Patents by Inventor Tsung-Chin Huo

Tsung-Chin Huo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8159235
    Abstract: The present teachings relate to the application of electrical impedance tomography (EIT) to demonstrate the multifunctionality of carbon nanocomposite thin films under various types of environmental stimuli. Carbon nanotube (CNT) thin films are fabricated by a layer-by-layer (LbL) technique or other techniques and mounted with electrodes along their boundaries. The response of the thin films to various stimuli determined by relying on electric current excitation and corresponding boundary potential measurements. The spatial conductivity variations are reconstructed based on a mathematical model for the EIT technique. Here, the ability of the EIT method to provide two-dimensional mapping of the conductivity of CNT thin films is validated by (1) electrically imaging intentional structural defects in the thin films and (2) mapping the film's response to various pH environments.
    Type: Grant
    Filed: September 12, 2008
    Date of Patent: April 17, 2012
    Assignee: The Regents of the University of Michigan
    Inventors: Jerome P. Lynch, Tsung-Chin Huo, Nicholas A. Kotov, Nadine Wong Shi Kam, Kenneth J. Loh
  • Publication number: 20090121727
    Abstract: The present teachings relate to the application of electrical impedance tomography (EIT) to demonstrate the multifunctionality of carbon nanocomposite thin films under various types of environmental stimuli. Carbon nanotube (CNT) thin films are fabricated by a layer-by-layer (LbL) technique or other techniques and mounted with electrodes along their boundaries. The response of the thin films to various stimuli determined by relying on electric current excitation and corresponding boundary potential measurements. The spatial conductivity variations are reconstructed based on a mathematical model for the EIT technique. Here, the ability of the EIT method to provide two-dimensional mapping of the conductivity of CNT thin films is validated by (1) electrically imaging intentional structural defects in the thin films and (2) mapping the film's response to various pH environments.
    Type: Application
    Filed: September 12, 2008
    Publication date: May 14, 2009
    Applicant: The Regents of the University of Michigan
    Inventors: JEROME P. LYNCH, Tsung-Chin Huo, Nicholas A. Kotov, Nadine Wong Shi Kam, Kenneth J. Loh