Patents by Inventor Tsutomu Mizumura

Tsutomu Mizumura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probing apparatus having an automatic probe card install mechanism and a semiconductor wafer testing system including the same
    Patent number: 5444386
    Abstract: A probing apparatus including probes contacting with electrode pads of the semiconductor wafer for measuring a semiconductor wafer in which a probe card is safely and individually installed and a wafer testing system in which a plurality of probe cards are efficiently used are disclosed. A probing apparatus includes moving means 4 for receiving a card holder 2 accommodating a probe card 1, moving the card holder 2 into a position just below a pin socket 3 to which the probe card 1 is attached, and lifting the card holder 2, and attaching means 5 for attaching the probe card 1 to the pogo pin socket 3.
    Type: Grant
    Filed: January 15, 1993
    Date of Patent: August 22, 1995
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Tsutomu Mizumura