Abstract: Provided is a total reflection X-ray fluorescence spectrometer which has high analysis sensitivity and analysis speed. The total reflection X-ray fluorescence spectrometer includes: an X-ray source that has an electron beam focal point having an effective width in a direction parallel to a surface of a sample, and orthogonal to an X-ray irradiation direction, that is larger than a dimension in the irradiation direction; a reflective optic that has an effective width in the orthogonal direction that is larger than that of the electron beam focal point, and has a curved surface in the irradiation direction; and a plurality of detectors that are arranged in a row in the orthogonal direction, and are configured to measure intensities of fluorescent X-rays emitted from the sample irradiated with primary X-rays focused by the reflective optic.

Abstract: Provided is a total reflection X-ray fluorescence spectrometer which has high analysis sensitivity and analysis speed. The total reflection X-ray fluorescence spectrometer includes: an X-ray source that has an electron beam focal point having an effective width in a direction parallel to a surface of a sample, and orthogonal to an X-ray irradiation direction, that is larger than a dimension in the irradiation direction; a reflective optic that has an effective width in the orthogonal direction that is larger than that of the electron beam focal point, and has a curved surface in the irradiation direction; and a plurality of detectors that are arranged in a row in the orthogonal direction, and are configured to measure intensities of fluorescent X-rays emitted from the sample irradiated with primary X-rays focused by the reflective optic.

Abstract: Provided is an X-ray signal processor and an X-ray spectrometer that are configured to measure X-rays and, at the same time, accurately detect, with a simple method, the degree of performance degradation of a semiconductor detector. The X-ray signal processor includes: a semiconductor detector configured to generate a charge corresponding to energy of detected X-rays; a preamplifier configured to output a ramp voltage signal corresponding to the generated charge; a counter configured to count the X-rays for each voltage change amount due to the charge based on the ramp voltage signal; and a judgment part configured to determine whether the semiconductor detector has been degraded based on a first voltage change evaluation value corresponding to a total sum of products of the voltage change amount and an occurrence frequency thereof, and a second voltage change evaluation value corresponding to an increase amount of the ramp voltage signal.

Abstract: Provided are a signal processing device for X-ray analysis and an adjustment method for a signal processing device for X-ray analysis, which are capable of performing correction of a time constant with high precision and simply and quickly performing adjustment work required for performing the correction. The signal processing device for X-ray analysis includes: a differentiating circuit configured to use a first time constant to convert a signal output from an X-ray detector into an analog differential wave; an AD converter configured to convert the analog differential wave into a digital differential wave; a waveform shaping digital filter configured to use a second time constant to shape the digital differential wave; and a histogram generation unit configured to acquire a feature value of a shaped waveform based on pulse heights in two regions of the shaped waveform, to generate a histogram representing an acquisition frequency for each feature value.

Abstract: Provided are a signal processing device for X-ray analysis and an adjustment method for a signal processing device for X-ray analysis, which are capable of performing correction of a time constant with high precision and simply and quickly performing adjustment work required for performing the correction. The signal processing device for X-ray analysis includes: a differentiating circuit configured to use a first time constant to convert a signal output from an X-ray detector into an analog differential wave; an AD converter configured to convert the analog differential wave into a digital differential wave; a waveform shaping digital filter configured to use a second time constant to shape the digital differential wave; and a histogram generation unit configured to acquire a feature value of a shaped waveform based on pulse heights in two regions of the shaped waveform, to generate a histogram representing an acquisition frequency for each feature value.

Abstract: Provided is an X-ray signal processor and an X-ray spectrometer that are configured to measure X-rays and, at the same time, accurately detect, with a simple method, the degree of performance degradation of a semiconductor detector. The X-ray signal processor includes: a semiconductor detector configured to generate a charge corresponding to energy of detected X-rays; a preamplifier configured to output a ramp voltage signal corresponding to the generated charge; a counter configured to count the X-rays for each voltage change amount due to the charge based on the ramp voltage signal; and a judgment part configured to determine whether the semiconductor detector has been degraded based on a first voltage change evaluation value corresponding to a total sum of products of the voltage change amount and an occurrence frequency thereof, and a second voltage change evaluation value corresponding to an increase amount of the ramp voltage signal.

Abstract: A lubricating-oil collection guide tool includes an oil-collection container; an oil funnel guiding lubricating oil into an oil passage at an axis end of a rotation axis; and an oil-passage member communicating the oil funnel and the oil-collection container. The oil-passage member includes a first passage member extending from the oil-collection container, and a second passage member extending from the oil funnel. While an insertion hole is formed in a lateral wall portion on one end side of the second passage member, one end portion of the first passage member is a cylindrical end portion. The cylindrical end portion is inserted into the insertion hole to move in and out in the axis line direction. The cylindrical end portion moves in a long axis direction relative to the insertion hole, and turns as a center of an axis line of the cylindrical end portion.

Abstract: A product roll packaging apparatus includes a transfer unit for lifting and transferring a product roll from a conveyor, a wrapping unit for wrapping a protective sheet around the roll and attaching an end thereof with an adhesive tape, a protective sheet supply unit for cutting off the sheet from a sheet roll and supplying it along a protective sheet path line to the wrapping unit, and a tape supply unit for supplying the tape to the end of the cut sheet. The transfer unit includes a position correcting mechanism for establishing a reference line depending on the roll size, and bringing a reference end face of the roll into alignment with a vertical plane including the reference line. The protective sheet supply unit includes an edge position control mechanism for bringing a reference edge of the sheet into alignment with the reference line corresponding to the roll size.

Abstract: A lubricating-oil collection guide tool includes an oil-collection container; an oil funnel guiding lubricating oil into an oil passage at an axis end of a rotation axis; and an oil-passage member communicating the oil funnel and the oil-collection container. The oil-passage member includes a first passage member extending from the oil-collection container, and a second passage member extending from the oil funnel. While an insertion hole is formed in a lateral wall portion on one end side of the second passage member, one end portion of the first passage member is a cylindrical end portion. The cylindrical end portion is inserted into the insertion hole to move in and out in the axis line direction. The cylindrical end portion moves in a long axis direction relative to the insertion hole, and turns as a center of an axis line of the cylindrical end portion.

Abstract: A product roll packaging apparatus includes a transfer unit for lifting and transferring a product roll from a conveyor, a wrapping unit for wrapping a protective sheet around the roll and attaching an end thereof with an adhesive tape, a protective sheet supply unit for cutting off the sheet from a sheet roll and supplying it along a protective sheet path line to the wrapping unit, and a tape supply unit for supplying the tape to the end of the cut sheet. The transfer unit includes a position correcting mechanism for establishing a reference line depending on the roll size, and bringing a reference end face of the roll into alignment with a vertical plane including the reference line. The protective sheet supply unit includes an edge position control mechanism for bringing a reference edge of the sheet into alignment with the reference line corresponding to the roll size.