Abstract: The present invention provides for a system. The system includes a plurality of controllers, each controller comprising at least an output pin and a plurality of input pins and configured to receive self-identify control signals through one or more of the plurality of input pins and to transmit a controller self-identify signal through the output pin based on the self-identify control signals. Each output pin is coupled to an external system. A processor couples to a first input pin of the plurality of input pins of each of the plurality of controllers and is configured to generate self-identify control signals and to transmit the self-identify control signals to the plurality of controllers.

Abstract: A method for improved Logic Built-In Self-Test (LBIST) includes providing a plurality of control signal sets, by an LBIST controller, to an LBIST domain comprising a plurality of LBIST satellite modules. Each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves the LBIST channel scan and LBIST sequence operations for each of the LBIST satellite modules, through the plurality of control signal sets. A test system includes a Logic Built-In Self-Test (LBIST) domain comprising a plurality of LBIST satellite modules. An LBIST controller couples to the LBIST domain and provides a plurality of control signal sets to the LBIST domain, wherein each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves LBIST channel scan operations for each of the LBIST satellite modules, through the plurality of control signal sets.

Abstract: The present invention provides for a system. The system includes a plurality of controllers, each controller comprising at least an output pin and a plurality of input pins and configured to receive self-identify control signals through one or more of the plurality of input pins and to transmit a controller self-identify signal through the output pin based on the self-identify control signals. Each output pin is coupled to an external system. A processor couples to a first input pin of the plurality of input pins of each of the plurality of controllers and is configured to generate self-identify control signals and to transmit the self-identify control signals to the plurality of controllers.

Abstract: A method for improved Logic Built-In Self-Test (LBIST) includes providing a plurality of control signal sets, by an LBIST controller, to an LBIST domain comprising a plurality of LBIST satellite modules. Each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves the LBIST channel scan and LBIST sequence operations for each of the LBIST satellite modules, through the plurality of control signal sets. A test system includes a Logic Built-In Self-Test (LBIST) domain comprising a plurality of LBIST satellite modules. An LBIST controller couples to the LBIST domain and provides a plurality of control signal sets to the LBIST domain, wherein each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves LBIST channel scan operations for each of the LBIST satellite modules, through the plurality of control signal sets.

Abstract: The present invention provides for a system, comprising a controller and a processor. The controller comprises at least an output pin and a plurality of input pins, and is configured to receive self-identify control signals through one or more of the plurality of input pins and to transmit a controller self-identify signal through the output pin based on the self-identify control signals. The processor is coupled to the controller and configured to generate self-identify control signals and to transmit the self-identify control signals to the controller.

Abstract: An apparatus, a method, and a computer program product are provided for identifying signals in analogue electrical systems. The ID select signals that control the timing of this signal identification circuit comprise sequential numbers that count up and identify a corresponding signal. The signals to be identified are located on a group of input/output (I/O) pins. One multiplexer (first) selects a specific I/O pin in response to the ID select signals. An isolated voltage source is connected to this multiplexer and provides the selected signal to another multiplexer (second). The second multiplexer switches from this isolated voltage source to ground potential in response to the ID select signals. The isolated voltage source floats at the DC level of the selected I/O driver pin. Therefore, by connecting to the selected signal's I/O pin and the output of the second multiplexer, the selected signal can be identified and then probed.

Abstract: Interfacing circuitry for asynchronously transferring data between a high-speed clock domain and a low-speed clock domain is provided. The interfacing circuitry is divided into halves, with one half being synchronized to a first clock and the second half being synchronized to a second clock. The first half and the second half are mirror images of each other. Each half has at least one storage component, such as a register and a flip-flop, for storing a valid bit as well as data, and at least one multiplexer component for gating the storage component. The valid bit is used to control the multiplexer at a receiving half. When transferring from a high-speed clock domain to a low-speed clock domain, the high-speed clock domain may probe the received data and/or the valid bit stored in the low-speed clock domain before the high-speed clock domain sends additional data.

Abstract: Interfacing circuitry for asynchronously transferring data between a high-speed clock domain and a low-speed clock domain is provided. The interfacing circuitry is divided into halves, with one half being synchronized to a first clock and the second half being synchronized to a second clock. The first half and the second half are mirror images of each other. Each half has at least one storage component, such as a register and a flip-flop, for storing a valid bit as well as data, and at least one multiplexer component for gating the storage component. The valid bit is used to control the multiplexer at a receiving half. When transferring from a high-speed clock domain to a low-speed clock domain, the high-speed clock domain may probe the received data and/or the valid bit stored in the low-speed clock domain before the high-speed clock domain sends additional data.