Patents by Inventor Tung Say Gip

Tung Say Gip has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Nondestructive evaluation of subsurface damage in optical elements
    Patent number: 7330250
    Abstract: A non-destructive process for evaluating subsurface damage in an optical element focuses a microscope at points within the optical element and measures the intensity of reflected light. In one embodiment, a microscope focus a laser beam at a measurement point with the optical element and also collects reflected or scattered light from damage in the optical element. Analysis of data indicating the reflected intensities for a three-dimensional array of points within the optical element can determine the location and severity of the subsurface damage.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: February 12, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Tung Say Gip, Reinhold Garbe, Quoc Nguyen