Abstract: A heat dissipation system of an electronic device including a body, a plurality of heat sources disposed in the body, and at least one centrifugal heat dissipation fan disposed in the body is provided. The centrifugal heat dissipation fan includes a housing and an impeller disposed in the housing on an axis. The housing has at least one inlet on the axis and has a plurality of outlets in different radial directions, and the plurality of outlets respectively correspond to the plurality of heat sources.

Abstract: A carrier structure is provided, in which at least one positioning area is defined on a chip-placement area of a package substrate, and at least one alignment portion is disposed on the positioning area. Therefore, the precision of manufacturing the alignment portion is improved by disposing the positioning area on the chip-placement area, such that the carrier structure can provide a better alignment mechanism for the chip placement operation.

Abstract: A via structure, a semiconductor structure, and methods for forming the via structure and the semiconductor structure are presented. A via structure includes a first conductive portion through an interconnect structure, a second conductive portion through a substrate and in contact with the first conductive portion, and a liner layer. The liner layer is between the first conductive portion and the interconnect structure, and between the second conductive portion and the substrate. The liner layer includes a portion extending parallel to a surface of the substrate.

Abstract: Some implementations described herein include systems and techniques for fabricating a multi-dimension through silicon via structure in a three-dimensional integrated circuit device. The multi-dimension through silicon via structure includes a first columnar structure having a first width and a second columnar structure including a second width that is greater relative to the first width. The first columnar structure may include a low electrical capacitance and be configured for electrical signaling within the three-dimensional integrated circuit device. The second columnar structure may be configured to provide power to integrated circuitry of the three-dimensional integrated circuit device and also be configured to conduct heat through the three-dimensional integrated circuit device for thermal management of the three-dimensional integrated circuit device. Additionally, a pattern including the second columnar structure may be used for alignment purposes.

Abstract: A semiconductor device includes first and second metal-insulator-metal structures. The first metal-insulator-metal structure includes a first bottom conductor plate, a first portion of a first dielectric layer, a first middle conductor plate, a first portion of a second dielectric layer, and a first top conductor plate stacked up one over another. The second metal-insulator-metal structure includes a second bottom conductor plate, a second portion of the first dielectric layer, a second middle conductor plate, a second portion of the second dielectric layer, and a second top conductor plate stacked up one over another. In a cross-sectional view, the first bottom conductor plate is wider than the first middle conductor plate that is wider than the first top conductor plate, and the second bottom conductor plate is narrower than the second middle conductor plate that is narrower than the first top conductor plate.

Abstract: An integrated circuit (IC) device includes a substrate. The IC device includes a multi-layer interconnect structure disposed over a first side of the substrate. The multi-layer interconnect structure includes a plurality of metal layers. The IC device includes a first portion of a through-substrate via (TSV) disposed over the first side of the substrate. The first portion of the TSV includes a plurality of conductive components belonging to the plurality of metal layers of the multi-layer interconnect structure. The IC device includes a second portion of the TSV that extends vertically through the substrate from the first side to a second side opposite the first side. The second portion of the TSV is electrically coupled to the first portion of the TSV.

Abstract: A method and a system for mental index prediction are provided. The method includes the following steps. A plurality of images of a subject person are obtained. A plurality of emotion tags of the subject person in the images are analyzed. A plurality of integrated emotion tags in a plurality of predetermined time periods are calculated according to the emotion tags respectively corresponding to the images. A plurality of preferred features are determined according to the integrated emotion tags. A mental index prediction model is established according to the preferred features to predict a mental index according to the emotional index prediction model.

Abstract: A fan is provided herein, including a housing, a hub, and a plurality of blades. The housing includes a top case and a bottom case. The hub is rotatably disposed between the top case and the bottom case in an axial direction. The blades extend from the hub in a radial direction, located between the top case and the bottom case. Each of the blades has a proximal end and a distal end. The proximal end is connected to the hub. The distal end is opposite from the proximal end, located at the other side of the blade, having at least one recessed portion. Each of the recessed portions form a passage for air.

Abstract: A sample analyzing method and a sample preparing method are provided. The sample analyzing method includes a sample preparing step, a placing step, and an analyzing step. The sample preparing step includes an obtaining step implemented by obtaining an identification information; and a marking and placing step implemented by placing a sample carrying component having a sample disposed thereon into a marking equipment, allowing the marking equipment to utilize the identification information to form an identification structure on the sample carrying component, and placing the sample carrying component into one of the accommodating slots according to the identification information. The placing step is implemented by taking out the sample carrying component from one of the accommodating slots and placing the sample carrying component into an electron microscope equipment. The analyzing step is implemented by utilizing the electron microscope equipment to photograph the sample to generate an analyzation image.

Abstract: The present disclosure is directed to a semiconductor device. The semiconductor device includes a substrate, an insulating layer disposed on the substrate, a first conductive feature disposed in the insulating layer, and a capacitor structure disposed on the insulating layer. The capacitor structure includes a first electrode, a first dielectric layer, a second electrode, a second dielectric layer, and a third electrode sequentially stacked. The semiconductor device also includes a first via connected to the first electrode and the third electrode, a second via connected to the second electrode, and a third via connected to the first conductive feature. A part of the first via is disposed in the insulating layer. A portion of the first conductive feature is directly under the capacitor structure.

Abstract: A centrifugal heat dissipation fan including a housing and an impeller disposed in the housing on an axis is provided. The housing has at least one inlet on the axis and has a plurality of outlets in different radial directions. A heat dissipation system of an electronic device is also provided.

Abstract: A semantic analysis apparatus, method, and non-transitory computer readable storage medium thereof are provided. The semantic analysis apparatus performs phrase analysis on a Chinese character string to obtain several groups and semantically analyzes the groups to obtain at least one first probability distribution, wherein each first probability distribution has several first probability values corresponding to several tags one-to-one. The semantic analysis apparatus divides the Chinese character string into several Chinese characters and semantically analyzes the Chinese characters to obtain at least one second probability distribution, wherein each second probability distribution has several second probability values corresponding to the tags one-to-one.

Abstract: A semantic analysis apparatus, method, and non-transitory computer readable storage medium thereof are provided. The semantic analysis apparatus performs phrase analysis on a Chinese character string to obtain several groups and semantically analyzes the groups to obtain at least one first probability distribution, wherein each first probability distribution has several first probability values corresponding to several tags one-to-one. The semantic analysis apparatus divides the Chinese character string into several Chinese characters and semantically analyzes the Chinese characters to obtain at least one second probability distribution, wherein each second probability distribution has several second probability values corresponding to the tags one-to-one.

Abstract: A lens device used for an LED package includes a base portion, and a refracting portion formed on the top face of the base portion. A recess corresponding to the refracting portion is formed on the bottom face of the base portion. At least one notch connecting with the recess is also formed on the bottom face of the base portion. A surface of refracting portion is provided as a non-spherical convex surface. An indent is formed on the center of the non-spherical convex surface. The light emitted from the LED package is directed toward lateral side, and the angular intensity distribution has an asymmetrical batwing shape, so as to obtain an illuminating apparatus with uniformly illumination.

Abstract: A packaging structure for back-to-back chips, which includes: a substrate, a first chip, a second chip, and an encapsulation. Wherein, the first chip has an active side and an inactive side, and the active side of the first chip is connected to the substrate by an adhesion layer and conducted electrically with the substrate by wire-bonding. The second chip has an active side that is also conducted electrically with the substrate by wire-bonding and an inactive side that is connected to the inactive side of the first chip by another adhesion layer. The encapsulation covers both the first chip and the second chip for protecting the back-to-back packaging structure.

Abstract: The provision of a semiconductor wafer, which has been formed with a plurality of chips that each can be existent independently; the pre-cure process, in which the buffer layer has not been completely baked or hardened yet, but just for making the buffer layer be in stable condition; the pre-cut process, in which a cut is made at the position of the buffer layer corresponding to the boundary of each IC to make a gap exited between each two adjacent ICs without containing any buffer layer; the post-cut process, in which the buffer layer has completely baked and hardened; the singulation process, in which the both wafer and buffer layer are cut simultaneously to make the plural ICs separated from each other to become IC device that can act independently.

Abstract: A method for forming a back-to-back dual-chip package and package formed are disclosed. In the method, a first IC chip is bonded in its inactive surface to an inactive surface of a second IC chip, while solder balls planted on the active surfaces of both chips. One of the chips is connected to lead fingers of a lead frame by the solder balls. The dual-chip assembly together with the lead fingers are then encapsulated in an insulating material for protecting the chips while exposing substantially the solder balls on the IC chip that was not connected to the lead fingers. The encapsulated assembly can then be connected to an outside circuit, such as a printed circuit board, by forming the exposed finger leads for soldering and by fusing the solder balls to the outside circuit. The present invention novel method and device formed advantageously utilize existing chip design for achieving a high density device at a low cost.

Abstract: A method for forming a back-to-back dual-chip package and package formed are disclosed. In the method, a first IC chip is bonded in its inactive surface to an inactive surface of a second IC chip, while solder balls planted on the active surfaces of both chips. One of the chips is connected to lead fingers of a lead frame by the solder balls. The dual-chip assembly together with the lead fingers are then encapsulated in an insulating material for protecting the chips while exposing substantially the solder balls on the IC chip that was not connected to the lead fingers. The encapsulated assembly can then be connected to an outside circuit, such as a printed circuit board, by forming the exposed finger leads for soldering and by fusing the solder balls to the outside circuit. The present invention novel method and device formed advantageously utilize existing chip design for achieving a high density device at a low cost.

Abstract: A method for forming chip scale packages and devices formed by utilizing a wire bonding technique and an interposer board which has recessed peripheral regions are disclosed. In the method, an IC die is bonded on its active surface to an interposer which is constructed with a recessed peripheral regions equipped with interconnections such that shorter bond wires may be run between the IC die and the interposer. The interposer is further equipped, in a top planar surface, with a plurality of interconnections for the subsequently forming of solder balls for connecting to an outside circuit such as a printed circuit board. The present invention novel method further provides the benefit that the shorter wire bonds formed alleviate the wire sweep problem normally occurs in the plastic encapsulation process for such a package.

Abstract: A dual-sided heat dissipating structure for BGA package includes a step-shaped first heat dissipating member adhering to an active side of the chip and a dish-shaped perforated second heat dissipating member adhering to a non-active side of the chip so that heat generated in the chip may be dissipated more effectively. The step surface first heat dissipating member may also serve as a press mold to enable bonding of inner leads of the substrate to the bonding pads of the chip be done along with adhering of the first heat dissipating member to the chip at same process in the mean time without additional process or equipment. The perforated second heat dissipating member enables moisture escaping from the package to avoid pop corn effect resulting from IR Reflow test. The package may be made at a thin thickness and low cost.