Patents by Inventor Tsutomu Mizuguchi

Tsutomu Mizuguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10795067
    Abstract: A confocal optical system-based measurement apparatus includes: a light source; a light projecting optical fiber group; a light receiving optical fiber group; a spectroscope; and a confocal optical system configured to condense each of a plurality of beams from a plurality of light projecting optical fibers to irradiate a sample therewith, and cause a plurality of beams from a plurality of condensing points on the sample to form images on the plurality of light receiving optical fibers, respectively, wherein the light projecting optical fiber group includes the plurality of light projecting optical fibers configured to receive light from the light source, the light receiving optical fiber group includes the plurality of light receiving optical fibers configured to guide received light to the spectroscope, the shape of an end face of the light projecting optical fiber group and the shape of an end face of the light receiving optical fiber group are in a mirror image relationship, and in the light projecting op
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: October 6, 2020
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Haruka Otsuka, Hisashi Shiraiwa, Tsutomu Mizuguchi
  • Publication number: 20190331842
    Abstract: A confocal optical system-based measurement apparatus includes: a light source; a light projecting optical fiber group; a light receiving optical fiber group; a spectroscope; and a confocal optical system configured to condense each of a plurality of beams from a plurality of light projecting optical fibers to irradiate a sample therewith, and cause a plurality of beams from a plurality of condensing points on the sample to form images on the plurality of light receiving optical fibers, respectively, wherein the light projecting optical fiber group includes the plurality of light projecting optical fibers configured to receive light from the light source, the light receiving optical fiber group includes the plurality of light receiving optical fibers configured to guide received light to the spectroscope, the shape of an end face of the light projecting optical fiber group and the shape of an end face of the light receiving optical fiber group are in a mirror image relationship, and in the light projecting op
    Type: Application
    Filed: March 29, 2019
    Publication date: October 31, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Haruka OTSUKA, Hisashi SHIRAIWA, Tsutomu MIZUGUCHI
  • Patent number: 10422694
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: September 24, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • Patent number: 10422695
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: September 24, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • Publication number: 20190170578
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Application
    Filed: February 8, 2019
    Publication date: June 6, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
  • Publication number: 20190170577
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Application
    Filed: February 8, 2019
    Publication date: June 6, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
  • Patent number: 10222261
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: July 1, 2016
    Date of Patent: March 5, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • Patent number: 9921149
    Abstract: A controller of an optical measurement apparatus causes, in a condition that a rotational speed of a rotary body is controlled so that the speed is a specified value, a light source to generate light having a constant intensity and apply the light to an irradiation region, and acquires first timing information based on a change with time of an intensity of reflected light or transmitted light that is output from a second detection unit receiving the reflected light or transmitted light of the applied light. The controller causes the light source to periodically generate pulsed light in accordance with the first timing information and apply the pulsed light to the irradiation region, and acquires second timing information based on a result which is output from the first detection unit whose measurement is periodically enabled in accordance with the first timing information.
    Type: Grant
    Filed: April 24, 2015
    Date of Patent: March 20, 2018
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Tsutomu Mizuguchi
  • Publication number: 20170102321
    Abstract: A controller of an optical measurement apparatus causes, in a condition that a rotational speed of a rotary body is controlled so that the speed is a specified value, a light source to generate light having a constant intensity and apply the light to an irradiation region, and acquires first timing information based on a change with time of an intensity of reflected light or transmitted light that is output from a second detection unit receiving the reflected light or transmitted light of the applied light. The controller causes the light source to periodically generate pulsed light in accordance with the first timing information and apply the pulsed light to the irradiation region, and acquires second timing information based on a result which is output from the first detection unit whose measurement is periodically enabled in accordance with the first timing information.
    Type: Application
    Filed: April 24, 2015
    Publication date: April 13, 2017
    Applicant: Otsuka Electronics Co., Ltd.
    Inventor: Tsutomu MIZUGUCHI
  • Publication number: 20170010214
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Application
    Filed: July 1, 2016
    Publication date: January 12, 2017
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
  • Patent number: 9163985
    Abstract: A spectral characteristic measurement apparatus includes a spectrometer for spatially dispersing incident light depending on wavelengths and a detection portion for receiving light dispersed by the spectrometer. The detection portion includes a first detection area on which a component in a first wavelength range is incident and a second detection area on which a component in a second wavelength range is incident. The apparatus includes a correction portion for correcting stray light detected by the detection portion derived from light to be measured. The correction portion corrects a stray light pattern based on a first amount of change with respect to wavelengths in the first wavelength range of the stray light pattern and a second amount of change with respect to wavelengths included in a result of detection in the first detection area of the detection portion, to calculate a stray light component derived from the light to be measured.
    Type: Grant
    Filed: August 26, 2013
    Date of Patent: October 20, 2015
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki Sano, Suguru Irie, Tsutomu Mizuguchi
  • Publication number: 20140063497
    Abstract: A spectral characteristic measurement apparatus includes a spectrometer for spatially dispersing incident light depending on wavelengths and a detection portion for receiving light dispersed by the spectrometer. The detection portion includes a first detection area on which a component in a first wavelength range is incident and a second detection area on which a component in a second wavelength range is incident. The apparatus includes a correction portion for correcting stray light detected by the detection portion derived from light to be measured. The correction portion corrects a stray light pattern based on a first amount of change with respect to wavelengths in the first wavelength range of the stray light pattern and a second amount of change with respect to wavelengths included in a result of detection in the first detection area of the detection portion, to calculate a stray light component derived from the light to be measured.
    Type: Application
    Filed: August 26, 2013
    Publication date: March 6, 2014
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki SANO, Suguru IRIE, Tsutomu MIZUGUCHI
  • Patent number: 8169608
    Abstract: An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.
    Type: Grant
    Filed: November 29, 2011
    Date of Patent: May 1, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki Sano, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
  • Patent number: 8169607
    Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
    Type: Grant
    Filed: October 4, 2009
    Date of Patent: May 1, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki Sano, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
  • Patent number: 8164632
    Abstract: A picture is scrolled on a display 5 to be measured, and the scrolling moving picture is pursuit-captured by a color camera 3 so as to obtain a pursuit-captured moving picture image. A moving picture response curve using received light intensity data obtained based upon the pursuit-captured moving picture image is converted into a color moving picture response curve using emission intensity of display elements of the display 5 to be measured. The coloration of an edge part of the pursuit-captured moving picture image is decomposed into the respective color components, by which objective quantitative evaluations of color shifting can be made.
    Type: Grant
    Filed: February 27, 2007
    Date of Patent: April 24, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshi Enami, Yoshihisa Furukawa, Hiroyuki Nakamoto, Tsutomu Mizuguchi
  • Publication number: 20120075628
    Abstract: An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.
    Type: Application
    Filed: November 29, 2011
    Publication date: March 29, 2012
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki SANO, Makoto OKAWAUCHI, Kosei OSHIMA, Kazuaki OHKUBO, Tsutomu MIZUGUCHI, Shiro SHIMA
  • Publication number: 20100091280
    Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
    Type: Application
    Filed: October 4, 2009
    Publication date: April 15, 2010
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki SANO, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
  • Patent number: 7528967
    Abstract: A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for focusing on the object to be measured and checking a position of measurement. The observation light is selected such that the observation light includes a component that can be reflected from the object to be measured. The measurement light and the observation light are thus applied independently to the object to be measured, through a common objective lens, and accordingly improvement of the precision in measurement of the optical characteristic and facilitation of focusing on the object to be measured are achieved simultaneously.
    Type: Grant
    Filed: May 15, 2008
    Date of Patent: May 5, 2009
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Makoto Okawauchi, Tsutomu Mizuguchi, Shiro Kawaguchi
  • Publication number: 20080285026
    Abstract: A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for focusing on the object to be measured and checking a position of measurement. The observation light is selected such that the observation light includes a component that can be reflected from the object to be measured. The measurement light and the observation light are thus applied independently to the object to be measured, through a common objective lens, and accordingly improvement of the precision in measurement of the optical characteristic and facilitation of focusing on the object to be measured are achieved simultaneously.
    Type: Application
    Filed: May 15, 2008
    Publication date: November 20, 2008
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Makoto OKAWAUCHI, Tsutomu Mizuguchi, Shiro Kawaguchi
  • Publication number: 20080238820
    Abstract: A motion picture moving on a display screen 21 of a display device 2 to be evaluated is captured a plurality of times by means of a galvano camera 3a. The captured data include locations of the moving picture in the moving direction on the display device 2 to be evaluated and data on luminance of the display device at the respective time points of the locations. Based on these data, a motion picture eye-tracking simulation is performed, where an integration along the eye tracking direction over an integral multiple of 1 frame time is performed to obtain a motion picture response curve of the display device 2 to be evaluated. Evaluations of motion picture characteristics and motion picture blur can be made based on the motion picture response curve.
    Type: Application
    Filed: March 19, 2008
    Publication date: October 2, 2008
    Inventors: Yoshi Enami, Masahiro Kikuchi, Tsutomu Mizuguchi, Hiroyuki Sano