that is arranged facing the first sheet conductor portion; and a conductor portion that surrounds an end part of the first sheet conductor portion and an end part of the second sheet conductor portion. The second sheet conductor portion includes: a shield part that has no opening part; a communication power feed part that has opening parts; and a matched line part that is provided between the shield part and the communication power feed part, and impedance of which matches with the shield part and the communication power feed part. The conductor portion surrounds the end part of the shield part.Type: ApplicationFiled: November 7, 2011Publication date: August 29, 2013Inventors: Hiroshi Fukuda, Naoki Kobayashi, Tsuneo Tsukagoshi
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Patent number: 8458633Abstract: A semiconductor integrated circuit design apparatus for analyzing a delay in a semiconductor integrated circuit. The semiconductor integrated circuit includes a delay analysis unit, a noise generation unit, a voltage fluctuation level analysis unit and a timing verification unit. The noise generation unit generates noise information based on a predetermined noise definition and the voltage fluctuation level analysis unit analyzes a voltage fluctuation level of the semiconductor integrated circuit when the noise is applied based on the generated noise information. Further, the timing verification unit makes the delay analysis unit analyze the static delay based on the analyzed voltage fluctuation level, to verify timing for operation of the semiconductor integrated circuit based on a result of the static delay analysis.Type: GrantFiled: April 21, 2010Date of Patent: June 4, 2013Assignees: NEC Corporation, Renesas Electronics CorporationInventors: Yoshihiro Ono, Takeshi Watanabe, Naoshi Doi, Itsuki Yamada, Tsuneo Tsukagoshi
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Patent number: 8410791Abstract: The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.Type: GrantFiled: March 6, 2008Date of Patent: April 2, 2013Assignees: NEC Corporation, Renesas Electronics Corporation, Hanwa Electronic Ind. Co., Ltd.Inventors: Tsuneo Tsukagoshi, Takeshi Watanabe, Toshiyuki Nakaie, Nobuchika Matsui
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Patent number: 8354975Abstract: Conductor pieces 102 that are periodically arrayed, a conductor plane 103 that has openings 104 periodically arrayed so as to correspond to the conductor pieces 102, and a dielectric 108 that is arranged between the conductor pieces 102 and the conductor plane 103, are included. Island electrodes 105 and planar inductance elements 106 are arranged in the openings 104 of the conductor plane 103. The island electrodes 105 and the conductor pieces 102 are connected by conductor posts 107. The island electrodes 105 and the conductor plane 103 are connected through the planar inductance elements 106.Type: GrantFiled: December 26, 2008Date of Patent: January 15, 2013Assignee: NEC CorporationInventors: Noriaki Ando, Tsuneo Tsukagoshi, Koichi Takemura
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Patent number: 8341579Abstract: An operation analyzing apparatus (100) for semiconductor integrated circuits according to this exemplary embodiment includes a simulation analyzing unit (140), and the simulation analyzing unit (140) includes: a semiconductor characteristics extracting unit (110) that extracts the inductances L, resistances R, and capacitances C of a board, a package, and a semiconductor integrated circuit, from the semiconductor integrated circuit mounted on the board via the package; an individual network generating unit (111) that generates individual networks of the extracted inductance L, resistance R, and capacitance C with respect to each of said semiconductor substrate, said package, and said semiconductor integrated circuit; an integrated network generating unit (112) that generates an integrated network by integrating all of the generated individual networks; and an operation simulation running unit (113) that performs an operation simulation of the semiconductor integrated circuit by inserting a test noise patternType: GrantFiled: October 27, 2009Date of Patent: December 25, 2012Assignee: NEC CorporationInventors: Takumi Okamoto, Takeshi Watanabe, Itsuki Yamada, Naoshi Doi, Tsuneo Tsukagoshi
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Publication number: 20120157024Abstract: A technique is proposed for reducing leakage electromagnetic field that reduces the electromagnetic leakage from a connection point between a communication coupler and a signal transmission apparatus and that can conduct both communication and transmission of electric power. The signal transmission apparatus includes: a first sheet conductive body portion constituting a lower portion electrode; and a second sheet conductive body portion in a mesh shape which is laminated on the first sheet conductive body portion while a gap area is sandwiched therebetween and which includes an uneven mesh size area on which a sheet impedance is continuously changed.Type: ApplicationFiled: September 1, 2010Publication date: June 21, 2012Applicant: NEC CORPORATIONInventors: Tsuneo Tsukagoshi, Naoki Kobayashi, Hiroshi Fukuda, Koichiro Nakase
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Publication number: 20120146860Abstract: A communication system according to the present invention includes: a communication coupler that transmits a signal outputted from a communication equipment; and a signal transmission apparatus that performs communication by propagating, as an electromagnetic field, a signal transmitted from the communication coupler. The communication coupler includes: a coupler case; and an extended conductor portion that is provided at an end portion of the coupler case, the end portion facing the signal transmission apparatus, the extended conductor portion extends so as to be parallel to the signal transmission apparatus, and the extended conductor portion increases electromagnetic coupling between the communication coupler and the signal transmission apparatus.Type: ApplicationFiled: June 16, 2010Publication date: June 14, 2012Inventors: Koichiro Nakase, Akira Miyata, Tsuneo Tsukagoshi
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Publication number: 20120121217Abstract: In an electric/magnetic field probe using an optical fiber, when a stress is applied to the fiber, the polarization state of the light propagating in the fiber changes, and the signal level of the electric or magnetic field detection becomes unstable. For coping with this problem, for suppressing the curve or waggle of the optical fiber caused by a stress applied to the fiber, an electric/magnetic field sensor unit composed of the fiber and EO/MO material is fixed on a quartz substrate, for example, and the part of the fiber other than the sensor unit is stored in an acrylic tube and fixed. Further, polarization adjustment parts like a polarization controller, an optical analyzer or the like is installed in the housing, so that a stress caused by wind pressure or contact is not applied to the fiber connected to the parts.Type: ApplicationFiled: June 23, 2010Publication date: May 17, 2012Applicant: NEC CORPORATIONInventors: Mizuki Iwanami, Tsuneo Tsukagoshi
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Publication number: 20110296369Abstract: An operation analyzing apparatus (100) for semiconductor integrated circuits according to this exemplary embodiment includes a simulation analyzing unit (140), and the simulation analyzing unit (140) includes: a semiconductor characteristics extracting unit (110) that extracts the inductances L, resistances R, and capacitances C of a board, a package, and a semiconductor integrated circuit, from the semiconductor integrated circuit mounted on the board via the package; an individual network generating unit (111) that generates individual networks of the extracted inductance L, resistance R, and capacitance C with respect to each of said semiconductor substrate, said package, and said semiconductor integrated circuit; an integrated network generating unit (112) that generates an integrated network by integrating all of the generated individual networks; and an operation simulation running unit (113) that performs an operation simulation of the semiconductor integrated circuit by inserting a test noise patternType: ApplicationFiled: October 27, 2009Publication date: December 1, 2011Inventors: Takumi Okamoto, Takeshi Watanabe, Itsuki Yamada, Naoshi Doi, Tsuneo Tsukagoshi
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Publication number: 20110170268Abstract: To provide a small-sized and thin electromagnetic band gap structure which can be surface-mounted or built in a substrate. An electromagnetic band gap structure according to an aspect of the present invention includes: an insulating substrate; a plurality of conductor pieces regularly arranged on the insulating substrate; a dielectric layer formed so as to fill a space between adjacent ones of the conductor pieces; an interlayer insulating layer formed on the dielectric layer; and a conductor plane which is formed on the interlayer insulating layer and is connected to each of the conductor pieces with a conductor penetrating through the interlayer insulating layer.Type: ApplicationFiled: October 2, 2009Publication date: July 14, 2011Applicant: NEC CORPORATIONInventors: Koichi Takemura, Noriaki Ando, Tsuneo Tsukagoshi
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Publication number: 20110012697Abstract: An electromagnetic bandgap structure EBG includes a rigid substrate, a first conductive plane provided on the rigid substrate, a dielectric layer provided on the first conductive plane, and a plurality of conductor patches arrayed in a two-dimensional regular pattern on the dielectric layer. The electromagnetic bandgap structure also includes an interlayer insulation film provided on top of the conductor patches, and a second conductive plane provided on the interlayer insulation film. The conductor patches and the second conductive plane are interconnected by a plurality of conductors provided in extending through the bulk of the interlayer insulation film.Type: ApplicationFiled: April 22, 2009Publication date: January 20, 2011Inventors: Koichi Takemura, Noriaki Ando, Tsuneo Tsukagoshi
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Publication number: 20110001971Abstract: There is provided an electromagnetic field measurement apparatus capable of achieving correct and timely circuit operation detection in an area where electronic devices are mounted at high density. An electromagnetic field measurement apparatus includes: a laser light source; a polarized wave controller that linearly polarizes laser light; an optical fiber probe that has an electrooptic material or a magnetooptic material at its leading end and in which the laser light reflected at the leading end is subjected to polarization modulation in accordance with an electric field intensity or a magnetic field intensity; and an analyzer that converts the laser light reflected by the optical fiber probe into intensity modulated light. The laser light source emits time-multiplexed laser light of a plurality of wavelengths different from one another.Type: ApplicationFiled: February 4, 2009Publication date: January 6, 2011Inventors: Mizuki Iwanami, Tsuneo Tsukagoshi, Risato Ohhira, Masafumi Nakada, Tomonori Yamada
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Publication number: 20100265159Abstract: Conductor pieces 102 that are periodically arrayed, a conductor plane 103 that has openings 104 periodically arrayed so as to correspond to the conductor pieces 102, and a dielectric 108 that is arranged between the conductor pieces 102 and the conductor plane 103, are included. Island electrodes 105 and planar inductance elements 106 are arranged in the openings 104 of the conductor plane 103. The island electrodes 105 and the conductor pieces 102 are connected by conductor posts 107. The island electrodes 105 and the conductor plane 103 are connected through the planar inductance elements 106.Type: ApplicationFiled: December 26, 2008Publication date: October 21, 2010Inventors: Noriaki Ando, Tsuneo Tsukagoshi, Koichi Takemura