Abstract: A circuit screening system including a target circuit under test receiving a first testing signal in a first period and a second testing signal in a second period; and a clock generating circuit providing a clock signal to the target circuit under test, the clock signal triggering the target circuit under test to receive the first testing signal in the first period and the second testing signal in the second period; the clock signal having a first profile and a second profile in the first period and the second period, respectively, and the first profile and the second profile having a phase difference.

Abstract: A processing method of an optical panel used in an electronic device is disclosed. The processing method includes: selecting a light transparent panel and coating a photoresist on one surface of the light transparent panel; forming a plurality of light transmission hole patterns on a photomask; and forming a light shielding layer after the photoresist is exposed via the photomask and developing; and the light transmission hole patterns are transferred to the light shielding layer and a plurality of light transmission holes are formed on the light shielding layer.