Abstract: An information processing terminal for supporting quality improvement concerning product manufacture includes a workflow arrangement part acquiring row information indicating a first arrangement location of each of a plurality of workflows being arranged in an area for arranging the plurality of workflows for verifying the quality improvement, and displaying the plurality of workflows based on the row information; a process component arrangement part acquiring matrix information indicating a second arrangement location of each of a plurality of process components being arranged in each of the plurality of workflows, and displaying the plurality of process components based on the matrix information; and a data association part performing a data association among the plurality of process components in accordance with data link lines within each of the plurality of workflows or the data link lines crossing from one workflow to another workflow with respect to the plurality of process components arranged and disp

Abstract: A quality improvement system, which automatically performs engineering analysis and problem coping to improve the quality of semiconductor products. The quality improvement system is connected to a plurality of external databases, which store semiconductor product quality information acquired in a plurality of manufacturing processes, and a client server, which is operated by an engineer. The quality improvement system receives quality information from the external databases, receives engineer comments from the client server and associates the quality information and comments and stores them in a knowledge database.

Abstract: An information processing terminal for supporting quality improvement concerning product manufacture includes a workflow arrangement part acquiring row information indicating a first arrangement location of each of a plurality of workflows being arranged in an area for arranging the plurality of workflows for verifying the quality improvement, and displaying the plurality of workflows based on the row information; a process component arrangement part acquiring matrix information indicating a second arrangement location of each of a plurality of process components being arranged in each of the plurality of workflows, and displaying the plurality of process components based on the matrix information; and a data association part performing a data association among the plurality of process components in accordance with data link lines within each of the plurality of workflows or the data link lines crossing from one workflow to another workflow with respect to the plurality of process components arranged and disp

Abstract: A quality improvement system, which automatically performs engineering analysis and problem coping to improve the quality of semiconductor products. The quality improvement system is connected to a plurality of external databases, which store semiconductor product quality information acquired in a plurality of manufacturing processes, and a client server, which is operated by an engineer. The quality improvement system receives quality information from the external databases, receives engineer comments from the client server and associates the quality information and comments and stores them in a knowledge database.

Abstract: The MOS transistor incorporated in a semiconductor device comprises a gate electrode formed on a semiconductor substrate through the medium of a gate insulating film, a first impurity introduced area of an LDD structure composed of a low-concentration impurity area and a high-concentration impurity area formed on the semiconductor substrate on one side of the gate electrode, and a second impurity introduced area composed solely of a high-concentration impurity area formed on the semiconductor substrate on the other side of the gate electrode.