Patents by Inventor Tsung-Yu Lai

Tsung-Yu Lai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200139155
    Abstract: The invention provides a catheter apparatus, which includes an integrally formed multi-lumen pipeline structure having a proximal end direction and a distal end direction, wherein the multi-lumen pipeline structure includes a tubular structure and multiple fluid flow pipe structures, and the tubular structure and the multiple fluid flow pipe structures are disposed along a first axial direction of the multi-lumen pipeline structure; at least one pipe sleeve membrane element wrapped on the outer periphery of the multi-lumen pipeline structure, wherein the at least one pipe sleeve membrane element includes a strengthening structure and/or a buffering structure; and a pointed end which is jointed with the multi-lumen pipeline structure and is tightly fastened with the multi-lumen pipeline structure. The invention further provides a brachytherapy system using the catheter apparatus, which can be used for treating intracavitary tumors such as esophageal cancer or the like.
    Type: Application
    Filed: December 15, 2017
    Publication date: May 7, 2020
    Inventors: Kai-Lin Yang, Hsuan-Mien Wang, Wei-Jer Chang, Jeng-Yu Chou, Tsung-Yu Lai, Ming-Cheng Chen
  • Patent number: 8294604
    Abstract: Test system and method for analog-to-digital converter (ADC) based on a loopback architecture are provided to test an M-bit ADC. In the invention, an N-bit digital-to-analog converter (DAC) converts a digital input to a basic test signal, a segmentation circuit scales the basic test signal and superposes it with segmentation DC levels for providing corresponding segmented test signals, such that the ADC converts the segmented test signals to reflect result of testing. With the invention, practical loopback architecture of low-cost can be adopted for testing.
    Type: Grant
    Filed: March 24, 2011
    Date of Patent: October 23, 2012
    Assignee: Faraday Technology Corp.
    Inventor: Tsung-Yu Lai
  • Publication number: 20110241914
    Abstract: Test system and method for analog-to-digital converter (ADC) based on a loopback architecture are provided to test an M-bit ADC. In the invention, an N-bit digital-to-analog converter (DAC) converts a digital input to a basic test signal, a segmentation circuit scales the basic test signal and superposes it with segmentation DC levels for providing corresponding segmented test signals, such that the ADC converts the segmented test signals to reflect result of testing. With the invention, practical loopback architecture of low-cost can be adopted for testing.
    Type: Application
    Filed: March 24, 2011
    Publication date: October 6, 2011
    Applicant: FARADAY TECHNOLOGY CORPORATION
    Inventor: Tsung-Yu Lai