Abstract: In a method for manufacturing a liquid crystal display device, address and data lines are provided over a substrate, and a short-circuit area and an area to be made short-circuit are provided to cause short-circuiting between the address and data lines. It is prevented a TFT array from dielectric breakdown by static electricity in manufacturing processes, and examination is made for a connection breakage, and short-circuiting, at a TFT array for the liquid crystal display device, prior to the manufacturing step by cutting the short-circuit. Moreover, it can be presented from dielectric breakdown by static electricity in later processes to short the area to be made short-circuit after the examination. It is possible to both decrease a faults percentage of liquid crystal devices and improve their productivity.