Abstract: Subject matter herein can include identifying a biochemical test strip assembly electrically, such as using the same test circuitry as can be used to perform an electrochemical measurement, without requiring use of optical techniques. The identification can include using information about a measured susceptance of an identification feature included as a portion of the test strip assembly. The identification can be used by test circuitry to select test parameters or calibration values, or to select an appropriate test protocol for the type of test strip coupled to the test circuitry. The identification can be used by the test circuitry to validate or reject a test strip assembly, such as to inhibit use of test strips that fail meet one or more specified criteria.

Abstract: Subject matter herein can include identifying a biochemical test strip assembly electrically, such as using the same test circuitry as can be used to perform an electrochemical measurement, without requiring use of optical techniques. The identification can include using information about a measured susceptance of an identification feature included as a portion of the test strip assembly. The identification can be used by test circuitry to select test parameters or calibration values, or to select an appropriate test protocol for the type of test strip coupled to the test circuitry. The identification can be used by the test circuitry to validate or reject a test strip assembly, such as to inhibit use of test strips that fail meet one or more specified criteria.

Abstract: The invention provides a multi-channel DAC circuit which provides for correlation between selected ones of the multiple channels such that a single set of calibration coefficients may be used for calibration of multiple channels.

Abstract: The invention provides a multi-channel DAC circuit which provides for correlation between selected ones of the multiple channels such that a single set of calibration coefficients may be used for calibration of multiple channels.

Abstract: A DAC architecture is described. The architecture is specifically adapted to provided an analog voltage output based on a digital input word. The architecture includes a resistor ladder configuration sub-divisible into a first component, adapted to convert a lower part of the input word, and a second component adapted to convert an upper part of the input word. The DAC is calibrated such that the first component can be used to tune the output of the second component on selection of specific segment from the second component.

Abstract: A signal generator (1) for generating a square waveform analog voltage output signal comprises an on-chip DAC (12) which outputs the analog voltage signal on an output terminal (5). On-chip first and second programmable registers (9,10) store first and second digital words which correspond to the maximum and minimum voltage values of the analog output signal. An on-chip switch circuit (15) selectively and alternately switches the first and second registers (9,10) to an on-chip DAC register (17) from which the respective first and second digital words are loaded into the DAC (12) in response to a load DAC signal generated by a control circuit (14). The load DAC signal is generated in response to an externally generated LDAC signal in the form of a clock signal which is applied to an LDAC terminal (22). A flip-flop (19) in response to the load DAC signal outputs a control signal on a control line (25) for alternately switching the first and second registers (9,10) to the DAC register (17).

Abstract: A signal generator (1) for generating a square waveform analog voltage output signal comprises an on-chip DAC (12) which outputs the analog voltage signal on an output terminal (5). On-chip first and second programmable registers (9,10) store first and second digital words which correspond to the maximum and minimum voltage values of the analog output signal. An on-chip switch circuit (15) selectively and alternately switches the first and second registers (9,10) to an on-chip DAC register (17) from which the respective first and second digital words are loaded into the DAC (12) in response to a load DAC signal generated by a control circuit (14). The load DAC signal is generated in response to an externally generated LDAC signal in the form of a clock signal which is applied to an LDAC terminal (22). A flip-flop (19) in response to the load DAC signal outputs a control signal on a control line (25) for alternately switching the first and second registers (9,10) to the DAC register (17).