Patents by Inventor Tsuneyuki Urakami

Tsuneyuki Urakami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6567165
    Abstract: A concentration measuring apparatus for an absorption component in a scattering medium includes a light source (2) for generating at least two light rays having predetermined wavelengths, the light rays having different transport scattering coefficients for a scattering medium (20) as an object to be measured, and a known ratio of the transport scattering coefficients; light incidence means (6) for making the light rays incident from a light incident position into the scattering medium (20); photodetection means (12), (13) for detecting the light ray which has propagated inside the scattering medium (20) at at least one photodetection position different from the light incident position to acquire at least one photodetection signal; parameter detection means (15) for detecting, on the basis of the photodetection signal, a light intensity and a mean flight pathlength at the light detection position for each of the at least two light rays having predetermined wavelengths; and arithmetic processing means (16) for
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: May 20, 2003
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Yutaka Tsuchiya, Tsuneyuki Urakami
  • Patent number: 5811805
    Abstract: An electron-microscope image viewing apparatus capable of measuring of a moving speed or a vibration frequency of an atomic structure, a magnetic structure, an electric structure or the like of a specimen even when the structure changes at a high rate.
    Type: Grant
    Filed: August 23, 1996
    Date of Patent: September 22, 1998
    Assignees: Research Development Corporation of Japan, Hitachi, Ltd., Hamamatsu Photonics K.K.
    Inventors: Nobuyuki Osakabe, Junji Endo, Tetsuji Kodama, Tsuneyuki Urakami, Hiroshi Tsuchiya, Shinji Ohsuka
  • Patent number: 5774223
    Abstract: An optical measuring method and an optical measuring apparatus are capable of obtaining the true mean time delay of a light waveform within a short time for the purpose of obtaining information on the internal structure of an object. Calculations include a first mean time delay when the light path includes the object, a second mean time delay when the light path does not include the object, and a subtraction of the second mean time delay from the first mean time delay to obtain a true mean time delay.
    Type: Grant
    Filed: August 27, 1996
    Date of Patent: June 30, 1998
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Tsuneyuki Urakami, Mitsuharu Miwa, Yutaka Yamashita, Yutaka Tsuchiya
  • Patent number: 5703491
    Abstract: This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.
    Type: Grant
    Filed: August 27, 1996
    Date of Patent: December 30, 1997
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Takuya Nakamura, Isuke Hirano, Shinichiro Aoshima, Hironori Takahashi, Tsuneyuki Urakami
  • Patent number: 5640247
    Abstract: Light having a predetermined wavelength and various incident angle components to be incident on a surface of a scattering medium to generate an equivalent point light source or a group of equivalent point light sources near or on the surface of the scattering medium, and light diffused during propagation in the scattering medium is detected outside, and considering isotropic light from the equivalent light sources is immediately diffused, the optically detected signal is processed to detect a predetermined parameter which is primary information and this predetermined parameter is processed to measure internal information which is secondary information in the scattering medium with high accuracy.
    Type: Grant
    Filed: December 1, 1994
    Date of Patent: June 17, 1997
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Yutaka Tsuchiya, Kazuyoshi Ohta, Tsuneyuki Urakami
  • Patent number: 5583444
    Abstract: This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.
    Type: Grant
    Filed: March 19, 1996
    Date of Patent: December 10, 1996
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Takuya Nakamura, Isuke Hirano, Shinichiro Aoshima, Hironori Takahashi, Tsuneyuki Urakami
  • Patent number: 5499190
    Abstract: A system for measuring timing relationship between two signals for accurately measuring a timing relationship between signals includes an electro-optic measuring unit and a waveform storage and processing unit. The electro-optic measuring unit samples electrical signals from a device under measurement via a strobe light so as to measure the signal waveform. The electro-optic unit uses a laser diode as a light source. The waveform storage and processing unit stores the electrical signal waveforms measured by the electro-optic measuring unit in digital form. The waveform storage and processing unit also calculates a correlation between two stored electrical signal waveforms via a correlation calculation unit, and also detects a peak of the correlation to detect a timing relationship between the signals.
    Type: Grant
    Filed: January 15, 1993
    Date of Patent: March 12, 1996
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Hironori Takahashi, Tsuneyuki Urakami, Shinichiro Aoshima, Isuke Hirano
  • Patent number: 5491329
    Abstract: Light the intensity of which is modulated to the initial intensity by a modulating signal having an ac component with a predetermined frequency and which is from the intensity tuneable light irradiating unit irradiates the scattering and absorption medium which is an object to be measured. The modulated light incident on the scattering and absorption medium propagates in the scattering and absorption medium, emerges therefrom and is incident to the photodetecting unit, and the photodetecting unit converts the incident light into an electric signal corresponding to the intensity of the incident light, and thereafter, outputs the electric signal as an optically detected signal. The feedback unit extracts the ac component from the input optically detected signal, and the intensity of the ac electric signal and the adjusting value are compared and the variation of the quantity of generating light is sent to the intensity tuneable light irradiating unit.
    Type: Grant
    Filed: December 2, 1994
    Date of Patent: February 13, 1996
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Tsuneyuki Urakami, Yutaka Tsuchiya
  • Patent number: 5444365
    Abstract: A change in voltage can be sensitively detected at a local part of a measured object. A set of laser medium and E-O probe are disposed between a pair of mirrors, a first one and a second one, forming a laser resonator. A linearly polarized light is emitted from the laser medium. The polarized light enters the E-O probe, and returns after being reflected by the second mirror. When a voltage is given to the E-O probe from the measured object, depending on the voltage, a refractive index of the E-O probe is changed, the light emitted from the E-O probe is ovally polarized, and a resonance status of the laser resonator then varies. Therefore, the light intensity emitted through the partially penetrating first mirror to the outside of the laser resonator corresponds to the voltage at the measured object in the proximity of the E-O probe. Consequently, a voltage distribution on the measured object such as IC with fine structures can be two-dimensionally detected.
    Type: Grant
    Filed: August 30, 1993
    Date of Patent: August 22, 1995
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Hironori Takahashi, Tsuneyuki Urakami, Shinichiro Aoshima, Isuke Hirano
  • Patent number: 5420686
    Abstract: Polarized light is input to an optical modulator typically consisting of an electrooptic crystal. The polarization state of the input light is changed in accordance with a voltage being applied to the optical modulator. Receiving the light output from the optical modulator, a polarization interferometer produces an interference fringe on the input surface of a photodetector such as a streak camera and a CCD line sensor. Based on an output signal of the photodetector, an analyzing device calculates a pitch and a movement distance of the interference fringe to determine the voltage being applied to the optical modulator.
    Type: Grant
    Filed: February 22, 1994
    Date of Patent: May 30, 1995
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Hironori Takahashi, Tsuneyuki Urakami, Shinichiro Aoshima
  • Patent number: 5384638
    Abstract: Polarized light pulses are applied to an optical modulator including an electrooptic crystal. A polarization state of the applied light is changed in accordance with a voltage of an electrical signal applied to the optical modulator. A polarization interferometer receives the light output from the optical modulator, and generates an interference fringe on the input surface of a photodetector such as a one-dimensional CCD. A processing device calculates a pitch and a movement distance of the interference fringe, based on an output signal of the photodetector, to determine the voltage. A waveform of the electrical signal is determined by sampling the electrical signal with multiple light pulses, while varying a phase relationship between the electrical signal and the light pulses.
    Type: Grant
    Filed: March 26, 1992
    Date of Patent: January 24, 1995
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Hironori Takahashi, Tsuneyuki Urakami, Shinichiro Aoshima
  • Patent number: 5353149
    Abstract: An optical converter is so arranged that light to be measured and probe light are made to interact with each other on a nonlinear element and that mixed light produced by the interaction is detected, which is characterized in that an energy amount of interacting signal light is kept as high as possible without spatial expansion of signal light, which could lower the SN ratio. For this, the time-space conversion function is achieved by a method for producing the probe light. Namely, the optical converter comprises (a) a nonlinear element for making two types of light interact with each other to cause the nonlinear optical effect, (b) a device for guiding light to be measured to the nonlinear element, and (c) a device for producing probe light crossing the light to be measured on the nonlinear element and changing a traveling direction of probe light with change of crossing time.
    Type: Grant
    Filed: September 16, 1993
    Date of Patent: October 4, 1994
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Tsuneyuki Urakami, Teruo Hiruma
  • Patent number: 5319654
    Abstract: An object of this invention is to provide a pulsed laser beam source device which is easy to handle and is operative stably. Pumping light is irradiated to a laser medium from a light source for optical pumping. The stimulated laser medium pumps radiation of a set wavelength. This radiation is stimulated to be amplified while reciprocating between resonator mirrors. A multi layer film is inserted in an optical path of the radiation. Feeble light of the radiation from the laser medium is absorbed by the multi-layer to be weaker, and that part of the radiation having intensities above a set intensity is compressed in terms of time to be emitted outside. The emitted radiation has a very short pulse duration.
    Type: Grant
    Filed: March 30, 1993
    Date of Patent: June 7, 1994
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Tsuneyuki Urakami, Shinichiro Aoshima, Isuke Hirano
  • Patent number: 5317577
    Abstract: An optical wavelength shifter shifts a wavelength of light over a wide range without need for using a large peak pump pulse. A nonlinear optical medium having a nonlinear refractive index is disposed interiorly of a laser resonator. A pump pulse and a light to be modulated are incident on a nonlinear optical medium to phase shift the light. With the provision of a timing delay unit, the timing at which the light to be modulated is incident on the nonlinear optical medium is delayed with respect to the timing at which the pump pulse is incident thereon.
    Type: Grant
    Filed: June 8, 1992
    Date of Patent: May 31, 1994
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Tsuneyuki Urakami, Shinichiro Aoshima
  • Patent number: 5307199
    Abstract: The optical apparatus includes first and second deflection members, a mask, a pumping light source, and a controller. The first and second deflection members are formed of nonlinear optical material whose refractive index is changed upon light radiation. The mask is arranged on an optical path extending from a front side of the first deflection member to a rear side of a second deflection member. The mask has a predetermined transmission pattern. The pumping light source radiates first and second beams on predetermined regions of the first and second deflection members. This changes the refractive indices of the predetermined regions to bend the optical path. The controller variably controls the intensity of the first and second beams.
    Type: Grant
    Filed: July 25, 1991
    Date of Patent: April 26, 1994
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Tsuneyuki Urakami, Shinichiro Aoshima, Yutaka Tsuchiya
  • Patent number: 5274651
    Abstract: An optical modulator which can perform optical modulation without using pulses having a high level peak power, include a medium having a nonlinear refractive index disposed interiorly of a laser resonator which includes an input mirror, an output mirror, a laser medium disposed between the input and output mirrors, and an excitation device for exciting the laser medium so that a laser pulse is oscillated by the laser medium. The optical modulator can operate in both the self phase modulation mode and the induced-phase modulation mode. To operate the optical modulator in the self phase modulation mode, the laser pulses passing through the medium are self phase modulated. To operate the optical modulator in the induced-phase modulation mode, a light emitting device is provided which emits a light to be modulated. The light is incident on the input mirror and passed through the medium so that the light is cross phase modulated by the laser serving as a pumping light.
    Type: Grant
    Filed: January 27, 1992
    Date of Patent: December 28, 1993
    Assignee: Hamamatsu Photonics K.K.
    Inventor: Tsuneyuki Urakami
  • Patent number: 5237388
    Abstract: Young's interferometer consisting of a single slit and a double slit member, and an analyzer are arranged along the axis of light to be measured. Parallel slits of the double slit member are provided with respective polarizers whose paralyzing directions are at .+-.45.degree. to the longitudinal direction of the parallel slits. The polarizing direction of the analyzer is set in parallel with the parallel slits. The incident light passes through Young's interferometer and the analyzer to form an interference fringe, which is detected by an image detector unit. An image analyzer unit produces an intensity profile of the interference fringe and determines the polarization state of the incident light, for instance, by comparing the produced intensity profile with conceivable profiles stored in advance.
    Type: Grant
    Filed: September 19, 1991
    Date of Patent: August 17, 1993
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Isuke Hirano, Hironori Takahashi, Tsuneyuki Urakami, Tamiki Takemori, Yutaka Tsuchiya, Shinichiro Aoshima
  • Patent number: 5220579
    Abstract: A pulse laser has a laser resonator, a laser medium in the laser resonator, and a deflecting device. The laser medium emits an emission light. The deflecting device switches an optical path of the emission light to output the emission light as a laser pulse. The deflecting device includes a deflecting member and a pumping device. The deflecting member is arranged in the optical path of the emission light. The deflection member has a refractive index which changes based on a pumping light incident thereon. The pumping device radiates the pumping light on a predetermined region of the deflection member and varies the refractive index of the predetermined region to switch the optical path of the emission light.
    Type: Grant
    Filed: July 25, 1991
    Date of Patent: June 15, 1993
    Assignee: Hamamatsu Photonics, K.K.
    Inventors: Tsuneyuki Urakami, Shinichiro Aoshima
  • Patent number: 5198921
    Abstract: A semiconductor light amplifier is driven by a drive device, and selectively amplifies one of a TM mode component and a TE mode component of input light. For example, TE mode light is selectively amplified by making thickness of the active layer of the semiconductor light amplifier not more than 0.05 .mu.m, or by tilting at least one of the entrance and exit faces of the semiconductor light amplifier by 10 to 16 degrees. An another type of light amplifying polarizer, input signal light and excitation light are combined by a half mirror or an optical coupler, and combined light is input to a rare-earth-element doped, polarization maintaining optical fiber.
    Type: Grant
    Filed: November 21, 1991
    Date of Patent: March 30, 1993
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Shinichiro Aoshima, Tsuneyuki Urakami, Yutaka Tsuchiya
  • Patent number: 5168164
    Abstract: When sampling light and light to be measured each having a wavelength longer than an upper wavelength limit of the sensitivity of a photocathode are incident on the photocathode of a multiphoton absorption-type electron tube, light-light sampling is enabled by two-photon absorption and one-photoelectron emission. A delaying unit adjusts an incident timing of the sampling light from an optical pulse generating unit on the elctron tube in synchronism with an incident timing of the light to be measured on the electron tube. A half mirror causes the sampling light and the light to be measured to coincide on the photocathode of the electron tube. A controlling unit controls the delaying unit to sequentially shift the incident timing of the sampling light on the electron tube.
    Type: Grant
    Filed: March 27, 1992
    Date of Patent: December 1, 1992
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Tsuneyuki Urakami, Motohiro Suyama