Abstract: A signal detecting apparatus includes a component extractor extracting a voltage component whose absolute value is not less than a predetermined value from an electronic signal generated by a tester for testing an electric property of a device under test; a rate-of-change calculator calculating a time rate-of-change of a level of the voltage component extracted by the component extractor; a determiner determining whether the voltage component is identified as an irregular signal having a sudden change in voltage, based on the time rate-of-change calculated by the rate-of-change calculator; and a notifier notifying a user of a result of determination when the determiner determines that the voltage component is identified as the irregular signal.

Abstract: A signal detecting apparatus includes a component extractor extracting a voltage component whose absolute value is not less than a predetermined value from an electronic signal generated by a tester for testing an electric property of a device under test; a rate-of-change calculator calculating a time rate-of-change of a level of the voltage component extracted by the component extractor; a determiner determining whether the voltage component is identified as an irregular signal having a sudden change in voltage, based on the time rate-of-change calculated by the rate-of-change calculator; and a notifier notifying a user of a result of determination when the determiner determines that the voltage component is identified as the irregular signal.

Abstract: The present invention provides a semiconductor test system and a monitor apparatus for monitoring a test history such as numbers of operation of relays. The semiconductor test system tests a semiconductor device by controlling test circuits therein through a tester bus and monitors the test history. The test system includes a plurality of buffer circuits for receiving signal information from the tester bus and storing the signal information therein, and a computer for storing the signal information from the buffer circuits in a file and analyzing the signal information in the file.

Abstract: The present invention provides a semiconductor test system and a monitor apparatus for monitoring a test history such as numbers of operation of relays. The semiconductor test system tests a semiconductor device by controlling test circuits therein through a tester bus and monitors the test history. The test system includes a plurality of buffer circuits for receiving signal information from the tester bus and storing the signal information therein, and a computer for storing the signal information from the buffer circuits in a file and analyzing the signal information in the file.