Abstract: An improved structure composite-type test fixture consisting of a stack planar postured flush against the upper surface of a probe board which is situated on the upper extent of a base such that holes predisposed in the face of the probe board provides for the entry of probe barrels. Comprised of a top board, a thickness board, and a pliant plastic board, the stack planar has through-holes predisposed in a certain alignment that provides for the insertion of probes to the various connection points of a circuit board being tested. The tips of the probes are in a range of different diameters and size specifications, the top extremities protrude from the upper surface of the stack planar, and the distal extremities consist of a single specification insert section that fit into the probe barrels. Each probe barrel has an internally disposed spring.