Abstract: A memory device is provided, including a first bit cell including a first memory cell coupled to a first word line and a second bit cell including a second memory cell coupled to a second word line. The first and second memory cells are coupled to a first control line and further coupled to a first bit line through first and second nodes. The second bit cell further includes a first protection array coupled to the second memory cell at the second node coupled to the first bit line and further coupled to a third word line. When the first and second bit cells operate in different operational types, the first protection array is configured to generate an adjust voltage to the second node according to a voltage level of the third word line while the first bit cell is programmed.

Abstract: A memory device and a method of operating a memory device are disclosed. In one aspect, the memory device includes a plurality of non-volatile memory cells, each of the plurality of non-volatile memory cells is operatively coupled to a word line, a gate control line, and a bit line. Each of the plurality of non-volatile memory cells comprises a first transistor, a second transistor, a first diode-connected transistor, and a capacitor. The first transistor, second transistor, first diode-connected transistor are coupled in series, with the capacitor having a first terminal connected to a common node between the first diode-connected transistor and the second transistor.

Abstract: The present invention relates to a base design of cooling structure, which includes a base, and a shaft tube disposed on the base to support a spindle of an impeller to rotate therein. The base has at least a groove and the groove is located beyond an outer diameter; the groove design can be employed to effectively prevent the issue of contraction stress caused by difference of cooling time of temperature and to prevent a slanted shaft tube for supporting a stable operation of the spindle of the impeller, thereby avoiding the resulting run-out and noise, making vibration and noise test values of the product comply with a standard value range, reducing the defective rate of the product and prolonging the product lifespan.

Abstract: The present invention relates to a base design of cooling structure, which includes a base, and a shaft tube disposed on the base to support a spindle of an impeller to rotate therein. The base has at least a groove and the groove is located beyond an outer diameter; the groove design can be employed to effectively prevent the issue of contraction stress caused by difference of cooling time of temperature and to prevent a slanted shaft tube for supporting a stable operation of the spindle of the impeller, thereby avoiding the resulting run-out and noise, making vibration and noise test values of the product comply with a standard value range, reducing the defective rate of the product and prolonging the product lifespan.