Abstract: An image pickup apparatus has an image sensor recording image information; a dustproof glass for keeping hermeticity of the periphery of the image sensor, placed in front of the image sensor; an optical filter removably placed in front of the dustproof glass; and a camera mount placed in front of the optical filter. The image pickup apparatus further has a parfocal adjusting device in which a focal position where the optical filter is demounted can be adjusted so as to be nearly equal to the focal position where the optical filter is mounted.

Abstract: To a logic circuit model, a test pattern by a combination of a first logical value A representing 0 or 1 and a second logical value B representing 1 or 0 as an inverse value corresponding to the first logical value A is given to calculate an output of the logic circuit model with a logical operation and, when the output is compared with an expected value for the test pattern and they are equal to each other, it is determined that the operation of the logic circuit model is correct. With the second logical value B representing 1 when the first logical value represents 0 and the second logical value B representing 0 when the first logical value A represents 1, a logical operation of the logic circuit model is performed.

Abstract: A microscope examination apparatus is provided that includes a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses is provided.

Abstract: A transmission illumination apparatus for a microscope has an optically transparent sample mount plate on which a sample is mounted, a surface light source that projects substantially uniform illumination light toward the sample mount plate, and a light orientation member that restricts diffusion of the illumination light in relation to at least one direction.

Abstract: A condenser lens is disposed in a position facing an objective lens via a specimen, a reflection mirror is movably disposed in the vicinity of an outermost part of a transmitted illuminative light path on the side of a transmitted illuminative light source from the condenser lens, and a laser beam output from a laser oscillation unit is reflected by the reflection mirror and is incident upon the condenser lens.

Abstract: A transmission illumination apparatus for a microscope has an optically transparent sample mount plate on which a sample is mounted, a surface light source that projects substantially uniform illumination light toward the sample mount plate, and a light orientation member that restricts diffusion of the illumination light in relation to at least one direction.

Abstract: A transmission illumination apparatus for a microscope has an optically transparent sample mount plate on which a sample is mounted, a surface light source that projects substantially uniform illumination light toward the sample mount plate, and a light orientation member that restricts diffusion of the illumination light in relation to at least one direction.

Abstract: Even when the magnifying power is reduced, an image can be obtained at high resolution without significantly reducing the numerical aperture, and examination accuracy is improved.

Abstract: An image pickup apparatus has an image sensor recording image information; a dustproof glass for keeping hermeticity of the periphery of the image sensor, placed in front of the image sensor; an optical filter removably placed in front of the dustproof glass; and a camera mount placed in front of the optical filter. The image pickup apparatus further has a parfocal adjusting device in which a focal position where the optical filter is demounted can be adjusted so as to be nearly equal to the focal position where the optical filter is mounted.

Abstract: When a simulation model generation unit converts logic on the gate level into a basic primitive which can be executed by a simulator to generate a simulation model, for the basic primitives a degeneracy processing unit determines and deletes a gate which can be deleted and which will not affect the delay stage count. The degeneracy processing unit is provided with a constant gate degeneracy unit which puts a plurality of constant gates together, a buffer degeneracy unit which deletes fan-out-free buffers and an identical fan-in gate degeneracy unit which puts identical fan-in gates together.

Abstract: A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.

Abstract: A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.

Abstract: When a simulation model generation unit converts logic on the gate level into a basic primitive which can be executed by a simulator to generate a simulation model, for the basic primitives a degeneracy processing unit determines and deletes a gate which can be deleted and which will not affect the delay stage count. The degeneracy processing unit is provided with a constant gate degeneracy unit which puts a plurality of constant gates together, a buffer degeneracy unit which deletes fan-out-free buffers and an identical fan-in gate degeneracy unit which puts identical fan-in gates together.

Abstract: A transmission illumination apparatus for a microscope has an optically transparent sample mount plate on which a sample is mounted, a surface light source that projects substantially uniform illumination light toward the sample mount plate, and a light orientation member that restricts diffusion of the illumination light in relation to at least one direction.

Abstract: A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.

Abstract: A condenser lens is disposed in a position facing an objective lens via a specimen, a reflection mirror is movably disposed in the vicinity of an outermost part of a transmitted illuminative light path on the side of a transmitted illuminative light source from the condenser lens, and a laser beam output from a laser oscillation unit is reflected by the reflection mirror and is incident upon the condenser lens.

Abstract: A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.

Abstract: A continuous article has its surface treated twice by first and second jets of fluids as passing though a tunnel provided on a pass line. A fluid flow is supplied through each of first and second introducing ports into the tunnel where it is converted into each of the first and second jets of fluids, one rushing over the article in the same direction as the article and the other rushing over the same in the opposite direction thereto for effecting surface treatments respectively by the first and second jets of fluid. Each of the first and second jets causes a negative pressure to be developed at each inlet and outlet outlet of the tunnel through which the article enters and exits the tunnel. The negative pressure in turn draws in the ambient air through the inlet and the outlet over the article to thereby provide an air seal at each inlet and outlet, preventing the fluids introduced in the tunnel from escaping outwardly thereof.